UB Paderborn / Katalog / Suche / in CDI

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1999, Vol.427 (1), p.121-125

1999

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The role of the ion-solid interaction in ion-beam-induced deposition of gold

Journal of applied physics, 1991-07, Vol.70 (2), p.665-673

1991

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Focused ion beam lithography

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1993, Vol.80, p.1271-1280

Melngailis, John

1993

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Dynamics of ferroelastic domains in ferroelectric thin films

Realizing intrinsic piezoresponse in epitaxial submicron lead zirconate titanate capacitors on Si

Scaling of ferroelectric properties in thin films

Electrodes for carbon nanotube devices by focused electron beam induced deposition of gold

Ion beams in silicon processing and characterization

Radiation damage and its recovery in focused ion beam fabricated ferroelectric capacitors

Scaling of ferroelectric and piezoelectric properties in Pt/SrBi2Ta2O9/Pt thin films

Reduced Self-Heating in AlGaN/GaN HEMTs Using Nanocrystalline Diamond Heat-Spreading Films

Imaging of microwave permittivity, tunability, and damage recovery in (Ba, Sr)TiO3 thin films

Understanding Surface Modification of Silicon-based Materials using Gas Field Ion Source FIB for Nano-Machining Applications

Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope

Direct patterning of gold oxide thin films by focused ion-beam irradiation

Effect of 90° domain movement on the piezoelectric response of patterned PbZr0.2Ti0.8O3∕SrTiO3∕Si heterostructures

Rapid imaging of nanotubes on insulating substrates

Reduced self-heating in ALGaN/GaN HEMTs using nanocrystalline diamond heat spreading films

Focused-ion-beam writing of electrical connections into platinum oxide films

Use of focused-ion-beam and modeling to optimize submicron MOSFET characteristics

Near-field microwave microscopy on nanometer length scales

Fabrication of high-temperature superconducting Josephson junctions on substrates patterned by focused ion beam

Accurate location and marking of grain boundaries using focused ion and electron beams

Dose-rate effects in GaAs investigated by discrete pulsed implantation using a focused ion beam

Fast room-temperature growth of SiO2 films by molecular-layer dosing

Coulomb interactions in a focused ion beam column and design guidelines for an experimental system: comparison of results from MONTEC and BOERSCH

The role of the ion-solid interaction in ion-beam-induced deposition of gold

Focused ion beam lithography

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