UB Paderborn / Katalog / Suche / in CDI

Observation of discrete electronic states in a zero-dimensional semiconductor nanostructure

Physical review letters, 1988-02, Vol.60 (6), p.535-537

1988

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Wavelet transform approach to the analysis of specular x-ray reflectivity curves

Journal of applied physics, 2001-10, Vol.90 (7), p.3338-3346

2001

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A high resolution triple axis X-ray diffraction analysis of radiation damage in lysozyme crystals

Journal of crystal growth, 2001-11, Vol.232 (1), p.502-510

2001

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Spin splitting of single 0D impurity states in semiconductor heterostructure Quantum Wells

Physical review letters, 1996-02, Vol.76 (8), p.1328-1331

1996

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High-resolution X-ray diffraction analyses of protein crystals

Philosophical transactions of the Royal Society of London. Series A: Mathematical, physical, and engineering sciences, 1999-10, Vol.357 (1761), p.2789-2799

1999

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High Resolution X-ray Scattering Methods For ULSI Materials Characterization

AIP Conference Proceedings, 2003, Vol.683, p.634-645

Matyi, Richard J

2003

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Triple-axis x-ray diffraction analyses of hen egg-white lysozyme crystals

Journal of physics. D, Applied physics, 2001-05, Vol.34 (10A), p.A64-A69

2001

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Development of a glass-bonded compliant substrate

Journal of crystal growth, 1998-12, Vol.195 (1), p.144-150

1998

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High resolution x-ray diffraction analyses of GaN/LiGaO2

Journal of physics. D, Applied physics, 1999-05, Vol.32, p.A61

1999

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Experimental test for elastic compliance during growth on glass-bonded compliant substrates

Applied physics letters, 2000-05, Vol.76 (18), p.2541-2543

2000

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Defect reduction by thermal annealing of GaAs layers grown by molecular beam epitaxy on Si substrates

Applied physics letters, 1987-01, Vol.50 (1), p.31-33

1987

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InGaAs heteroepitaxy on GaAs compliant substrates: X-ray diffraction evidence of enhanced relaxation and improved structural quality

Applied physics letters, 1999-09, Vol.75 (11), p.1559-1561

1999

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Particle Size, Particle Size Distribution, and Related Measurements of Supported Metal Catalysts

Catalysis reviews. Science and engineering, 1987-02, Vol.29 (1), p.41-99

1987

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Effect of interface roughness on performance of AlGaAs/InGaAs/GaAs resonant tunneling diodes

Journal of crystal growth, 1998-12, Vol.195 (1), p.617-623

1998

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Diffractometer Noise Characteristics: Experimental Determination and Application to Statistical Rocking-Curve Analysis

Journal of applied crystallography, 1998-04, Vol.31 (2), p.185-197

1998

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Triple crystal x-ray diffraction analysis of chemical-mechanical polished gallium arsenide

Journal of applied physics, 1992-12, Vol.72 (11), p.5158-5164

1992

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Alignment system for crossed parabolic x-ray mirrors

Review of scientific instruments, 2000-06, Vol.71 (6), p.2292-2295

2000

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Field ion specimen preparation from near-surface regions

Ultramicroscopy, 1998-06, Vol.73 (1), p.273-278

1998

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A Statistical Method for the Fitting of Double-Crystal X-ray Rocking Curves

Journal of applied crystallography, 1997-06, Vol.30 (3), p.368-382

1997

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Generation of misfit dislocations in GaAs grown on Si

Applied physics letters, 1989-07, Vol.55 (3), p.265-267

1989

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Fundamental issues in heteroepitaxy---A Department of Energy, Council on Materials Science Panel Report

Journal of materials research, 1990-04, Vol.5:4

1990

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Conversion of a double crystal diffractometer to a high resolution triple crystal diffractometer

Review of scientific instruments, 1992-12, Vol.63 (12), p.5591-5596

Matyi, R. J.

1992

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Boron doping of silicon by plasma source ion implantation

Surface & coatings technology, 1997-09, Vol.93 (2), p.247-253

1997

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Triple-axis X-ray diffraction analyses of lysozyme crystals

Acta crystallographica. Section D, Biological crystallography., 2000-07, Vol.56 (7), p.881-889

2000

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High resolution x-ray diffraction analysis of annealed low-temperature gallium arsenide

Applied physics letters, 1992-05, Vol.60 (21), p.2642-2644

1992

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Observation of discrete electronic states in a zero-dimensional semiconductor nanostructure

Wavelet transform approach to the analysis of specular x-ray reflectivity curves

A high resolution triple axis X-ray diffraction analysis of radiation damage in lysozyme crystals

Spin splitting of single 0D impurity states in semiconductor heterostructure Quantum Wells

High-resolution X-ray diffraction analyses of protein crystals

High Resolution X-ray Scattering Methods For ULSI Materials Characterization

Triple-axis x-ray diffraction analyses of hen egg-white lysozyme crystals

Development of a glass-bonded compliant substrate

High resolution x-ray diffraction analyses of GaN/LiGaO2

Experimental test for elastic compliance during growth on glass-bonded compliant substrates

Defect reduction by thermal annealing of GaAs layers grown by molecular beam epitaxy on Si substrates

InGaAs heteroepitaxy on GaAs compliant substrates: X-ray diffraction evidence of enhanced relaxation and improved structural quality

Particle Size, Particle Size Distribution, and Related Measurements of Supported Metal Catalysts

Effect of interface roughness on performance of AlGaAs/InGaAs/GaAs resonant tunneling diodes

Diffractometer Noise Characteristics: Experimental Determination and Application to Statistical Rocking-Curve Analysis

Triple crystal x-ray diffraction analysis of chemical-mechanical polished gallium arsenide

Alignment system for crossed parabolic x-ray mirrors

Field ion specimen preparation from near-surface regions

A Statistical Method for the Fitting of Double-Crystal X-ray Rocking Curves

Generation of misfit dislocations in GaAs grown on Si

Fundamental issues in heteroepitaxy---A Department of Energy, Council on Materials Science Panel Report

Conversion of a double crystal diffractometer to a high resolution triple crystal diffractometer

Boron doping of silicon by plasma source ion implantation

Triple-axis X-ray diffraction analyses of lysozyme crystals

High resolution x-ray diffraction analysis of annealed low-temperature gallium arsenide

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