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Continuous tuning of the mechanical sensitivity of Pentacene OTFTs on flexible substrates: From strain sensors to deformable transistors

Organic electronics, 2013-01, Vol.14 (1), p.206-211

2013

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Strain Sensitivity and Transport Properties in Organic Field-Effect Transistors

IEEE electron device letters, 2012-01, Vol.33 (1), p.113-115

2012

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Depth-resolved molecular structure and orientation of polymer thin films by synchrotron X-ray diffraction

European polymer journal, 2011-03, Vol.47 (3), p.273-283

2011

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Structure and morphology optimization of poly(3-hexylthiophene) thin films onto silanized silicon oxide

European polymer journal, 2012-06, Vol.48 (6), p.1050-1061

2012

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Structural investigation of thin tetracene films on flexible substrate by synchrotron X-ray diffraction

Applied surface science, 2006-09, Vol.252 (22), p.8022-8027

2006

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Boron doping of silicon rich carbides: Electrical properties

Materials science & engineering. B, Solid-state materials for advanced technology, 2013-05, Vol.178 (9), p.551-558

2013

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Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment

Journal of applied crystallography, 2008-02, Vol.41 (1), p.143-152

2008

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Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon

Thin solid films, 2011-02, Vol.519 (9), p.3002-3005

2011

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Photocurrent spectroscopy of ion-implanted organic thin film transistors

Synthetic metals, 2012-01, Vol.161 (23-24), p.2585-2588

2012

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Synchrotron X-ray investigation of tetracene thin films grown at different deposition fluxes

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2006-05, Vol.246 (1), p.101-105

2006

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Structural analysis and depth profiling of nanometric SiO2/SRO multilayers

Surface and interface analysis, 2013-01, Vol.45 (1), p.373-375

2013

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Structural analyses of thermal annealed SRO/SiO2 superlattices

Surface and interface analysis, 2010-06, Vol.42 (6-7), p.842-845

2010

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Real time investigation of the growth of silicon carbide nanocrystals on Si(1 0 0) using synchrotron X-ray diffraction

Applied surface science, 2008-01, Vol.254 (7), p.2162-2167

2008

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Highly Ordered Organic Ferroelectric DIPAB-Patterned Thin Films

Langmuir, 2017-11, Vol.33 (45), p.12859-12864

2017

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3D DuMond diagrams of multi-crystal Bragg-case synchrotron topography. I. Flat sample

Applied physics. A, Materials science & processing, 2001-07, Vol.73 (1), p.75-82

2001

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Laser induced crystallization of hydrogenated amorphous silicon-carbon alloys

Journal of applied physics, 2004-10, Vol.96 (7), p.3998-4005

2004

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Influence of the electrolyte viscosity on the structural features of porous silicon

Solid state communications, 2001-04, Vol.118 (2), p.85-90

2001

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Effects of boron-interstitial silicon clusters on interstitial supersaturation during postimplantation annealing

Applied physics letters, 2001-08, Vol.79 (8), p.1103-1105

2001

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High spatial resolution X-ray microdiffraction applied to biomaterial studies and archeometry

Spectrochimica acta. Part B: Atomic spectroscopy, 2004-10, Vol.59 (10), p.1557-1564

2004

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Structural tuning of quinoxaline-benzodithiophene copolymers via alkyl side chain manipulation: synthesis, characterization and photovoltaic properties

Journal of materials chemistry. A, Materials for energy and sustainability, 2014-01, Vol.2 (29), p.11162-11170

2014

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Diffraction and nanoscale molecular electronics

Acta crystallographica. Section A, Foundations of crystallography, 2011-08, Vol.67 (a1), p.C55-C55

Milita, S.

2011

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X-ray Rocking-Curve Analysis of Crystals with Buried Amorphous Layers. Case of Ion-Implanted Silicon

Journal of applied crystallography, 1995-12, Vol.28 (6), p.666-672

1995

Volltextzugriff (PDF)

3D DuMond diagrams of multi-crystal Bragg-case synchrotron topography. II. Curved sample

Applied physics. A, Materials science & processing, 2001-07, Vol.73 (1), p.83-90

2001

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X-ray diffraction imaging investigation of silicon carbide on insulator structures

Applied physics. A, Materials science & processing, 2002-11, Vol.75 (5), p.621-627

2002

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Nature and occurrence of defects in 6H-SiC Lely crystals

Journal of crystal growth, 2001-05, Vol.225 (1), p.23-33

2001

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Continuous tuning of the mechanical sensitivity of Pentacene OTFTs on flexible substrates: From strain sensors to deformable transistors

Strain Sensitivity and Transport Properties in Organic Field-Effect Transistors

Depth-resolved molecular structure and orientation of polymer thin films by synchrotron X-ray diffraction

Structure and morphology optimization of poly(3-hexylthiophene) thin films onto silanized silicon oxide

Structural investigation of thin tetracene films on flexible substrate by synchrotron X-ray diffraction

Boron doping of silicon rich carbides: Electrical properties

Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment

Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon

Photocurrent spectroscopy of ion-implanted organic thin film transistors

Synchrotron X-ray investigation of tetracene thin films grown at different deposition fluxes

Structural analysis and depth profiling of nanometric SiO2/SRO multilayers

Structural analyses of thermal annealed SRO/SiO2 superlattices

Real time investigation of the growth of silicon carbide nanocrystals on Si(1 0 0) using synchrotron X-ray diffraction

Highly Ordered Organic Ferroelectric DIPAB-Patterned Thin Films

3D DuMond diagrams of multi-crystal Bragg-case synchrotron topography. I. Flat sample

Laser induced crystallization of hydrogenated amorphous silicon-carbon alloys

Influence of the electrolyte viscosity on the structural features of porous silicon

Effects of boron-interstitial silicon clusters on interstitial supersaturation during postimplantation annealing

High spatial resolution X-ray microdiffraction applied to biomaterial studies and archeometry

Structural tuning of quinoxaline-benzodithiophene copolymers via alkyl side chain manipulation: synthesis, characterization and photovoltaic properties

Diffraction and nanoscale molecular electronics

X-ray Rocking-Curve Analysis of Crystals with Buried Amorphous Layers. Case of Ion-Implanted Silicon

3D DuMond diagrams of multi-crystal Bragg-case synchrotron topography. II. Curved sample

X-ray diffraction imaging investigation of silicon carbide on insulator structures

Nature and occurrence of defects in 6H-SiC Lely crystals

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