UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Multiscale, Multiphysics Modeling and Simulation of Single-Event Effects in Digital Electronics: From Particles to Systems

IEEE transactions on nuclear science, 2024-01, Vol.71 (1), p.31-66

2024

Volltextzugriff (PDF)

New insights into diffusion–collection modeling of radiation-induced charge in semiconductor devices

Journal of applied physics, 2023-11, Vol.134 (17)

2023

Volltextzugriff (PDF)

Characterization and antimicrobial activity of silver nanoparticles, biosynthesized using Bacillus species

Applied surface science, 2018-04, Vol.438, p.66-73

2018

Volltextzugriff (PDF)

Modeling and Simulation of Single-Event Effects in Digital Devices and ICs

IEEE transactions on nuclear science, 2008-08, Vol.55 (4), p.1854-1878

2008

Volltextzugriff (PDF)

Overcoming the insulating materials limitation in HiPIMS: Ion-assisted deposition of DLC coatings using bipolar HiPIMS

Applied surface science, 2019-11, Vol.494, p.871-879

2019

Volltextzugriff (PDF)

Coping strategies, satisfaction with life, and quality of life in Crohn's disease: A gender perspective using structural equation modeling analysis

PloS one, 2017-02, Vol.12 (2), p.e0172779-e0172779

2017

Volltextzugriff (PDF)

Fusion Neutron-Induced Soft Errors During Long Pulse D-D Plasma Discharges in the WEST Tokamak

IEEE transactions on nuclear science, 2024-08, Vol.71 (8), p.1496-1502

2024

Volltextzugriff (PDF)

Real-Time Characterization of Neutron-Induced SEUs in Fusion Experiments at WEST Tokamak During D-D Plasma Operation

IEEE transactions on nuclear science, 2022-03, Vol.69 (3), p.501-511

2022

Volltextzugriff (PDF)

Application of the TIARA Radiation Transport Tool to Single Event Effects Simulation

IEEE transactions on nuclear science, 2014-06, Vol.61 (3), p.1498-1500

2014

Volltextzugriff (PDF)

The influence of annealing treatments on the properties of Ag:TiO2 nanocomposite films prepared by magnetron sputtering

Applied surface science, 2012-02, Vol.258 (8), p.4028-4034

2012

Volltextzugriff (PDF)

Surgical technique in the laparoscopic repair of Morgagni hernia in adults. How do we do it?

Hernia : the journal of hernias and abdominal wall surgery, 2022-10, Vol.26 (5), p.1389-1394

2022

Volltextzugriff (PDF)

Real-time soft-error rate measurements: A review

Microelectronics and reliability, 2014-08, Vol.54 (8), p.1455-1476

2014

Volltextzugriff (PDF)

Mechanical and wear characteristics of a-C:H/Cr/AlN/Ti multilayer films deposited by PVD/PACVD

Surface & coatings technology, 2017-06, Vol.320, p.284-292

2017

Volltextzugriff (PDF)

Radiation sensitivity of junctionless double-gate 6T SRAM cells investigated by 3-D numerical simulation

Microelectronics and reliability, 2014-09, Vol.54 (9-10), p.2284-2288

2014

Volltextzugriff (PDF)

Geant4 Analysis of n-Si Nuclear Reactions From Different Sources of Neutrons and Its Implication on Soft-Error Rate

IEEE transactions on nuclear science, 2012-08, Vol.59 (4), p.714-722

2012

Volltextzugriff (PDF)

Soft-Error Rate Induced by Thermal and Low Energy Neutrons in 40 nm SRAMs

IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.2658-2665

2012

Volltextzugriff (PDF)

Tantalum oxynitride thin films: Mechanical properties and wear behavior dependence on growth conditions

Surface & coatings technology, 2014-11, Vol.258, p.587-596

2014

Volltextzugriff (PDF)

Structure dependent resistivity and dielectric characteristics of tantalum oxynitride thin films produced by magnetron sputtering

Applied surface science, 2015-11, Vol.354 (B), p.298-305

2015

Volltextzugriff (PDF)

A review of the pseudo-MOS transistor in SOI wafers: operation, parameter extraction, and applications

IEEE transactions on electron devices, 2000-05, Vol.47 (5), p.1018-1027

2000

Volltextzugriff (PDF)

Structural, mechanical and piezoelectric properties of polycrystalline AlN films sputtered on titanium bottom electrodes

Applied surface science, 2015-11, Vol.354, p.267-278

2015

Volltextzugriff (PDF)

Composition and structure variation for magnetron sputtered tantalum oxynitride thin films, as function of deposition parameters

