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Electron beam induced current microscopy of silicon p–n junctions in a scanning transmission electron microscope

Journal of applied physics, 2021-04, Vol.129 (13)

2021

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Development of Chopped Scan Control for Beam Blanking

Microscopy and microanalysis, 2024-07, Vol.30 (Supplement_1)

2024

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New Developments and Applications of Electron Beam Absorbed Current in SEM

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.532-533

Moldovan, Grigore

2019

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A Robust 3D Scanning Technique for SEM

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.356-357

Moldovan, Grigore

2017

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Quantitative Image Format for Electron Microscopy

Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.1176-1178

2020

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Characterization of a direct detection device imaging camera for transmission electron microscopy

Ultramicroscopy, 2010-06, Vol.110 (7), p.741-744

2010

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InFluence: An Open-Source Python Package to Model Images Captured with Direct Electron Detectors

Microscopy and microanalysis, 2023-07, Vol.29 (4), p.1380-1401

2023

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Characterization of Electrode-based BackScatter Electron Detector for In Situ SEM

Microscopy and microanalysis, 2023-07, Vol.29 (Supplement_1), p.2083-2084

2023

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In-Situ EBIC STEM: Automated Quantification

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.1718-1719

2022

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Fast Solid-state Segmented Detectors: Improvements and Implications for DPC-STEM

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2486-2487

2022

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Reduce Charging Effects on Beam Sensitive Material by Optimized Scanning Routines in SEM

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.474-475

2019

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Direct detection of electron backscatter diffraction patterns

Physical review letters, 2013-08, Vol.111 (6), p.065506-065506, Article 065506

2013

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Live Quantitative BSE Acquisition with Standard-less Calibration

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.654-655

2018

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Thermally propagated Al contacts on SiGe nanowires characterized by electron beam induced current in a scanning transmission electron microscope

Nanotechnology, 2022-01, Vol.33 (3), p.35712

2022

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New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.650-651

2018

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High-Temperature BSE and EBAC Electronics for ESEM

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.694-695

2018

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Cryogenic FIB Lift-out as a Preparation Method for Damage-Free Soft Matter TEM Imaging

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1224-1225

2014

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The ESEM as In Situ Platform for the Study of Gas-Solid Interactions

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.344-345

2018

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Direct electron detection for TEM with column parallel CCD

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2009-06, Vol.604 (1), p.108-110

2009

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Imaging modes for direct electron detection in TEM with column parallel CCD

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2009-08, Vol.607 (1), p.13-16

2009

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Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor

Microscopy, 2014-04, Vol.63 (2), p.119-130

2014

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Thin silicon strip devices for direct electron detection in transmission electron microscopy

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2008-06, Vol.591 (1), p.134-137

2008

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Toward electron exit wave tomography of amorphous materials at atomic resolution

Journal of alloys and compounds, 2012-09, Vol.536, p.S94-S98

2012

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A method of accurately determining the positions of the edges of depletion regions in semiconductor junctions

Journal of applied physics, 2006-12, Vol.100 (11)

2006

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Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices

Ultramicroscopy, 2007-04, Vol.107 (4), p.382-389

2007

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Electron beam induced current microscopy of silicon p–n junctions in a scanning transmission electron microscope

Development of Chopped Scan Control for Beam Blanking

New Developments and Applications of Electron Beam Absorbed Current in SEM

A Robust 3D Scanning Technique for SEM

Quantitative Image Format for Electron Microscopy

Characterization of a direct detection device imaging camera for transmission electron microscopy

InFluence: An Open-Source Python Package to Model Images Captured with Direct Electron Detectors

Characterization of Electrode-based BackScatter Electron Detector for In Situ SEM

In-Situ EBIC STEM: Automated Quantification

Fast Solid-state Segmented Detectors: Improvements and Implications for DPC-STEM

Reduce Charging Effects on Beam Sensitive Material by Optimized Scanning Routines in SEM

Direct detection of electron backscatter diffraction patterns

Live Quantitative BSE Acquisition with Standard-less Calibration

Thermally propagated Al contacts on SiGe nanowires characterized by electron beam induced current in a scanning transmission electron microscope

New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors

High-Temperature BSE and EBAC Electronics for ESEM

Cryogenic FIB Lift-out as a Preparation Method for Damage-Free Soft Matter TEM Imaging

The ESEM as In Situ Platform for the Study of Gas-Solid Interactions

Direct electron detection for TEM with column parallel CCD

Imaging modes for direct electron detection in TEM with column parallel CCD

Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor

Thin silicon strip devices for direct electron detection in transmission electron microscopy

Toward electron exit wave tomography of amorphous materials at atomic resolution

A method of accurately determining the positions of the edges of depletion regions in semiconductor junctions

Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices

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