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The microstructure of Cu films deposited by the self-ion assisted technique

Journal of electronic materials, 2002-01, Vol.31 (1), p.40-44

2002

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Electromigration properties of multigrain aluminum thin film conductors as influenced by grain boundary structure

Journal of materials research, 2001-07, Vol.16 (7), p.2124-2129

2001

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EM activation energy in aluminum conductors tested by the drift velocity method

Scripta materialia, 2000-02, Vol.42 (6), p.621-626

2000

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Anomalous Proximity Effect in the Nb-BiSb-Nb Junctions

Physical review letters, 1996-09, Vol.77 (14), p.3029-3032

1996

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Behavior of domain structure in a Co/Ag superlattice with dispersion of magnetic anisotropy

JETP letters, 2000-05, Vol.71 (10), p.430-433

2000

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Texture and microtexture of copper films prepared by the self-ion assisted deposition technique on barrier layers with different structure

MRS proceedings, 2002, Vol.721, Article J3.5

2002

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A new approach to fabrication of nanostructures

Nanotechnology, 1995-04, Vol.6 (2), p.35-39

1995

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Improving metrological support to automatic chemical monitoring of circulating water in nuclear power plant

Measurement techniques, 1999-08, Vol.42 (8), p.821-824

1999

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The structure and electromigration behaviour of aluminium films deposited by the partially ionized beam technique

Thin solid films, 1993-05, Vol.227 (1), p.54-58

1993

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Complementary imaging of granular Co-Ag films with magneto-optical indicator film technique and magnetic force microscopy

Journal of applied physics, 1996-04, Vol.79 (8), p.5315-5317

1996

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The Improvement of Immunity to Electromigration by Means of Microstructural Design

MRS proceedings, 1996, Vol.428, Article 231

1996

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The effect of self-ions bombardment on the structure and properties of thin metal films

Vacuum, 1995-07, Vol.46 (7), p.685-690

1995

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Relationship Between The Void And Hillock Formation And The Grain Growth In Thin Aluminum Films

MRS proceedings, 1996, Vol.428, Article 493

1996

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Relationship Between Structure and Electromigration Characteristics of Pure Aluminum Films

MRS proceedings, 1997, Vol.473, Article 369

1997

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The scanning electron microscopy investigation of LiTaO3 thin films on silicon substrates

Microelectronic engineering, 1995-12, Vol.29 (1-4), p.305-308

1995

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Giant Peaks of the Conductance in Polycrystalline Bi Nanobridges

Physical review letters, 1995-12, Vol.75 (23), p.4286-4289

1995

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Electromigration in Submicron Wide Copper Lines

MRS proceedings, 1996, Vol.427, Article 127

1996

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Magnetoresistance of nanobridges of lanthanum-strontium manganite

Technical physics letters, 1999-05, Vol.25 (5), p.398-401

1999

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Electromigration In Submicron Wide Copper Lines

MRS proceedings, 1996, Vol.428, Article 61

1996

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Propagation of a burning front over a condensed material from a focus

Combustion, explosion, and shock waves, 1992-07, Vol.28 (4), p.362-365

1992

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Electromigration activation energy in pure aluminum films deposited by partially ionized beam technique

Scripta metallurgica et materialia, 1995-12, Vol.33 (12), p.1981-1986

1995

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Degassing of Niobium in Zone Melting In Vacuo

Russian metallurgy Metally, 1984-01 (5), p.71-76

1984

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The structure of aluminum films deposited by partially ionized beam

Scripta metallurgica et materialia, 1992-08, Vol.27 (3), p.329-333

1992

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Design of a quadrupole nuclear thermometer

Measurement techniques, 1982-03, Vol.25 (3), p.247-249

1982

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Combustion of a condensed system in a gas flow with large-scale speed fluctuations

Combustion, explosion, and shock waves, 1976, Vol.11 (5), p.606-610

1976

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The microstructure of Cu films deposited by the self-ion assisted technique

Electromigration properties of multigrain aluminum thin film conductors as influenced by grain boundary structure

EM activation energy in aluminum conductors tested by the drift velocity method

Anomalous Proximity Effect in the Nb-BiSb-Nb Junctions

Behavior of domain structure in a Co/Ag superlattice with dispersion of magnetic anisotropy

Texture and microtexture of copper films prepared by the self-ion assisted deposition technique on barrier layers with different structure

A new approach to fabrication of nanostructures

Improving metrological support to automatic chemical monitoring of circulating water in nuclear power plant

The structure and electromigration behaviour of aluminium films deposited by the partially ionized beam technique

Complementary imaging of granular Co-Ag films with magneto-optical indicator film technique and magnetic force microscopy

The Improvement of Immunity to Electromigration by Means of Microstructural Design

The effect of self-ions bombardment on the structure and properties of thin metal films

Relationship Between The Void And Hillock Formation And The Grain Growth In Thin Aluminum Films

Relationship Between Structure and Electromigration Characteristics of Pure Aluminum Films

The scanning electron microscopy investigation of LiTaO3 thin films on silicon substrates

Giant Peaks of the Conductance in Polycrystalline Bi Nanobridges

Electromigration in Submicron Wide Copper Lines

Magnetoresistance of nanobridges of lanthanum-strontium manganite

Electromigration In Submicron Wide Copper Lines

Propagation of a burning front over a condensed material from a focus

Electromigration activation energy in pure aluminum films deposited by partially ionized beam technique

Degassing of Niobium in Zone Melting In Vacuo

The structure of aluminum films deposited by partially ionized beam

Design of a quadrupole nuclear thermometer

Combustion of a condensed system in a gas flow with large-scale speed fluctuations

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