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Stress measurement using area detectors: a theoretical and experimental comparison of different methods in ferritic steel using a portable X-ray apparatus

Journal of materials science, 2016-06, Vol.51 (11), p.5343-5355

2016

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Performance evaluation of Bragg coherent diffraction imaging

New journal of physics, 2017-10, Vol.19 (10), p.103001

2017

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Load Transfer and Recovery Length in Parallel Wires of Suspension Bridge Cables

Journal of engineering mechanics, 2011-04, Vol.137 (4), p.227-237

2011

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Feasibility of submonolayer ZnTe/ZnCdSe quantum dots as intermediate band solar cell material system

Solar energy materials and solar cells, 2013-10, Vol.117, p.604-609

2013

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Microscale Laser Shock Peening of Thin Films, Part 1: Experiment, Modeling and Simulation

Journal of manufacturing science and engineering, 2004-02, Vol.126 (1), p.10-17

2004

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Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements

Thin solid films, 2013-03, Vol.530, p.85-90

2013

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Measurement of Interface Thermal Resistance With Neutron Diffraction

Journal of heat transfer, 2014-03, Vol.136 (3)

2014

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Mechanisms for microstructure evolution in electroplated copper thin films near room temperature

Journal of applied physics, 1999-09, Vol.86 (5), p.2516-2525

1999

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Internal Contact Mechanics of 61-Wire Cable Strands

Experimental mechanics, 2022, Vol.62 (8), p.1475-1488

2022

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Experimental determination of precision, resolution, accuracy and trueness of time‐of‐flight neutron diffraction strain measurements

Journal of applied crystallography, 2020-04, Vol.53 (2), p.494-511

2020

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Prediction of recrystallization times in electroplated copper thin films

Thin solid films, 2016-09, Vol.615, p.107-115

2016

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High-resolution strain mapping in heteroepitaxial thin-film features

Journal of applied physics, 2005-07, Vol.98 (1), p.013504-013504-9

2005

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Partitioning of Clamping Strains in a Nineteen Parallel Wire Strand

Experimental mechanics, 2017-07, Vol.57 (6), p.921-937

2017

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Determination of shape anisotropy in embedded low contrast submonolayer quantum dot structures

Applied physics letters, 2015-12, Vol.107 (25)

2015

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Vertical correlation and miniband formation in submonolayer Zn(Cd)Te/ZnCdSe type-II quantum dots for intermediate band solar cell application

Applied physics letters, 2013-10, Vol.103 (18)

2013

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A rigorous comparison of X-ray diffraction thickness measurement techniques using silicon-on-insulator thin films

Journal of applied crystallography, 2009-06, Vol.42 (3), p.401-410

2009

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Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction

Applied physics letters, 1998-03, Vol.72 (11), p.1296-1298

1998

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Residual stress/strain analysis in thin films by X-ray diffraction

Critical reviews in solid state and materials sciences, 1995-01, Vol.20 (2), p.125-177

1995

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Boundary Effects in the Eigenstrain Method

Experimental mechanics, 2018-06, Vol.58 (5), p.799-814

2018

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Flexural loading of rectangular Si beams and plates

Journal of physics. Condensed matter, 2005-06, Vol.399 (1), p.64-71

2005

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Modeling of kinematic diffraction from a thin silicon film illuminated by a coherent, focused X-ray nanobeam

Journal of applied crystallography, 2010-06, Vol.43 (3), p.587-595

2010

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Radiative transitions in stacked type-II ZnMgTe quantum dots embedded in ZnSe

Journal of applied physics, 2012-09, Vol.112 (6)

2012

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A quantitative analysis of room temperature recrystallization kinetics in electroplated copper films using high resolution x-ray diffraction

Journal of applied physics, 2011-01, Vol.109 (1), p.014907-014907-9

2011

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Engineering Applications of Time-of-Flight Neutron Diffraction

JOM (1989), 2012, Vol.64 (1), p.117-126

2012

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Diffraction profiles of elastically bent single crystals with constant strain gradients

Journal of applied crystallography, 2007-04, Vol.40 (2), p.322-331

2007

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Stress measurement using area detectors: a theoretical and experimental comparison of different methods in ferritic steel using a portable X-ray apparatus

Performance evaluation of Bragg coherent diffraction imaging

Load Transfer and Recovery Length in Parallel Wires of Suspension Bridge Cables

Feasibility of submonolayer ZnTe/ZnCdSe quantum dots as intermediate band solar cell material system

Microscale Laser Shock Peening of Thin Films, Part 1: Experiment, Modeling and Simulation

Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements

Measurement of Interface Thermal Resistance With Neutron Diffraction

Mechanisms for microstructure evolution in electroplated copper thin films near room temperature

Internal Contact Mechanics of 61-Wire Cable Strands

Experimental determination of precision, resolution, accuracy and trueness of time‐of‐flight neutron diffraction strain measurements

Prediction of recrystallization times in electroplated copper thin films

High-resolution strain mapping in heteroepitaxial thin-film features

Partitioning of Clamping Strains in a Nineteen Parallel Wire Strand

Determination of shape anisotropy in embedded low contrast submonolayer quantum dot structures

Vertical correlation and miniband formation in submonolayer Zn(Cd)Te/ZnCdSe type-II quantum dots for intermediate band solar cell application

A rigorous comparison of X-ray diffraction thickness measurement techniques using silicon-on-insulator thin films

Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction

Residual stress/strain analysis in thin films by X-ray diffraction

Boundary Effects in the Eigenstrain Method

Flexural loading of rectangular Si beams and plates

Modeling of kinematic diffraction from a thin silicon film illuminated by a coherent, focused X-ray nanobeam

Radiative transitions in stacked type-II ZnMgTe quantum dots embedded in ZnSe

A quantitative analysis of room temperature recrystallization kinetics in electroplated copper films using high resolution x-ray diffraction

Engineering Applications of Time-of-Flight Neutron Diffraction

Diffraction profiles of elastically bent single crystals with constant strain gradients

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