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Masking, chelation, and solvent extraction for the determination of sub-parts-per-Million levels of trace elements in high iron and salt matrices

Analytical chemistry (Washington), 1986, Vol.58 (7), p.1541-1547

1986

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Use of CLS to Understand PLS IR Calibration for Trace Detection of Organic Molecules in Water

Applied spectroscopy, 1999-04, Vol.53 (4), p.390-395

1999

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Monitoring Dielectric Thin-Film Production on Product Wafers Using Infrared Emission Spectroscopy

Applied spectroscopy, 2001-08, Vol.55 (8), p.1053-1059

2001

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Enhancing IR Detection Limits for Trace Polar Organics in Aqueous Solutions with Surface-Modified Sol-Gel-Coated ATR Sensors

Applied spectroscopy, 1999-04, Vol.53 (4), p.381-389

1999

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Characterization of SH acoustic plate mode liquid sensors

Sensors and actuators, 1989-12, Vol.20 (3), p.253-268

1989

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Quantitative Determination of Borophosphosilicate Glass Thin-Film Properties Using Infrared Emission Spectroscopy

Applied spectroscopy, 1999-07, Vol.53 (7), p.822-828

1999

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Quantitative determination of dielectric thin-film properties on product wafers using infrared reflection-absorption spectroscopy

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1998-11, Vol.16 (6), p.3490-3494

1998

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Etch depth estimation of large-period silicon gratings with multivariate calibration of rigorously simulated diffraction profiles

Journal of the Optical Society of America. A, Optics, image science, and vision, 1994-09, Vol.11 (9), p.2485

1994

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Trace Water Vapor Detection in Nitrogen and Corrosive Gases by FTIR Spectroscopy

Journal of the Electrochemical Society, 1995-08, Vol.142 (8), p.2777-2782

1995

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Acoustoelectric interaction of plate modes with solutions

Journal of applied physics, 1988-11, Vol.64 (10), p.5002-5008

1988

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Optimized External IR Reflection Spectroscopy for Quantitative Determination of Borophosphosilicate Glass Parameters

Applied spectroscopy, 1997-02, Vol.51 (2), p.259-264

1997

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Quantitative analysis of borophosphosilicate glass films on silicon using infrared external reflection–absorption spectroscopy

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1995-07, Vol.13 (4), p.1959-1966

1995

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Precise property determinations of arsenosilicate glass thin films using infrared spectroscopy

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1994-05, Vol.12 (3), p.835-838

1994

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Factors influencing iron excitation in nitrogen/rare gas microwave plasmas

Spectrochimica acta. Part B: Atomic spectroscopy, 1992-06, Vol.47 (6), p.835-841

1992

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Determination of nitric acid concentration by using europium ion fluorescence

Talanta (Oxford), 1991-07, Vol.38 (7), p.767-772

1991

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Determination of arsenic, selenium, and antimony using metastable transfer emission spectrometry

Analytical chemistry (Washington), 1987-10, Vol.59 (20), p.2468-2472

1987

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Use of signal vs. time profiling to monitor sample volatilization in simultaneous multielement determinations by electrothermal vaporization/inductively coupled plasma atomic emission spectrometry

Analytical chemistry (Washington), 1985-12, Vol.57 (14), p.2896-2900

1985

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“Top-Down” versus “Side-On” Viewing of the Inductively Coupled Plasma

Applied spectroscopy, 1985-01, Vol.39 (1), p.5-9

1985

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Intra-Alkali Matrix Effects in the Inductively Coupled Plasma

Applied spectroscopy, 1983-11, Vol.37 (6), p.558-563

1983

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Determination of nitrogen atom concentration in flowing gases

Analytical chemistry (Washington), 1986-10, Vol.58 (12), p.2492-2495

1986

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Reaction rate studies of atomic germanium ( 3P 0,1) and silicon ( 3P J) with various oxidizers

Chemical physics letters, 1978-04, Vol.55 (2), p.274-279

1978

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Plasma models applicable to low pressure discharges

Spectrochimica acta. Part B: Atomic spectroscopy, 1981, Vol.36 (10), p.965-971

1981

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Optical Fibers for Remote Spectrometry of Alkali Elements in the dc Arc

Applied spectroscopy, 1985-01, Vol.39 (1), p.9-13

1985

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Testing of a rapid fault detection model for quality control: Borophosphosilicate glass thin films monitored by infrared absorption spectroscopy

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 1997-07, Vol.15 (4), p.955-960

1997

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Sensing in liquids with SH plate mode devices

IEEE 1988 Ultrasonics Symposium Proceedings, 1988, p.607-611 vol.1

1988

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Masking, chelation, and solvent extraction for the determination of sub-parts-per-Million levels of trace elements in high iron and salt matrices

Use of CLS to Understand PLS IR Calibration for Trace Detection of Organic Molecules in Water

Monitoring Dielectric Thin-Film Production on Product Wafers Using Infrared Emission Spectroscopy

Enhancing IR Detection Limits for Trace Polar Organics in Aqueous Solutions with Surface-Modified Sol-Gel-Coated ATR Sensors

Characterization of SH acoustic plate mode liquid sensors

Quantitative Determination of Borophosphosilicate Glass Thin-Film Properties Using Infrared Emission Spectroscopy

Quantitative determination of dielectric thin-film properties on product wafers using infrared reflection-absorption spectroscopy

Etch depth estimation of large-period silicon gratings with multivariate calibration of rigorously simulated diffraction profiles

Trace Water Vapor Detection in Nitrogen and Corrosive Gases by FTIR Spectroscopy

Acoustoelectric interaction of plate modes with solutions

Optimized External IR Reflection Spectroscopy for Quantitative Determination of Borophosphosilicate Glass Parameters

Quantitative analysis of borophosphosilicate glass films on silicon using infrared external reflection–absorption spectroscopy

Precise property determinations of arsenosilicate glass thin films using infrared spectroscopy

Factors influencing iron excitation in nitrogen/rare gas microwave plasmas

Determination of nitric acid concentration by using europium ion fluorescence

Determination of arsenic, selenium, and antimony using metastable transfer emission spectrometry

Use of signal vs. time profiling to monitor sample volatilization in simultaneous multielement determinations by electrothermal vaporization/inductively coupled plasma atomic emission spectrometry

“Top-Down” versus “Side-On” Viewing of the Inductively Coupled Plasma

Intra-Alkali Matrix Effects in the Inductively Coupled Plasma

Determination of nitrogen atom concentration in flowing gases

Reaction rate studies of atomic germanium ( 3P 0,1) and silicon ( 3P J) with various oxidizers

Plasma models applicable to low pressure discharges

Optical Fibers for Remote Spectrometry of Alkali Elements in the dc Arc

Testing of a rapid fault detection model for quality control: Borophosphosilicate glass thin films monitored by infrared absorption spectroscopy

Sensing in liquids with SH plate mode devices

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