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Journal of materials science. Materials in electronics, 2020-10, Vol.31 (20), p.17412-17421
2020
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Journal of physics. Conference series, 2017, Vol.794 (1)
2017
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Optical materials, 2023-11, Vol.145, p.114422, Article 114422
2023
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Journal of physics. Conference series, 2017-01, Vol.794, p.12018
2017
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Journal of electrostatics, 2005-09, Vol.63 (11), p.1009-1015
2005
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Physica status solidi. A, Applied research, 1983-06, Vol.77 (2), p.699-707
1983
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Kardiologiia, 1977-01, Vol.17 (1), p.63
1977
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Physica status solidi. A, Applied research, 1983-06, Vol.77 (2), p.699-707
1983
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International journal of oral and maxillofacial surgery, 2015-03, Vol.44 (3), p.292-296
2015
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Ceramics international, 2019-06, Vol.45 (9), p.11403-11407
2019
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The New England journal of medicine, 2020-06, Vol.382 (23), p.2197-2206
2020
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Nano express, 2024-06, Vol.5 (2), p.025005
2024
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Radiotherapy and oncology, 2022-05, Vol.170, p.S1251-S1251
2022
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Journal of materials science. Materials in electronics, 2021-08, Vol.32 (15), p.20274-20283
2021
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Microelectronic engineering, 2022-04, Vol.259, p.111788, Article 111788
2022
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Solid state sciences, 2024-05, Vol.151, p.107515, Article 107515
2024
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IOP conference series. Materials Science and Engineering, 2020-10, Vol.942 (1), p.12015
2020
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IEEE photonics journal, 2021-06, Vol.13 (3), p.1-24
2021
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Applied physics letters, 2014-03, Vol.104 (9), p.93701
2014
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Thin solid films, 2021-09, Vol.734, p.138849, Article 138849
2021
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Physical review letters, 2010-06, Vol.104 (24)
- Puckett, A. J. R.
- Brash, E. J.
- Jones, M. K.
- Luo, W.
- Meziane, M.
- Pentchev, L.
- Perdrisat, C. F.
- Punjabi, V.
- Wesselmann, F. R.
- Ahmidouch, A.
- Albayrak, I.
- Aniol, K. A.
- Arrington, J.
- Asaturyan, A.
- Baghdasaryan, H.
- Benmokhtar, F.
- Bertozzi, W.
- Bimbot, L.
- Bosted, P.
- Boeglin, W.
- Butuceanu, C.
- Carter, P.
- Chernenko, S.
- Christy, E.
- Commisso, M.
- Covrig, S.
- Danagoulian, S.
- Daniel, A.
- Davidenko, A.
- Day, D.
- Dhamija, S.
- Dutta, D.
- Ent, R.
- Frullani, S.
- Fenker, H.
- Frlez, E.
- Garibaldi, F.
- Gaskell, D.
- Gilad, S.
- Gilman, R.
- Goncharenko, Y.
- Hafidi, K.
- Hamilton, D.
- Higinbotham, D. W.
- Hinton, W.
- Horn, T.
- Hu, B.
- Huang, J.
- Huber, G. M.
- Jensen, E.
- Keppel, C.
- Khandaker, M.
- King, P.
- Kirillov, D.
- Kohl, M.
- Kravtsov, V.
- Kumbartzki, G.
- Li, Y.
- Mamyan, V.
- Margaziotis, D. J.
- Marsh, A.
- Matulenko, Y.
- Maxwell, J.
- Mbianda, G.
- Meekins, D.
- Melnik, Y.
- Mkrtchyan, A.
- Mkrtchyan, H.
- Moffit, B.
- Moreno, O.
- Narayan, A.
- Nedev, S.
- Nuruzzaman, none
- Piasetzky, E.
- Pierce, W.
- Piskunov, N. M.
- Prok, Y.
- Ransome, R. D.
- Razin, D. S.
- Reimer, P.
- Reinhold, J.
- Rondon, O.
- Shabestari, M.
- Shahinyan, A.
- Shestermanov, K.
- Širca, S.
- Sitnik, I.
- Smykov, L.
- Smith, G.
- Solovyev, L.
- Solvignon, P.
- Subedi, R.
- Veilleux, M.
- Wojtsekhowski, B. B.
- Wood, S.
- Zanevsky, Y.
- Zhang, X.
- Zhang, Y.
- Zheng, X.
- Zhu, L.
2010
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Journal of alloys and compounds, 2017-01, Vol.691, p.308-315
2017
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Materials science in semiconductor processing, 2017-11, Vol.71, p.290-295
2017
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Applied physics letters, 2014-10, Vol.105 (16)
2014
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Nano express, 2024-06, Vol.5 (2), p.25005
2024
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