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Structural entropy in detecting background patterns of AFM images

Vacuum, 2009-08, Vol.84 (1), p.179-183

2009

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Investigation of the surface morphology on epitaxially grown fullerene structures

Vacuum, 2009-08, Vol.84 (1), p.152-154

2009

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Stimulated changes in Bi(Sb)/AS2S3 nanolayered structures

The Journal of physics and chemistry of solids, 2007-05, Vol.68 (5-6), p.943-947

2007

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Fractal character of in situ heat treated metal-compound semiconductor contacts

Journal of materials science. Materials in electronics, 2006-04, Vol.17 (4), p.321-324

2006

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Conductivity modification of silver salt-filled polyimide film by pulsed KrF laser

Journal of electronic materials, 2002-04, Vol.31 (4), p.239-243

2002

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Fractal behaviour of the surface of in situ heat treated metal–InP contacts

Thin solid films, 1998-04, Vol.317 (1), p.69-71

1998

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A novel evaluation method to determine the fractal dimension of SEM images: a study of Au/Pd/GaAs contacts during heat treatment

Physica status solidi. C, 2003-02 (3), p.1051-1054

2003

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E. MLITZKE

June 16, 2021, Vol.47, Number 2, p.847-850

2021

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Au - Be/Ru/Au multilayer metallization as a stable ohmic contact scheme to p-type InP

Semiconductor science and technology, 1996-07, Vol.11 (7), p.1121-1126

1996

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Electrical and microstructure analysis of Ni/Ge/n-GaAs interface

Thin solid films, 1998-06, Vol.323 (1), p.212-216

1998

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The electrical properties of Al/Ni/Ge/n-GaAs interfaces

Microelectronics and reliability, 1998-05, Vol.38 (5), p.787-793

1998

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Cross-sectional transmission electron microscopic study of Au/GaP and Au/InP contacts

Journal of applied physics, 1991-07, Vol.70 (1), p.332-336

1991

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Electrical and structural characterisation of Ni\Ge\ n-GaAs interface

Vacuum, 1998-07, Vol.50 (3-4), p.395-398

1998

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Noise investigation of ultraviolet laser induced grain structure in polyimide films

Journal of electronic materials, 1996-03, Vol.25 (3), p.549-551

1996

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Stimulated changes in Bi(Sb)/As 2S 3 nanolayered structures

The Journal of physics and chemistry of solids, 2007, Vol.68 (5), p.943-947

2007

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Thermal dissociation of InP covered with metallic contact layers

Thin solid films, 1986-11, Vol.144 (1), p.29-40

1986

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Fractal character of in situ heat treated metal-compound semiconductor contacts: Optoelectronic and Electronic Materials and Devices

Journal of materials science. Materials in electronics, 2006, Vol.17 (4), p.321-324

2006

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Formation of AuGe contacts to n-GaAs

Physica status solidi. A, Applied research, 1978-06, Vol.47 (2), p.K183-K185

Mojzes, I.

1978

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Influence of finite metal overlayer resistance on the evaluation of contact resistivity

IEEE transactions on electron devices, 1986-09, Vol.33 (9), p.1401-1403

1986

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Comparative reliability study of n+− n and n+− n− n+ Gunn diodes

Microelectronics and reliability, 1989, Vol.29 (2), p.131-132

1989

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Mass spectrometric study of contact sintering in the GaSb⧸Au system

Thin solid films, 1986-04, Vol.138 (1), p.L55-L57

1986

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Structural characterization of excimer laser treated polyimide foil

Physica status solidi. A, Applied research, 1995-08, Vol.150 (2), p.K11-K13

1995

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The interaction of gold thin films with InP

Vacuum, 1990, Vol.40 (1), p.189-191

1990

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Interaction of thin gold films with GaP during heat treatment in a vacuum

Semiconductor science and technology, 1987-07, Vol.2 (7), p.428-436

1987

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An advanced MESFET burn-in method and equipment

Microelectronics and reliability, 1992, Vol.32 (11), p.1585-1588

1992

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Structural entropy in detecting background patterns of AFM images

Investigation of the surface morphology on epitaxially grown fullerene structures

Stimulated changes in Bi(Sb)/AS2S3 nanolayered structures

Fractal character of in situ heat treated metal-compound semiconductor contacts

Conductivity modification of silver salt-filled polyimide film by pulsed KrF laser

Fractal behaviour of the surface of in situ heat treated metal–InP contacts

A novel evaluation method to determine the fractal dimension of SEM images: a study of Au/Pd/GaAs contacts during heat treatment

E. MLITZKE

Au - Be/Ru/Au multilayer metallization as a stable ohmic contact scheme to p-type InP

Electrical and microstructure analysis of Ni/Ge/n-GaAs interface

The electrical properties of Al/Ni/Ge/n-GaAs interfaces

Cross-sectional transmission electron microscopic study of Au/GaP and Au/InP contacts

Electrical and structural characterisation of Ni\Ge\ n-GaAs interface

Noise investigation of ultraviolet laser induced grain structure in polyimide films

Stimulated changes in Bi(Sb)/As 2S 3 nanolayered structures

Thermal dissociation of InP covered with metallic contact layers

Fractal character of in situ heat treated metal-compound semiconductor contacts: Optoelectronic and Electronic Materials and Devices

Formation of AuGe contacts to n-GaAs

Influence of finite metal overlayer resistance on the evaluation of contact resistivity

Comparative reliability study of n+− n and n+− n− n+ Gunn diodes

Mass spectrometric study of contact sintering in the GaSb⧸Au system

Structural characterization of excimer laser treated polyimide foil

The interaction of gold thin films with InP

Interaction of thin gold films with GaP during heat treatment in a vacuum

An advanced MESFET burn-in method and equipment

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