UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Atomic-scale microstructure of metal halide perovskite

Science (American Association for the Advancement of Science), 2020-10, Vol.370 (6516)

2020

Volltextzugriff (PDF)

Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

Microscopy and microanalysis, 2013-08, Vol.19 (4), p.1050-1060

2013

Volltextzugriff (PDF)

Low-Dose Aberration-Free Imaging of Li-Rich Cathode Materials at Various States of Charge Using Electron Ptychography

Nano letters, 2018-11, Vol.18 (11), p.6850-6855

2018

Volltextzugriff (PDF)

Low-dose phase retrieval of biological specimens using cryo-electron ptychography

Nature communications, 2020-06, Vol.11 (1), p.2773-2773, Article 2773

2020

Volltextzugriff (PDF)

Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions

Ultramicroscopy, 2015-04, Vol.151, p.232-239

2015

Volltextzugriff (PDF)

Electron ptychographic microscopy for three-dimensional imaging

Nature communications, 2017-07, Vol.8 (1), p.163-8, Article 163

2017

Volltextzugriff (PDF)

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Ultramicroscopy, 2015-04, Vol.151, p.160-167

2015

Volltextzugriff (PDF)

Cryogenic electron ptychographic single particle analysis with wide bandwidth information transfer

Nature communications, 2023-05, Vol.14 (1), p.3027-3027, Article 3027

2023

Volltextzugriff (PDF)

High dose efficiency atomic resolution imaging via electron ptychography

Ultramicroscopy, 2019-01, Vol.196, p.131-135

2019

Volltextzugriff (PDF)

Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy

Physical review letters, 2020-03, Vol.124 (10), p.106105-106105, Article 106105

2020

Volltextzugriff (PDF)

Smart Align—a new tool for robust non-rigid registration of scanning microscope data

Advanced structural and chemical imaging, 2015-07, Vol.1 (1), p.1-16, Article 8

2015

Volltextzugriff (PDF)

Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

Ultramicroscopy, 2017-09, Vol.180 (C), p.173-179

2017

Volltextzugriff (PDF)

Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope

Ultramicroscopy, 2016-12, Vol.171 (C), p.117-125

2016

Volltextzugriff (PDF)

Templated 2D Polymer Heterojunctions for Improved Photocatalytic Hydrogen Production

Advanced materials (Weinheim), 2024-05, Vol.36 (20), p.e2300037-n/a

2024

Volltextzugriff (PDF)

Rapid Estimation of Catalyst Nanoparticle Morphology and Atomic-Coordination by High-Resolution Z‑Contrast Electron Microscopy

Nano letters, 2014-11, Vol.14 (11), p.6336-6341

2014

Volltextzugriff (PDF)

Contrast transfer and noise considerations in focused-probe electron ptychography

Ultramicroscopy, 2021-02, Vol.221, p.113189-113189, Article 113189

2021

Volltextzugriff (PDF)

High-precision atomic-scale strain mapping of nanoparticles from STEM images

Ultramicroscopy, 2022-09, Vol.239, p.113561-113561, Article 113561

2022

Volltextzugriff (PDF)

Predicting the Oxygen-Binding Properties of Platinum Nanoparticle Ensembles by Combining High-Precision Electron Microscopy and Density Functional Theory

Nano letters, 2017-07, Vol.17 (7), p.4003-4012

2017

Volltextzugriff (PDF)

Filled and glycosylated carbon nanotubes for in vivo radioemitter localization and imaging

Nature materials, 2010-06, Vol.9 (6), p.485-490

2010

Volltextzugriff (PDF)

Subsampled STEM-ptychography

Applied physics letters, 2018-07, Vol.113 (3)

2018

Volltextzugriff (PDF)

Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping

Ultramicroscopy, 2017-08, Vol.179, p.57-62

2017

Volltextzugriff (PDF)

Managing dose-, damage- and data-rates in multi-frame spectrum-imaging

Microscopy, 2018-03, Vol.67 (suppl_1), p.i98-i113

2018

Volltextzugriff (PDF)

Fast Ptychographic Reconstruction for Sparse Binary Ptychography Data

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.438-439

2022

Volltextzugriff (PDF)

Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy

Physical review letters, 2019-02, Vol.122 (6), p.066101-066101, Article 066101

2019

Volltextzugriff (PDF)

Increasing Spatial Fidelity and SNR of 4D-STEM Using Multi-Frame Data Fusion

Microscopy and microanalysis, 2022-08, Vol.28 (4), p.1417-1427

2022

Volltextzugriff (PDF)

1 – 25 von 291

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(232)
Mit Volltextzugriff
(274)

Publikationsform

2 weitere anzeigen...

Weniger anzeigen...

Sprache

Englisch
(271)
Japanisch
(3)

Erscheinungsjahr

n.n

Thema

Science & Technology
(127)
Technology
(69)
Physical Sciences
(57)
Materials Science
(50)
Microscopy
(43)
Materials Science, Multidisciplinary
(41)
Physics
(40)
Chemistry
(36)
Scanning Transmission Electron Microscopy
(35)
Science & Technology - Other Topics
(30)
Life Sciences & Biomedicine
(27)
Chemistry, Physical
(26)
Chemistry, Multidisciplinary
(24)
Humans
(23)
Physics, Applied
(22)
Nanoscience & Nanotechnology
(20)
Transmission Electron Microscopy
(19)
Analytical And Instrumentation Science Symposia
(18)
Scanning Electron Microscopy
(18)
Genetics & Heredity
(15)

15 weitere anzeigen...

Weniger anzeigen...

Zeitschrift / Serie

5 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 30 Tagen
(3)
... seit 90 Tagen
(5)

Menü

Weitere Dienste

Einstellungen

Atomic-scale microstructure of metal halide perovskite

Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

Low-Dose Aberration-Free Imaging of Li-Rich Cathode Materials at Various States of Charge Using Electron Ptychography

Low-dose phase retrieval of biological specimens using cryo-electron ptychography

Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions

Electron ptychographic microscopy for three-dimensional imaging

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Cryogenic electron ptychographic single particle analysis with wide bandwidth information transfer

High dose efficiency atomic resolution imaging via electron ptychography

Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy

Smart Align—a new tool for robust non-rigid registration of scanning microscope data

Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope

Templated 2D Polymer Heterojunctions for Improved Photocatalytic Hydrogen Production

Rapid Estimation of Catalyst Nanoparticle Morphology and Atomic-Coordination by High-Resolution Z‑Contrast Electron Microscopy

Contrast transfer and noise considerations in focused-probe electron ptychography

High-precision atomic-scale strain mapping of nanoparticles from STEM images

Predicting the Oxygen-Binding Properties of Platinum Nanoparticle Ensembles by Combining High-Precision Electron Microscopy and Density Functional Theory

Filled and glycosylated carbon nanotubes for in vivo radioemitter localization and imaging

Subsampled STEM-ptychography

Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping

Managing dose-, damage- and data-rates in multi-frame spectrum-imaging

Fast Ptychographic Reconstruction for Sparse Binary Ptychography Data

Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy

Increasing Spatial Fidelity and SNR of 4D-STEM Using Multi-Frame Data Fusion

Suchergebnisse filtern