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Mass-selected ion beam generation using two rotating electric-field mass separation technique

AIP advances, 2023-10, Vol.13 (10), p.105205-105205-7

Nojima, Masashi

2023

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Development of Mass-controlled Ion Beam through a Vacuum Electrospray Method

e-Journal of Surface Science and Nanotechnology, 2022/06/16, Vol.20(3), pp.155-160

Nojima, Masashi

2022

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Method to measure the size distribution of massive cluster ion beams using two rotating electric fields

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2018-10, Vol.432, p.1-4

2018

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Mass Separation of Water Cluster Ion Beam Using Two Rotating Electric Fields and Sputtering of a Polymer Thin Film

e-Journal of Surface Science and Nanotechnology, 2020/03/21, Vol.18, pp.101-105

2020

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Development of Mass-controlled Ion Beam through a Vacuum Electrospray Method

e-Journal of Surface Science and Nanotechnology, 2022/06/16, pp.2022-027

Nojima, Masashi

2022

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X-ray photoelectron diffraction (XPED) and X-ray spectro-holography from the contributions of our instruments

Journal of electron spectroscopy and related phenomena, 2022-05, Vol.257, p.147187, Article 147187

2022

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Development of a mass spectrometer using two rotating electric fields

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2016-05, Vol.34 (3)

2016

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Mass analysis by Ar-GCIB-dynamic SIMS for organic materials

Surface and interface analysis, 2014-12, Vol.46 (12-13), p.1212-1214

2014

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Development of a new generation of ion beams

Impact, 2022-04, Vol.2022 (2), p.46-47

Nojima, Masashi

2022

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The Generations of Primary Ion Beam using Two Rotating Electric-field Mass (REF-MS) Separation Technique

Journal of surface analysis, 2023, Vol.30 (2), p.89-97

Nojima, Masashi

2023

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Development of Mass Spectrometer Using Two Rotating Electric Fields for Separation of High-Mass Ions

e-Journal of Surface Science and Nanotechnology, 2016/05/28, Vol.14, pp.161-164

2016

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Imaging Mass Spectrogram using Rotating Electric Fields Mass Spectrometer

Global journal of nanomedicine, 2017-08, Vol.2 (5)

Nojima, Masashi

2017

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Study on Sputtering Mechanism of Shave-off Profiling

e-Journal of Surface Science and Nanotechnology, 2011/10/15, Vol.9, pp.386-389

2011

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Present State of Development of Laser-Assisted Wide Angle Three-Dimensional Atom Probe

Surface and interface analysis, 2010-10, Vol.42 (10-11), p.1616-1621

2010

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Development of Reconstruction Method for Highly Precise Shave-Off Depth Profiling

e-Journal of Surface Science and Nanotechnology, 2010/05/15, Vol.8, pp.237-240

2010

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Mass Separation of AuGe-LMIS Using a New Principle: Rotating Electric Fields

Mass Spectrometry & Purification Techniques, 2018-10, Vol.4 (2)

2018

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Development of a new generation of ion beams

Impact, 2022-06, Vol.2022 (3), p.45-46

Nojima, Masashi

2022

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Effects of Higher Relative pH but Lower Blood Lactate Concentration on Wingate Test Performance: 3720 Board #159 June 4, 9

Medicine and science in sports and exercise, 2016-05, Vol.48, p.1038

2016

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Development of organic SIMS system with Ar-GCIB and IMS-4f

Surface and interface analysis, 2014-11, Vol.46 (S1), p.368-371

2014

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Pin point depth profiling for unit device or several nano-devices

Surface and interface analysis, 2006-12, Vol.38 (12-13), p.1747-1750

2006

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Mass analysis by Ar-GCIB-dynamic SIMS for organic materials

Surface and interface analysis, 2015-02, Vol.47 (2), p.298-300

2015

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Retracted: Mass analysis by Ar‐GCIB‐dynamic SIMS for organic materials

Surface and interface analysis, 2015-02, Vol.47 (2), p.295-297

2015

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Retracted: Mass analysis by Ar‐GCIB‐dynamic SIMS for organic materials

Surface and interface analysis, 2015-02, Vol.47 (2), p.298-300

2015

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X-Ray Photoelectron Diffraction Study on the Surface and Interface Structure of VO2/TiO2(110) Model Catalyst

e-Journal of Surface Science and Nanotechnology, 2008/12/18, Vol.6, pp.272-275

2008

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Mass analysis by Ar-GCIB-dynamic SIMS for organic materials

Surface and interface analysis, 2015-02, Vol.47 (2), p.295-297

2015

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Mass-selected ion beam generation using two rotating electric-field mass separation technique

Development of Mass-controlled Ion Beam through a Vacuum Electrospray Method

Method to measure the size distribution of massive cluster ion beams using two rotating electric fields

Mass Separation of Water Cluster Ion Beam Using Two Rotating Electric Fields and Sputtering of a Polymer Thin Film

Development of Mass-controlled Ion Beam through a Vacuum Electrospray Method

X-ray photoelectron diffraction (XPED) and X-ray spectro-holography from the contributions of our instruments

Development of a mass spectrometer using two rotating electric fields

Mass analysis by Ar-GCIB-dynamic SIMS for organic materials

Development of a new generation of ion beams

The Generations of Primary Ion Beam using Two Rotating Electric-field Mass (REF-MS) Separation Technique

Development of Mass Spectrometer Using Two Rotating Electric Fields for Separation of High-Mass Ions

Imaging Mass Spectrogram using Rotating Electric Fields Mass Spectrometer

Study on Sputtering Mechanism of Shave-off Profiling

Present State of Development of Laser-Assisted Wide Angle Three-Dimensional Atom Probe

Development of Reconstruction Method for Highly Precise Shave-Off Depth Profiling

Mass Separation of AuGe-LMIS Using a New Principle: Rotating Electric Fields

Development of a new generation of ion beams

Effects of Higher Relative pH but Lower Blood Lactate Concentration on Wingate Test Performance: 3720 Board #159 June 4, 9

Development of organic SIMS system with Ar-GCIB and IMS-4f

Pin point depth profiling for unit device or several nano-devices

Mass analysis by Ar-GCIB-dynamic SIMS for organic materials

Retracted: Mass analysis by Ar‐GCIB‐dynamic SIMS for organic materials

Retracted: Mass analysis by Ar‐GCIB‐dynamic SIMS for organic materials

X-Ray Photoelectron Diffraction Study on the Surface and Interface Structure of VO2/TiO2(110) Model Catalyst

Mass analysis by Ar-GCIB-dynamic SIMS for organic materials

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