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AlGaAsSb superlattice buffer layer for p-channel GaSb quantum well on GaAs substrate

Journal of crystal growth, 2011-05, Vol.323 (1), p.35-38

2011

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Modified statistical dynamical diffraction theory: analysis of model SiGe heterostructures

Journal of applied crystallography, 2013-08, Vol.46 (4), p.912-918

2013

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Implementation of statistical dynamic diffraction theory for defective semiconductor heterostructure modelling

Journal of applied crystallography, 2010-06, Vol.43 (3), p.550-559

2010

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Application of statistical dynamical diffraction theory to highly defective ion implanted SiGe heterostructures

Physica status solidi. A, Applications and materials science, 2011-11, Vol.208 (11), p.2533-2538

2011

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X-ray reflectometry analyses of chromium thin films

Thin solid films, 2006-12, Vol.515 (4), p.1286-1293

2006

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Observation of discrete electronic states in a zero-dimensional semiconductor nanostructure

Physical review letters, 1988-02, Vol.60 (6), p.535-537

1988

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Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment

Journal of applied crystallography, 2008-02, Vol.41 (1), p.143-152

2008

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Present State of the avogadro constant determination from silicon Crystals with natural isotopic compositions

IEEE transactions on instrumentation and measurement, 2005-04, Vol.54 (2), p.854-859

2005

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The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers — Preliminary results from the second round-robin

Thin solid films, 2008-09, Vol.516 (22), p.7962-7966

2008

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Effect of interface band structure on hot-electron attenuation lengths in Au thin films

Physical review. B, Condensed matter and materials physics, 2008-01, Vol.77 (3), Article 033416

2008

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High resolution X-ray diffraction analyses of ion-implanted GaN/AlN/Si heterostructures

Physica status solidi. A, Applications and materials science, 2007-08, Vol.204 (8), p.2598-2605

2007

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Application Of Statistical Dynamical X-ray Diffraction Theory To Defective Semiconductor Heterostructures

2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009, Vol.1173, p.385-389

2009

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Diffusion activation energy of cadmium in thin film CuInGaSe2

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2013, p.1836-1841

2013

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Vapor growth and characterization of Cr-doped ZnSe crystals

Journal of crystal growth, 1999-11, Vol.207 (1), p.35-42

1999

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Triple-axis x-ray diffraction analyses of hen egg-white lysozyme crystals

Journal of physics. D, Applied physics, 2001-05, Vol.34 (10A), p.A64-A69

2001

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Spin splitting of single 0D impurity states in semiconductor heterostructure Quantum Wells

Physical review letters, 1996-02, Vol.76 (8), p.1328-1331

1996

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Development of a glass-bonded compliant substrate

Journal of crystal growth, 1998-12, Vol.195 (1), p.144-150

1998

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High-resolution X-ray diffraction analyses of protein crystals

Philosophical transactions of the Royal Society of London. Series A: Mathematical, physical, and engineering sciences, 1999-10, Vol.357 (1761), p.2789-2799

1999

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High resolution x-ray diffraction analyses of GaN/LiGaO2

Journal of physics. D, Applied physics, 1999-05, Vol.32, p.A61

1999

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Ion implantation synthesized copper oxide-based resistive memory devices

Applied physics letters, 2011-11, Vol.99 (20), p.202102-202102-3

2011

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Application of statistical dynamical diffraction theory to highly defective ion implanted SiGe heterostructures : High-resolution X-ray Diffraction and Imaging

Physica status solidi. A, Applications and materials science, 2011, Vol.208 (11), p.2533-2538

2011

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Particle Size, Particle Size Distribution, and Related Measurements of Supported Metal Catalysts

Catalysis reviews. Science and engineering, 1987-02, Vol.29 (1), p.41-99

1987

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Realization of a three-terminal resonant tunneling device: the bipolar quantum resonant tunneling transistor

Applied physics letters, 1989-03, Vol.54 (11), p.1034-1036

1989

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Defect reduction by thermal annealing of GaAs layers grown by molecular beam epitaxy on Si substrates

Applied physics letters, 1987-01, Vol.50 (1), p.31-33

1987

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Wavelet transform approach to the analysis of specular x-ray reflectivity curves

Journal of applied physics, 2001-10, Vol.90 (7), p.3338-3346

2001

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AlGaAsSb superlattice buffer layer for p-channel GaSb quantum well on GaAs substrate

Modified statistical dynamical diffraction theory: analysis of model SiGe heterostructures

Implementation of statistical dynamic diffraction theory for defective semiconductor heterostructure modelling

Application of statistical dynamical diffraction theory to highly defective ion implanted SiGe heterostructures

X-ray reflectometry analyses of chromium thin films

Observation of discrete electronic states in a zero-dimensional semiconductor nanostructure

Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment

Present State of the avogadro constant determination from silicon Crystals with natural isotopic compositions

The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers — Preliminary results from the second round-robin

Effect of interface band structure on hot-electron attenuation lengths in Au thin films

High resolution X-ray diffraction analyses of ion-implanted GaN/AlN/Si heterostructures

Application Of Statistical Dynamical X-ray Diffraction Theory To Defective Semiconductor Heterostructures

Diffusion activation energy of cadmium in thin film CuInGaSe2

Vapor growth and characterization of Cr-doped ZnSe crystals

Triple-axis x-ray diffraction analyses of hen egg-white lysozyme crystals

Spin splitting of single 0D impurity states in semiconductor heterostructure Quantum Wells

Development of a glass-bonded compliant substrate

High-resolution X-ray diffraction analyses of protein crystals

High resolution x-ray diffraction analyses of GaN/LiGaO2

Ion implantation synthesized copper oxide-based resistive memory devices

Application of statistical dynamical diffraction theory to highly defective ion implanted SiGe heterostructures : High-resolution X-ray Diffraction and Imaging

Particle Size, Particle Size Distribution, and Related Measurements of Supported Metal Catalysts

Realization of a three-terminal resonant tunneling device: the bipolar quantum resonant tunneling transistor

Defect reduction by thermal annealing of GaAs layers grown by molecular beam epitaxy on Si substrates

Wavelet transform approach to the analysis of specular x-ray reflectivity curves

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