UB Paderborn / Katalog / Suche / in CDI

1 – 10 von 10

Sortiert nach

Tests and characterization of a laterally graded multilayer Montel mirror

Journal of synchrotron radiation, 2014-01, Vol.21 (1), p.16-23

2014

Link zum Volltext

Verfügbarkeit prüfen

Hybrid diamond-silicon angular-dispersive x-ray monochromator with 0.25-meV energy bandwidth and high spectral efficiency

Optics express, 2013-12, Vol.21 (25), p.30932-30946

2013

Link zum Volltext

Verfügbarkeit prüfen

Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space

Thin solid films, 2008-09, Vol.516 (22), p.8022-8028

2008

Link zum Volltext

Verfügbarkeit prüfen

Precision mechanical design of an ultrahigh-resolution inelastic x-ray scattering spectrometer system with CDFDW optics at the APS

Journal of physics. Conference series, 2013-01, Vol.425 (5), p.52031-4

2013

Link zum Volltext

Verfügbarkeit prüfen

The Canadian Macromolecular Crystallography Facility: upgrades and performance improvements

Acta crystallographica. Section A, Foundations and advances, 2023-08, Vol.79 (a2), p.C205-C205

2023

Link zum Volltext

Verfügbarkeit prüfen

Imaging of nanoislands in coherent grazing-incidence small-angle x-ray scattering experiments

Physical review. B, Condensed matter and materials physics, 2008-09, Vol.78 (12), Article 121304

2008

Link zum Volltext

Verfügbarkeit prüfen

Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands

Physical review. B, Condensed matter and materials physics, 2008-06, Vol.77 (24), Article 245425

2008

Link zum Volltext

Verfügbarkeit prüfen

X-ray scattering on nanostructures: from ensemble average to single object properties

Acta crystallographica. Section A, Foundations of crystallography, 2008-08, Vol.64 (a1), p.C9-C9

2008

Link zum Volltext

Verfügbarkeit prüfen

X-ray investigation of thick epitaxial GaAs/InGaAs layers on Ge pseudosubstrates

Proceedings of the IEEE Symposium on Emerging Technologies, 2005, 2005, p.323-328

2005

Link zum Volltext
IEEE_Xplore

Crystal truncation planes revealed by three-dimensional reconstruction of reciprocal space

Physical review. B, Condensed matter and materials physics, 2008-03, Vol.77 (11), Article 115317

2008

Link zum Volltext

Verfügbarkeit prüfen

1 – 10 von 10

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(7)
Mit Volltextzugriff
(10)

Publikationsform

Artikel
(9)
Tagungsberichte
(1)

Sprache

Englisch
(10)
Japanisch
(2)

Erscheinungsjahr

n.n

Neu hinzugefügt

... seit 90 Tagen
(1)

Menü

Weitere Dienste

Einstellungen

Tests and characterization of a laterally graded multilayer Montel mirror

Hybrid diamond-silicon angular-dispersive x-ray monochromator with 0.25-meV energy bandwidth and high spectral efficiency

Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space

Precision mechanical design of an ultrahigh-resolution inelastic x-ray scattering spectrometer system with CDFDW optics at the APS

The Canadian Macromolecular Crystallography Facility: upgrades and performance improvements

Imaging of nanoislands in coherent grazing-incidence small-angle x-ray scattering experiments

Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands

X-ray scattering on nanostructures: from ensemble average to single object properties

X-ray investigation of thick epitaxial GaAs/InGaAs layers on Ge pseudosubstrates

Crystal truncation planes revealed by three-dimensional reconstruction of reciprocal space

Suchergebnisse filtern