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Concepts for chemical state analysis at constant probing depth by lab‐based XPS/HAXPES combining soft and hard X‐ray sources

Surface and interface analysis, 2020-12, Vol.52 (12), p.802-810

2020

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Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Analytical chemistry (Washington), 2012-09, Vol.84 (18), p.7865-7873

2012

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Characterization of cathode-electrolyte interface in all-solid-state batteries using TOF-SIMS, XPS, and UPS/LEIPS

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2021-07, Vol.39 (4)

2021

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Accurate measurement of dopant concentration in organic light-emitting diodes by combining high-performance liquid chromatography and TOF-SIMS

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2014-05, Vol.32 (3)

2014

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Palmitic acid, verified by lipid profiling using secondary ion mass spectrometry, demonstrates anti-multiple myeloma activity

Leukemia research, 2015-06, Vol.39 (6), p.638-645

2015

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Bismuth adducted intact molecular ions [M + Bi]+ under low-energy bismuth cluster ion beams

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2020-05, Vol.38 (3)

2020

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A new approach for determining accurate chemical distributions using in-situ GCIB cross-section imaging

Surface and interface analysis, 2014-11, Vol.46 (S1), p.83-86

2014

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Practical Application of Argon Gas Cluster Ion Beam in X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry

Journal of the Japan Society for Precision Engineering, 2016/04/05, Vol.82(4), pp.320-324

MIYAYAMA, Takuya

2016

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Argon Gas Cluster Ion Beam for Practical Surface Analysis

Journal of the Vacuum Society of Japan, 2016, Vol.59(5), pp.134-137

MIYAYAMA, Takuya

2016

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Hard and soft X‐ray photoelectron spectroscopy for selective probing of surface and bulk chemical compositions in a perovskite‐type Ni catalyst

Surface and interface analysis, 2020-12, Vol.52 (12), p.811-817

2020

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The electronic band structure analysis of OLED device by means of in situ LEIPS and UPS combined with GCIB

Surface and interface analysis, 2020-12, Vol.52 (12), p.948-952

2020

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The effect of angle of incidence to low damage sputtering of organic polymers using a C60 ion beam

Applied surface science, 2008-12, Vol.255 (4), p.951-953

2008

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Sample processing by Bi‐FIB for in situ TOF‐SIMS imaging of buried interfaces

Surface and interface analysis, 2023-03, Vol.55 (3), p.209-214

2023

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Low-energy bismuth primary ion beams for molecular ion detection in TOF-SIMS

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2018-05, Vol.36 (3)

2018

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Wider vision capability provided by a curved surface sample holder for TOF-SIMS imaging

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2020-05, Vol.38 (3)

2020

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Accurate and reproducible in-depth observation of organic–inorganic hybrid materials using FIB-TOF-SIMS

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2018-05, Vol.36 (3)

2018

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Practical Applications of Argon Gas Cluster Ion Beam for X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry

Journal of the Vacuum Society of Japan, 2013, Vol.56(9), pp.348-354

MIYAYAMA, Takuya

2013

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Time‐of‐flight secondary ion tandem mass spectrometry depth profiling of organic light‐emitting diode devices for elucidating the degradation process

Rapid communications in mass spectrometry, 2020-04, Vol.34 (7), p.e8640-n/a

2020

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Plasma-tolerant structure for organic light-emitting diodes with aluminum cathodes fabricated by DC magnetron sputtering: Using a Li-doped electron transport layer

Organic electronics, 2013-11, Vol.14 (11), p.2994-2999

2013

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Removal of Ar+ beam-induced damaged layers from polyimide surfaces with argon gas cluster ion beams

Surface and interface analysis, 2010-09, Vol.42 (9), p.1453-1457

2010

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Origin of external quantum efficiency degradation in organic light-emitting diodes with a DC magnetron sputtered cathode

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2014-11, Vol.32 (6)

2014

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Secondary ion yields for vacuum-type electrospray droplet beams measured with a triple focus time-of-flight analyzer

Rapid communications in mass spectrometry, 2016-10, Vol.30 (20), p.2279-2284

2016

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Secondary ion yields for vacuum-type electrospray droplet beams measured with a triple focus time-of-flight analyzer: Secondary ion yields by electrospray droplet beams

Rapid communications in mass spectrometry, 2016-10, Vol.30 (20), p.2279-2284

2016

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X‑ray Photoelectron Spectroscopy Equipped with Gas Cluster Ion Beams for Evaluation of the Sputtering Behavior of Various Nanomaterials

ACS applied nano materials, 2022-03, Vol.5 (3), p.4260-4268

2022

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Incident Angle Dependence in Polymer TOF-SIMS Depth Profiling with C60 Ion Beams

e-Journal of Surface Science and Nanotechnology, 2009/11/26, Vol.7, pp.878-881

2009

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Concepts for chemical state analysis at constant probing depth by lab‐based XPS/HAXPES combining soft and hard X‐ray sources

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Characterization of cathode-electrolyte interface in all-solid-state batteries using TOF-SIMS, XPS, and UPS/LEIPS

Accurate measurement of dopant concentration in organic light-emitting diodes by combining high-performance liquid chromatography and TOF-SIMS

Palmitic acid, verified by lipid profiling using secondary ion mass spectrometry, demonstrates anti-multiple myeloma activity

Bismuth adducted intact molecular ions [M + Bi]+ under low-energy bismuth cluster ion beams

A new approach for determining accurate chemical distributions using in-situ GCIB cross-section imaging

Practical Application of Argon Gas Cluster Ion Beam in X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry

Argon Gas Cluster Ion Beam for Practical Surface Analysis

Hard and soft X‐ray photoelectron spectroscopy for selective probing of surface and bulk chemical compositions in a perovskite‐type Ni catalyst

The electronic band structure analysis of OLED device by means of in situ LEIPS and UPS combined with GCIB

The effect of angle of incidence to low damage sputtering of organic polymers using a C60 ion beam

Sample processing by Bi‐FIB for in situ TOF‐SIMS imaging of buried interfaces

Low-energy bismuth primary ion beams for molecular ion detection in TOF-SIMS

Wider vision capability provided by a curved surface sample holder for TOF-SIMS imaging

Accurate and reproducible in-depth observation of organic–inorganic hybrid materials using FIB-TOF-SIMS

Practical Applications of Argon Gas Cluster Ion Beam for X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry

Time‐of‐flight secondary ion tandem mass spectrometry depth profiling of organic light‐emitting diode devices for elucidating the degradation process

Plasma-tolerant structure for organic light-emitting diodes with aluminum cathodes fabricated by DC magnetron sputtering: Using a Li-doped electron transport layer

Removal of Ar+ beam-induced damaged layers from polyimide surfaces with argon gas cluster ion beams

Origin of external quantum efficiency degradation in organic light-emitting diodes with a DC magnetron sputtered cathode

Secondary ion yields for vacuum-type electrospray droplet beams measured with a triple focus time-of-flight analyzer

Secondary ion yields for vacuum-type electrospray droplet beams measured with a triple focus time-of-flight analyzer: Secondary ion yields by electrospray droplet beams

X‑ray Photoelectron Spectroscopy Equipped with Gas Cluster Ion Beams for Evaluation of the Sputtering Behavior of Various Nanomaterials

Incident Angle Dependence in Polymer TOF-SIMS Depth Profiling with C60 Ion Beams

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