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Atomic-scale insights on the formation of ordered arrays of edge dislocations in Ge/Si(001) films via molecular dynamics simulations

Scientific reports, 2022-02, Vol.12 (1), p.3235-11, Article 3235

2022

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Scaling Hetero-Epitaxy from Layers to Three-Dimensional Crystals

Science (American Association for the Advancement of Science), 2012-03, Vol.335 (6074), p.1330-1334

2012

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The origin and nature of killer defects in 3C-SiC for power electronic applications by a multiscale atomistic approach

Journal of materials chemistry. C, Materials for optical and electronic devices, 2020-01, Vol.8 (25), p.838-8392

2020

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Structure and Stability of Partial Dislocation Complexes in 3C-SiC by Molecular Dynamics Simulations

Materials, 2019-09, Vol.12 (18), p.3027

2019

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Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X‑ray Diffraction Microscopy

ACS applied materials & interfaces, 2015-05, Vol.7 (17), p.9031-9037

2015

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Perfect crystals grown from imperfect interfaces

Scientific reports, 2013-07, Vol.3 (1), p.2276-2276, Article 2276

2013

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Evolution and Intersection of Extended Defects and Stacking Faults in 3C‐SiC Layers on Si (001) Substrates by Molecular Dynamics Simulations: The Forest Dislocation Case

physica status solidi (b), 2022-09, Vol.259 (9), p.n/a

2022

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Impact of Inversion Domain Boundaries on the Electronic Properties of 3C‐SiC

physica status solidi (b), 2022-09, Vol.259 (9), p.n/a

2022

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Evolution and Intersection of Extended Defects and Stacking Faults in 3C‐SiC Layers on Si (001) Substrates by Molecular Dynamics Simulations: The Forest Dislocation Case

physica status solidi (b), 2022-09, Vol.259 (9), p.n/a

2022

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Onset of vertical threading dislocations in Si1−xGex/Si (001) at a critical Ge concentration

APL materials, 2013-11, Vol.1 (5), p.052109-052109-8

2013

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Author Correction: In-plane selective area InSb–Al nanowire quantum networks

Communications physics, 2021-03, Vol.4 (1), p.1-1, Article 63

2021

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Extended defects in 3C-SiC: Stacking faults, threading partial dislocations, and inverted domain boundaries

Acta materialia, 2021-07, Vol.213, p.116915, Article 116915

2021

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Nature and Shape of Stacking Faults in 3C‐SiC by Molecular Dynamics Simulations

physica status solidi (b), 2021-06, Vol.258 (6), p.n/a

2021

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Temperature-Dependent Stability of Polytypes and Stacking Faults in Si C : Reconciling Theory and Experiments

Physical review applied, 2019-08, Vol.12 (2), Article 021002

2019

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Silicon phase transitions in nanoindentation: Advanced molecular dynamics simulations with machine learning phase recognition

Acta materialia, 2024-01, Vol.263, p.119465, Article 119465

2024

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Molecular dynamics simulations of extended defects and their evolution in 3C-SiC by different potentials

Modelling and simulation in materials science and engineering, 2020-01, Vol.28 (1), p.15002

2020

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Solving the critical thermal bowing in 3C-SiC/Si(111) by a tilting Si pillar architecture

Journal of applied physics, 2018-05, Vol.123 (18)

2018

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Mechanism of stacking fault annihilation in 3C-SiC epitaxially grown on Si(001) by molecular dynamics simulations

CrystEngComm, 2021-02, Vol.23 (7), p.1566-1571

2021

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Unveiling Planar Defects in Hexagonal Group IV Materials

Nano letters, 2021-04, Vol.21 (8), p.3619-3625

2021

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Lattice tilt and strain mapped by X‐ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals

Journal of applied crystallography, 2018-04, Vol.51 (2), p.368-385

2018

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Unexpected Dominance of Vertical Dislocations in High-Misfit Ge/Si(001) Films and Their Elimination by Deep Substrate Patterning

Advanced materials (Weinheim), 2013-08, Vol.25 (32), p.4408-4412

2013

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Stress engineering of boron doped diamond thin films via micro-fabrication

APL materials, 2021-06, Vol.9 (6)

2021

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InAs/GaAs Sharply Defined Axial Heterostructures in Self-Assisted Nanowires

Nano letters, 2015-06, Vol.15 (6), p.3677-3683

2015

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Photodetection in Hybrid Single-Layer Graphene/Fully Coherent Germanium Island Nanostructures Selectively Grown on Silicon Nanotip Patterns

ACS applied materials & interfaces, 2016-01, Vol.8 (3), p.2017-2026

2016

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Atomic-scale insights on the formation of ordered arrays of edge dislocations in Ge/Si(001) films via molecular dynamics simulations

Scaling Hetero-Epitaxy from Layers to Three-Dimensional Crystals

The origin and nature of killer defects in 3C-SiC for power electronic applications by a multiscale atomistic approach

Structure and Stability of Partial Dislocation Complexes in 3C-SiC by Molecular Dynamics Simulations

New Approaches and Understandings in the Growth of Cubic Silicon Carbide

Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X‑ray Diffraction Microscopy

Perfect crystals grown from imperfect interfaces

Evolution and Intersection of Extended Defects and Stacking Faults in 3C‐SiC Layers on Si (001) Substrates by Molecular Dynamics Simulations: The Forest Dislocation Case

Impact of Inversion Domain Boundaries on the Electronic Properties of 3C‐SiC

Evolution and Intersection of Extended Defects and Stacking Faults in 3C‐SiC Layers on Si (001) Substrates by Molecular Dynamics Simulations: The Forest Dislocation Case

Onset of vertical threading dislocations in Si1−xGex/Si (001) at a critical Ge concentration

Author Correction: In-plane selective area InSb–Al nanowire quantum networks

Extended defects in 3C-SiC: Stacking faults, threading partial dislocations, and inverted domain boundaries

Nature and Shape of Stacking Faults in 3C‐SiC by Molecular Dynamics Simulations

Temperature-Dependent Stability of Polytypes and Stacking Faults in Si C : Reconciling Theory and Experiments

Silicon phase transitions in nanoindentation: Advanced molecular dynamics simulations with machine learning phase recognition

Molecular dynamics simulations of extended defects and their evolution in 3C-SiC by different potentials

Solving the critical thermal bowing in 3C-SiC/Si(111) by a tilting Si pillar architecture

Mechanism of stacking fault annihilation in 3C-SiC epitaxially grown on Si(001) by molecular dynamics simulations

Unveiling Planar Defects in Hexagonal Group IV Materials

Lattice tilt and strain mapped by X‐ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals

Unexpected Dominance of Vertical Dislocations in High-Misfit Ge/Si(001) Films and Their Elimination by Deep Substrate Patterning

Stress engineering of boron doped diamond thin films via micro-fabrication

InAs/GaAs Sharply Defined Axial Heterostructures in Self-Assisted Nanowires

Photodetection in Hybrid Single-Layer Graphene/Fully Coherent Germanium Island Nanostructures Selectively Grown on Silicon Nanotip Patterns

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