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Nonlocal impact ionisation coefficients derived from Monte Carlo calculations

Electronics letters, 2002-01, Vol.38 (1), p.55-57

Marsland, J.S.

2002

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Erratum: Temperature dependence of ionisation coefficients in silicon derived from physical model

Electronics letters, 1991, Vol.27 (25), p.2399

Marsland, J.S.

1991

Volltextzugriff (PDF)

Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect

IEEE transactions on electron devices, 1992-05, Vol.39 (5), p.1129-1135

1992

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Temperature dependence of ionisation coefficients in silicon derived from physical model

Electronics letters, 1991-10, Vol.27 (22), p.1997, Article 1997

Marsland, J.S.

1991

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A lucky drift model, including a soft threshold energy, fitted to experimental measurements of ionization coefficients

Solid-state electronics, 1987, Vol.30 (1), p.125-132

Marsland, J.S.

1987

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The electron impact ionization rate and breakdown voltage in GaAs/Ga/sub 0.7/Al/sub 0.3/As MQW structures

IEEE electron device letters, 1989-07, Vol.10 (7), p.294-296

1989

Volltextzugriff (PDF)

Experimental and theoretical ionization coefficients in semiconductors

Marsland, J.S

1988

Volltextzugriff (PDF)

Charge trapping and polarity dependence of interface state generation in nitrided oxide gate dielectric by electron photoinjection

Electronics letters, 1994-07, Vol.30 (14), p.1180-1181

1994

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Substrate hot electron injection modelling based on lucky drift theory

Microelectronic engineering, 1993-08, Vol.22 (1), p.261-264

1993

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A conic section function network synapse and neuron implementation in VLSI hardware

Proceedings of International Conference on Neural Networks (ICNN'96), 1996, Vol.2, p.974-979 vol.2

1996

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Improved backpropagation training algorithm using conic section functions

Proceedings of International Conference on Neural Networks (ICNN'97), 1997, Vol.2, p.1078-1081 vol.2

1997

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Study of oxide field and electron energy dependence of interface-state generation in MOS structure by electron injection from Al gate and Si substrate

Proceedings of 4th International Conference on Solid-State and IC Technology, 1995, p.416-418

1995

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Estimation of noise figure for conventional and multilayered avalanche photodiodes using the lucky drift model

ESSDERC '90: 20th European Solid State Device Research Conference, 1990, p.567-570

1990

Volltextzugriff (PDF)

Neural network implementation using a single MOST per synapse

IEEE transactions on neural networks, 1995-07, Vol.6 (4), p.1008-1011

1995

Volltextzugriff (PDF)

A simple model to predict the holding voltage for SOI MOSFETs operating in the latch state

1990 IEEE SOS/SOI Technology Conference. Proceedings, 1990, p.19-20

1990

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Threshold Selection for SNR-based Selective Digital Relaying in Cooperative Wireless Networks

IEEE transactions on wireless communications, 2008-11, Vol.7 (11), p.4226-4237

2008

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Surface oceanography of BROKE-West, along the Antarctic margin of the south-west Indian Ocean ( 30 – 80 ∘ E )

Deep-sea research. Part II, Topical studies in oceanography, 2010-05, Vol.57 (9), p.738-757

2010

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The circulation and water masses of the Antarctic shelf and continental slope between 30 and 80 ∘ E

Deep-sea research. Part II, Topical studies in oceanography, 2010-05, Vol.57 (9), p.723-737

2010

Volltextzugriff (PDF)

Natural IgE Production in the Absence of MHC Class II Cognate Help

Immunity (Cambridge, Mass.), 2006-03, Vol.24 (3), p.329-339

2006

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Nonlocal impact ionisation coefficients derived from Monte Carlo calculations

Erratum: Temperature dependence of ionisation coefficients in silicon derived from physical model

Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect

Temperature dependence of ionisation coefficients in silicon derived from physical model

A lucky drift model, including a soft threshold energy, fitted to experimental measurements of ionization coefficients

The electron impact ionization rate and breakdown voltage in GaAs/Ga/sub 0.7/Al/sub 0.3/As MQW structures

Experimental and theoretical ionization coefficients in semiconductors

Charge trapping and polarity dependence of interface state generation in nitrided oxide gate dielectric by electron photoinjection

Substrate hot electron injection modelling based on lucky drift theory

A conic section function network synapse and neuron implementation in VLSI hardware

Improved backpropagation training algorithm using conic section functions

Study of oxide field and electron energy dependence of interface-state generation in MOS structure by electron injection from Al gate and Si substrate

Estimation of noise figure for conventional and multilayered avalanche photodiodes using the lucky drift model

Neural network implementation using a single MOST per synapse

A simple model to predict the holding voltage for SOI MOSFETs operating in the latch state

Threshold Selection for SNR-based Selective Digital Relaying in Cooperative Wireless Networks

Surface oceanography of BROKE-West, along the Antarctic margin of the south-west Indian Ocean ( 30 – 80 ∘ E )

The circulation and water masses of the Antarctic shelf and continental slope between 30 and 80 ∘ E

Natural IgE Production in the Absence of MHC Class II Cognate Help

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