Applied surface science, 2015-12, Vol.358, p.508-517

2015

Volltextzugriff (PDF)

Random-Walk Drift-Diffusion Charge-Collection Model For Reverse-Biased Junctions Embedded in Circuits

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3527-3534

2014

Volltextzugriff (PDF)

Preparation and characterization of CrNxOy thin films: The effect of composition and structural features on the electrical behavior

Applied surface science, 2011-08, Vol.257 (21), p.9120-9124

2011

Volltextzugriff (PDF)

Influence of band structure on electron ballistic transport in silicon nanowire MOSFET’s: An atomistic study

Solid-state electronics, 2006-04, Vol.50 (4), p.716-721

2006

Volltextzugriff (PDF)

The influence of additive manufacturing parameters on the structural and mechanical properties of acrylonitrile butadiene styrene (ABS) parts produced by fused filament fabrication

IOP conference series. Materials Science and Engineering, 2019-11, Vol.682 (1), p.12013

2019

Volltextzugriff (PDF)

1 – 25 von 1.301

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(895)
Mit Volltextzugriff
(1.098)

Publikationsform

2 weitere anzeigen...

Weniger anzeigen...

Sprache

5 weitere anzeigen...

Weniger anzeigen...

Erscheinungsjahr

n.n

Thema

Science & Technology
(484)
Technology
(314)
Social Sciences
(241)
Economics
(229)
Business & Economics
(228)
Business, Finance
(227)
Business
(224)
Engineering
(203)
Physical Sciences
(184)
Humans
(174)
Engineering, Electrical & Electronic
(158)
Physics
(137)
Life Sciences & Biomedicine
(118)
Engineering Sciences
(111)
Male
(103)
Micro And Nanotechnologies
(100)
Microelectronics
(100)
Female
(99)
Materials Science
(99)
Exact Sciences And Technology
(93)

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 30 Tagen
(3)
... seit 90 Tagen
(6)

Menü

Weitere Dienste

Einstellungen

Multiscale, Multiphysics Modeling and Simulation of Single-Event Effects in Digital Electronics: From Particles to Systems

New insights into diffusion–collection modeling of radiation-induced charge in semiconductor devices

Characterization and antimicrobial activity of silver nanoparticles, biosynthesized using Bacillus species

Modeling and Simulation of Single-Event Effects in Digital Devices and ICs

Overcoming the insulating materials limitation in HiPIMS: Ion-assisted deposition of DLC coatings using bipolar HiPIMS

Coping strategies, satisfaction with life, and quality of life in Crohn's disease: A gender perspective using structural equation modeling analysis

Fusion Neutron-Induced Soft Errors During Long Pulse D-D Plasma Discharges in the WEST Tokamak

Real-Time Characterization of Neutron-Induced SEUs in Fusion Experiments at WEST Tokamak During D-D Plasma Operation

Application of the TIARA Radiation Transport Tool to Single Event Effects Simulation

The influence of annealing treatments on the properties of Ag:TiO2 nanocomposite films prepared by magnetron sputtering

Surgical technique in the laparoscopic repair of Morgagni hernia in adults. How do we do it?

Real-time soft-error rate measurements: A review

Mechanical and wear characteristics of a-C:H/Cr/AlN/Ti multilayer films deposited by PVD/PACVD

Radiation sensitivity of junctionless double-gate 6T SRAM cells investigated by 3-D numerical simulation

Geant4 Analysis of n-Si Nuclear Reactions From Different Sources of Neutrons and Its Implication on Soft-Error Rate

Soft-Error Rate Induced by Thermal and Low Energy Neutrons in 40 nm SRAMs

Tantalum oxynitride thin films: Mechanical properties and wear behavior dependence on growth conditions

Structure dependent resistivity and dielectric characteristics of tantalum oxynitride thin films produced by magnetron sputtering

A review of the pseudo-MOS transistor in SOI wafers: operation, parameter extraction, and applications

Structural, mechanical and piezoelectric properties of polycrystalline AlN films sputtered on titanium bottom electrodes

Composition and structure variation for magnetron sputtered tantalum oxynitride thin films, as function of deposition parameters

Random-Walk Drift-Diffusion Charge-Collection Model For Reverse-Biased Junctions Embedded in Circuits

Preparation and characterization of CrNxOy thin films: The effect of composition and structural features on the electrical behavior

Influence of band structure on electron ballistic transport in silicon nanowire MOSFET’s: An atomistic study

The influence of additive manufacturing parameters on the structural and mechanical properties of acrylonitrile butadiene styrene (ABS) parts produced by fused filament fabrication

Suchergebnisse filtern