UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Role analysis using the ego-ERGM: A look at environmental interest group coalitions

Social networks, 2018-01, Vol.52, p.213-227

2018

Volltextzugriff (PDF)

EDXY – A low cost congestion-aware routing algorithm for network-on-chips

Journal of systems architecture, 2010-07, Vol.56 (7), p.256-264

2010

Volltextzugriff (PDF)

Introgression of B-genome chromosomes in a doubled haploid population of Brassica napus × B. carinata

Genome, 2010-08, Vol.53 (8), p.619-629

2010

Volltextzugriff (PDF)

Emotion on FPGA: Model driven approach

Expert systems with applications, 2009-05, Vol.36 (4), p.7369-7378

2009

Volltextzugriff (PDF)

Introgression of B-genome chromosomes in a doubled haploid population of Brassica napus x B. carinata

Genome, 2010-08, Vol.53 (8), p.619

2010

Volltextzugriff (PDF)

Digital System Test and Testable Design: Using HDL Models and Architectures

Navabi, Zainalabedin

1, 2010

Volltextzugriff (PDF)

Real-time embedded emotional controller

Neural computing & applications, 2010-02, Vol.19 (1), p.13-19

2010

Volltextzugriff (PDF)

Brassica B-genome resistance to stem rot (Sclerotinia sclerotiorum) in a doubled haploid population of Brassica napus x Brassica carinata

Canadian journal of plant pathology, 2010, Vol.32 (2), p.237-246

2010

Volltextzugriff (PDF)

Sign Bit Reduction Encoding For Low Power Applications

Journal of signal processing systems, 2009-12, Vol.57 (3), p.321-329

2009

Volltextzugriff (PDF)

Using data compression in automatic test equipment for system-on-chip testing

IEEE transactions on instrumentation and measurement, 2004-04, Vol.53 (2), p.308-317

2004

Volltextzugriff (PDF)

Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment

2010 19th IEEE Asian Test Symposium, 2010, p.53-56

2010

Volltextzugriff (PDF)

Low overhead DFT using CDFG by modifying controller

IET computers & digital techniques, 2007-07, Vol.1 (4), p.322-333

2007

Volltextzugriff (PDF)

Simultaneous Reduction of Dynamic and Static Power in Scan Structures

Design, Automation and Test in Europe, 2005, p.846-851

2005

Volltextzugriff (PDF)

A BIST architecture for FPGA look up table testing reduces reconfigurations

2003 Test Symposium, 2003, p.84-89

2003

Volltextzugriff (PDF)

Microsatellite mapping of a Russian wheat aphid resistance gene on chromosome 7B of an Iranian tetraploid wheat line: preliminary results

Cereal research communications, 2004-01, Vol.32 (4), p.451-457

2004

Volltextzugriff (PDF)

Enhancing Fault Simulation Performance by Dynamic Fault Clustering

14th Asian Test Symposium (ATS'05), 2005, p.278-283

2005

Volltextzugriff (PDF)

Sign bit reduction encoding for low power applications

Annual ACM IEEE Design Automation Conference: Proceedings of the 42nd annual conference on Design automation; 13-17 June 2005, 2005, p.214-217

2005

Volltextzugriff (PDF)

Adaptation of an event-driven simulation environment to sequentially propagated concurrent fault simulation

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001, 2001, p.823

2001

Volltextzugriff (PDF)

Test instruction set (TIS) for high level self-testing of CPU cores

13th Asian Test Symposium, 2004, p.158-163

2004

Volltextzugriff (PDF)

Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007, p.21-29

2007

Volltextzugriff (PDF)

Brassica B-genome resistance to stem rot (Sclerotinia sclerotiorum) in a doubled haploid population of Brassica napus × Brassica carinata

Canadian journal of plant pathology, 2010-06, Vol.32 (2), p.237-246

2010

Volltextzugriff (PDF)

Simulating faults of combinational IP core-based SOCs in a PLI environment

20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05), 2005, p.389-397

2005

Volltextzugriff (PDF)

Instruction level test methodology for CPU core software-based self-testing

Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940), 2004, p.25-29

2004

Volltextzugriff (PDF)

BARP-A Dynamic Routing Protocol for Balanced Distribution of Traffic in NoCs

2008 Design, Automation and Test in Europe, 2008, p.1408-1413

2008

Volltextzugriff (PDF)

A Probabilistic and Constraint Based Approach for Low Power Test Generation

2012 IEEE 21st Asian Test Symposium, 2012, p.113-118

2012

Volltextzugriff (PDF)

1 – 25 von 180

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(39)
Mit Volltextzugriff
(167)

Publikationsform

Sprache

Englisch
(180)

Erscheinungsjahr

n.n

Thema

Science & Technology
(112)
Technology
(98)
Engineering
(73)
Engineering, Electrical & Electronic
(73)
Computer Science
(64)
Computer Science, Hardware & Architecture
(50)
Hardware
(40)
Circuit Faults
(32)
Hardware Design Languages
(28)
Circuit Testing
(24)
Circuit Simulation
(20)
Switches
(20)
Network-On-A-Chip
(19)
Built-In Self-Test
(18)
Computational Modeling
(18)
Computer Architecture
(18)
Computer Science, Software Engineering
(18)
Testing
(18)
System Testing
(17)
Computer Science, Theory & Methods
(16)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Role analysis using the ego-ERGM: A look at environmental interest group coalitions

EDXY – A low cost congestion-aware routing algorithm for network-on-chips

Introgression of B-genome chromosomes in a doubled haploid population of Brassica napus × B. carinata

Emotion on FPGA: Model driven approach

Introgression of B-genome chromosomes in a doubled haploid population of Brassica napus x B. carinata

Digital System Test and Testable Design: Using HDL Models and Architectures

Real-time embedded emotional controller

Brassica B-genome resistance to stem rot (Sclerotinia sclerotiorum) in a doubled haploid population of Brassica napus x Brassica carinata

Sign Bit Reduction Encoding For Low Power Applications

Using data compression in automatic test equipment for system-on-chip testing

Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment

Low overhead DFT using CDFG by modifying controller

Simultaneous Reduction of Dynamic and Static Power in Scan Structures

A BIST architecture for FPGA look up table testing reduces reconfigurations

Microsatellite mapping of a Russian wheat aphid resistance gene on chromosome 7B of an Iranian tetraploid wheat line: preliminary results

Enhancing Fault Simulation Performance by Dynamic Fault Clustering

Sign bit reduction encoding for low power applications

Adaptation of an event-driven simulation environment to sequentially propagated concurrent fault simulation

Test instruction set (TIS) for high level self-testing of CPU cores

Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model

Brassica B-genome resistance to stem rot (Sclerotinia sclerotiorum) in a doubled haploid population of Brassica napus × Brassica carinata

Simulating faults of combinational IP core-based SOCs in a PLI environment

Instruction level test methodology for CPU core software-based self-testing

BARP-A Dynamic Routing Protocol for Balanced Distribution of Traffic in NoCs

A Probabilistic and Constraint Based Approach for Low Power Test Generation

Suchergebnisse filtern