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2016 IEEE International Test Conference (ITC), 2016, p.1-8
2016
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IEEE transactions on computer-aided design of integrated circuits and systems, 2017-12, Vol.36 (12), p.2120-2133
2017
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2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019, p.1673-1678
2019
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2016 IEEE International Test Conference (ITC), 2016, p.1-10
2016
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2016 IEEE International Test Conference (ITC), 2016, p.1-8
2016
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2016 IEEE 34th VLSI Test Symposium (VTS), 2016, p.1-6
2016
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2017 IEEE International Symposium on Circuits and Systems (ISCAS), 2017, p.1-4
2017
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2018 IEEE 36th VLSI Test Symposium (VTS), 2018, p.1-1
2018
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2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2016, p.1-6
2016
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2015 IEEE 33rd VLSI Test Symposium (VTS), 2015, p.1-6
2015
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2014 International Test Conference, 2014, p.1-7
2014
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2009 IEEE International Conference on Computer Design, 2009, p.64-69
2009
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Proceedings of the Conference on Design, Automation and Test in Europe, 2010, p.556-561
2010
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2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010), 2010, p.556-561
2010
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IEEE International Conference on Test, 2005, 2005, p.10 pp.-155
2005
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2006 IEEE International Reliability Physics Symposium Proceedings, 2006, p.552-559
2006
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2015 International Conference on Computing Communication Control and Automation, 2015, p.863-867
2015
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2015 International Conference on Computing Communication Control and Automation, 2015, p.989-991
2015
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Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015, p.9-14
2015
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2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2015, p.9-14
2015
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2016 IEEE International Symposium on Circuits and Systems (ISCAS), 2016, p.898-901
2016
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Machine Learning in VLSI Computer-Aided Design, p.119-173
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IEEE design & test of computers, 2009-09, Vol.26 (5), p.64-73
2009
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IEEE design & test of computers, 2009-09, Vol.26 (5), p.74-82
2009
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IEEE design and test, 2013, p.1-1
2013
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