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IEEE transactions on power electronics, 2013-08, Vol.28 (8), p.4113-4119
2013
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IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3713-3718
2017
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Journal of electronic materials, 2015-11, Vol.44 (11), p.4167-4174
2015
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IEEE transactions on power electronics, 2012-01, Vol.27 (1), p.258-268
2012
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IEEE transactions on electron devices, 2021-03, Vol.68 (3), p.1162-1167
2021
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Journal of applied physics, 2020-01, Vol.127 (2)
2020
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Journal of applied physics, 2013-12, Vol.114 (22)
2013
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IEEE transactions on electron devices, 2021-07, Vol.68 (7), p.3497-3504, Article 3497
2021
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IEEE transactions on electron devices, 2022-04, Vol.69 (4), p.1924-1930
2022
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Microelectronics and reliability, 2012-03, Vol.52 (3), p.497-502
2012
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Semiconductor science and technology, 2021-05, Vol.36 (5), p.55006
2021
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Journal of applied physics, 2006-12, Vol.100 (11)
2006
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Microelectronic engineering, 2008-04, Vol.85 (4), p.704-709
2008
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IET circuits, devices & systems, 2006-10, Vol.153 (5), p.407-415
2006
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Journal of applied physics, 2007-07, Vol.102 (1)
2007
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Surface and interface analysis, 2008-08, Vol.40 (8), p.1164-1167
2008
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Applied surface science, 2001-04, Vol.174 (3), p.210-216
2001
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Materials science forum, 2015-06, Vol.821-823, p.624-627
2015
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Materials science forum, 2015-06, Vol.821-823, p.464-467
2015
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Journal of applied physics, 2012-12, Vol.112 (11)
2012
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Applied surface science, 2004-07, Vol.234 (1-4), p.434-438
2004
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Journal of applied physics, 2009-11, Vol.106 (9), p.093708-093708-7
2009
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Solid-state electronics, 2005-07, Vol.49 (7), p.1081-1085
2005
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IEEE transactions on electron devices, 2004-07, Vol.51 (7), p.1178-1184
2004
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Applied physics letters, 2009-03, Vol.94 (10)
2009
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