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Thickness Influence in Breakdown Phenomena of Thin Dielectric Films

1964, 2021, Vol.4, Number 2, p.311-324

2021

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On testing quality and traceability of virgin olive oil by calorimetry

Journal of Thermal Analysis and Calorimetry, 2006-04, Vol.84 (1), p.105-112

2006

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Conduction Phenomena in Si-SiO2-Al Structures

1964, 2021, Vol.5, Number 2, p.407-420

2021

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Conduction Phenomena in Si-SiO2-Al Structures

1964, 2021, Vol.5, Number 2, p.407-420

2021

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Sensitivity and selectivity of a thin-film tin oxide gas sensor

Sensors and actuators. B, Chemical, 1991-03, Vol.3 (3), p.197-204

1991

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Theory of the Influence of Surface States on the Impedance of a Semiconductor-Insulator Interface

October 1, 2021, Vol.17, Number 2, p.657-672

2021

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Ultrahigh lateral resolution spectromicroscopy beam line at ELETTRA (trieste)

Surface and interface analysis, 1992-09, Vol.18 (9), p.655-660

1992

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Magnetization reversal of a pair of interacting linear dipole distributions

IEEE transactions on magnetics, 1970-09, Vol.6 (3), p.649-652

Minnaja, N.

1970

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Solution of the Schroedinger equation in a constant magnetic field and diamagnetism

Physica, 1960-01, Vol.26 (10), p.827-833

Minnaja, N.

1960

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Thickness Influence in Breakdown Phenomena of Thin Dielectric Films

physica status solidi (b), 1964, Vol.4 (2), p.311-324

1964

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Domain Pattern According to Micromagnetics

Journal of applied physics, 1969-01, Vol.40 (3), p.1092-1094

1969

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The coercive force of a ferrimagnetic garnet near its compensation temperature

IEEE transactions on magnetics, 1966-12, Vol.2 (4), p.770-770

1966

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Photovoltaic Effect in Photoconductor-Dielectric-Metal Sandwiches

physica status solidi (b), 1965, Vol.8 (1), p.177-186

1965

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Conduction Phenomena in Si-SiO2-Al Structures

physica status solidi (b), 1964, Vol.5 (2), p.407-419

1964

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Oxygen Vacancies Involved in Rectification Effects of Si-SiO2-Al Structures

physica status solidi (b), 1965, Vol.8 (1), p.K9-K9

1965

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New technique of lorentz microscopy for domain wall observation

IEEE transactions on magnetics, 1971-09, Vol.7 (3), p.456-456

1971

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Remarks on the application of micromagnetics to a boundless plate

IEEE transactions on magnetics, 1968-12, Vol.4 (4), p.720-721

1968

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Rectification by means of metal-dielectric-metal sandwiches

Nuovo cimento, 1964-03, Vol.31 (6), p.1246-1257

1964

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Pressure effect on the microwave absorption of oxygen

Nuovo cimento, 1963-11, Vol.30 (4), p.997-1004

1963

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Contribution to the study of metal contacts on semiconductor real surfaces

Electronics letters, 1967, Vol.3 (5), p.196

1967

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Wave optical theory of in-focus Lorentz microscopy

Thin solid films, 1972-01, Vol.12 (1), p.45-50

1972

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A continuum thermodynamic limit for the master equation

Nuovo cimento della Società italiana di fisica. Sezione B, 1973-07, Vol.16 (1), p.203-220

1973

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Note on the impedance of semiconductor surfaces in MOS structures

Proceedings of the IEEE, 1965-01, Vol.53 (10), p.1664-1665

1965

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Theory of the Influence of Surface States on the Impedance of a Semiconductor-Insulator Interface

physica status solidi (b), 1966, Vol.17 (2), p.657-672

1966

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Equivalent circuit of a metal-insulator-semiconductor structure

Solid-state electronics, 1967, Vol.10 (1), p.9-20

1967

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Thickness Influence in Breakdown Phenomena of Thin Dielectric Films

On testing quality and traceability of virgin olive oil by calorimetry

Conduction Phenomena in Si-SiO2-Al Structures

Conduction Phenomena in Si-SiO2-Al Structures

Sensitivity and selectivity of a thin-film tin oxide gas sensor

Theory of the Influence of Surface States on the Impedance of a Semiconductor-Insulator Interface

Ultrahigh lateral resolution spectromicroscopy beam line at ELETTRA (trieste)

Magnetization reversal of a pair of interacting linear dipole distributions

Solution of the Schroedinger equation in a constant magnetic field and diamagnetism

Thickness Influence in Breakdown Phenomena of Thin Dielectric Films

Domain Pattern According to Micromagnetics

The coercive force of a ferrimagnetic garnet near its compensation temperature

Photovoltaic Effect in Photoconductor-Dielectric-Metal Sandwiches

Conduction Phenomena in Si-SiO2-Al Structures

Oxygen Vacancies Involved in Rectification Effects of Si-SiO2-Al Structures

New technique of lorentz microscopy for domain wall observation

Remarks on the application of micromagnetics to a boundless plate

Rectification by means of metal-dielectric-metal sandwiches

Pressure effect on the microwave absorption of oxygen

Contribution to the study of metal contacts on semiconductor real surfaces

Wave optical theory of in-focus Lorentz microscopy

A continuum thermodynamic limit for the master equation

Note on the impedance of semiconductor surfaces in MOS structures

Theory of the Influence of Surface States on the Impedance of a Semiconductor-Insulator Interface

Equivalent circuit of a metal-insulator-semiconductor structure

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