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Study of Short-range Ordering in Amorphous and Nanocrystalline Materials from Laboratory based Pair Distribution Function (LPDF)

Transactions of the Indian Ceramic Society, 2020-07, Vol.79 (3), p.158-165

2020

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N-polar GaN evolution on nominally on-axis c-plane sapphire by MOCVD part-I: Growth optimization

Materials science & engineering. B, Solid-state materials for advanced technology, 2022-12, Vol.286, p.116038, Article 116038

2022

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N-polar GaN evolution on nominally on-axis c-plane sapphire by MOCVD Part-II: Microstructural investigation

Materials science & engineering. B, Solid-state materials for advanced technology, 2022-12, Vol.286, p.116004, Article 116004

2022

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Sintering and characterization of a hard-to-hard configured composite: Spark plasma sintered WC reinforced α−SiAlON

The Journal of physics and chemistry of solids, 2020-10, Vol.145, p.109548, Article 109548

2020

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AlN–SWCNT Metacomposites Having Tunable Negative Permittivity in Radio and Microwave Frequencies

ACS applied materials & interfaces, 2019-12, Vol.11 (51), p.48212-48220

2019

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Effect of quenching and partitioning on the microstructure and mechanical properties of a medium carbon low alloy low silicon (0.3C–1.0Mn–0.4Si–0.6Cr–0.46Ni–0.26Mo) steel

Materials research express, 2018-11, Vol.5 (11), p.116503

2018

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Laboratory X-ray diffractometer for PDF experiments using Ag radiation

Acta crystallographica. Section A, Foundations and advances, 2017-12, Vol.73 (a2), p.C885-C885

2017

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Spark Plasma Sintering of Magnesia-Doped Alumina with High Hardness and Fracture Toughness

Journal of the American Ceramic Society, 2008-01, Vol.91 (1), p.203-208

2008

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Insight into the spontaneous breakdown of ‘Toughened glass’: From nano- to macroscale

Materialia, 2020-08, Vol.12, p.100776, Article 100776

2020

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Quantitative strain and compositional studies of InxGa1-xAs Epilayer in a GaAs-based pHEMT device structure by TEM techniques

Microscopy and microanalysis, 2014-08, Vol.20 (4), p.1262-1270

2014

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Quantitative Strain and Compositional Studies of In x Ga 1− x As Epilayer in a GaAs-based pHEMT Device Structure by TEM Techniques

Microscopy and microanalysis, 2014-08, Vol.20 (4), p.1262-1270

2014

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Quantitative Strain and Compositional Studies of In sub( )xa sub(1-)xs Epilayer in a GaAs-based pHEMT Device Structure by TEM Techniques

Microscopy and microanalysis, 2014-08, Vol.20 (4), p.1262-1270

2014

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Quantitative Strain and Compositional Studies of In x Ga1−x As Epilayer in a GaAs-based pHEMT Device Structure by TEM Techniques

Microscopy and microanalysis, 2014-08, Vol.20 (4), p.1262-1270

2014

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Laboratory X-ray diffractometer for PDF experiments using Ag radiation

2017

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An Insight into the Spontaneous Breakdown of 'Toughened Glass' from Nano- to Macroscale

SSRN Electronic Journal

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Study of Short-range Ordering in Amorphous and Nanocrystalline Materials from Laboratory based Pair Distribution Function (LPDF)

N-polar GaN evolution on nominally on-axis c-plane sapphire by MOCVD part-I: Growth optimization

N-polar GaN evolution on nominally on-axis c-plane sapphire by MOCVD Part-II: Microstructural investigation

Sintering and characterization of a hard-to-hard configured composite: Spark plasma sintered WC reinforced α−SiAlON

AlN–SWCNT Metacomposites Having Tunable Negative Permittivity in Radio and Microwave Frequencies

Effect of quenching and partitioning on the microstructure and mechanical properties of a medium carbon low alloy low silicon (0.3C–1.0Mn–0.4Si–0.6Cr–0.46Ni–0.26Mo) steel

Laboratory X-ray diffractometer for PDF experiments using Ag radiation

Spark Plasma Sintering of Magnesia-Doped Alumina with High Hardness and Fracture Toughness

Insight into the spontaneous breakdown of ‘Toughened glass’: From nano- to macroscale

Quantitative strain and compositional studies of InxGa1-xAs Epilayer in a GaAs-based pHEMT device structure by TEM techniques

Quantitative Strain and Compositional Studies of In x Ga 1− x As Epilayer in a GaAs-based pHEMT Device Structure by TEM Techniques

Quantitative Strain and Compositional Studies of In sub( )xa sub(1-)xs Epilayer in a GaAs-based pHEMT Device Structure by TEM Techniques

Quantitative Strain and Compositional Studies of In x Ga1−x As Epilayer in a GaAs-based pHEMT Device Structure by TEM Techniques

Laboratory X-ray diffractometer for PDF experiments using Ag radiation

An Insight into the Spontaneous Breakdown of 'Toughened Glass' from Nano- to Macroscale

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