UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Monte Carlo simulation study of electron yields from compound semiconductor materials

Journal of applied physics, 2020-07, Vol.128 (1)

2020

Volltextzugriff (PDF)

Time-dependent characteristics of secondary electron emission

Journal of applied physics, 2019-01, Vol.125 (2)

2019

Volltextzugriff (PDF)

Surface sensitivity of secondary electrons emitted from amorphous solids: Calculation of mean escape depth by a Monte Carlo method

Journal of applied physics, 2016-12, Vol.120 (23)

2016

Volltextzugriff (PDF)

Theoretical calculations of the mean escape depth of secondary electron emission from compound semiconductor materials

Journal of applied physics, 2020-03, Vol.127 (12)

2020

Volltextzugriff (PDF)

Acceleration of plasma toroidal rotation driven by non-axisymmetric magnetic perturbation fields in the EAST tokamak

Physics of plasmas, 2024-03, Vol.31 (3)

2024

Volltextzugriff (PDF)

Validity of the semi-classical approach for calculation of the surface excitation parameter

Journal of physics. Condensed matter, 2011-10, Vol.23 (39), p.395003-np

2011

Volltextzugriff (PDF)

Quantum-trajectory Monte Carlo method for study of electron-crystal interaction in STEM

Physical chemistry chemical physics : PCCP, 2015-07, Vol.17 (27), p.17628-17637

2015

Volltextzugriff (PDF)

Monte Carlo modeling of surface excitation in reflection electron energy loss spectroscopy spectrum for rough surfaces

Journal of applied physics, 2012-08, Vol.112 (3)

2012

Volltextzugriff (PDF)

A Monte Carlo study of reflection electron energy loss spectroscopy spectrum of a carbon contaminated surface

Journal of applied physics, 2014-09, Vol.116 (12)

2014

Volltextzugriff (PDF)

Quantification of surface roughness effect on elastically backscattered electrons

Surface and interface analysis, 2014-07, Vol.46 (7), p.489-496

2014

Volltextzugriff (PDF)

Systematic calculation of the surface excitation parameters for 22 materials

Surface and interface analysis, 2013-03, Vol.45 (3), p.773-780

2013

Volltextzugriff (PDF)

Monte Carlo simulation of full energy spectrum of electrons emitted from silicon in Auger electron spectroscopy

Surface and interface analysis, 2015-01, Vol.47 (1), p.113-119

2015

Volltextzugriff (PDF)

Monte Carlo simulation of secondary electron images for real sample structures in scanning electron microscopy

Scanning, 2012-05, Vol.34 (3), p.145-150

2012

Volltextzugriff (PDF)

Application of a machine learning method to model-based library approach for critical dimension measurements using CD-SEM

Measurement science & technology, 2024-06, Vol.35 (6), p.65002

2024

Volltextzugriff (PDF)

Simulation study of the atomic resolution secondary electron imaging

Surface and interface analysis, 2014-12, Vol.46 (12-13), p.1296-1300

2014

Volltextzugriff (PDF)

Electron backscattering coefficients for Cr, Co, and Pd solids: A Monte Carlo simulation study

Journal of applied physics, 2024-06, Vol.135 (22)

2024

Volltextzugriff (PDF)

Uncertainty evaluation of Monte Carlo simulated line scan profiles of a critical dimension scanning electron microscope (CD-SEM)

Journal of applied physics, 2023-06, Vol.133 (24)

2023

Volltextzugriff (PDF)

Linewidth characterization of a self-traceable grating by SEM

Journal of physics. D, Applied physics, 2024-07, Vol.57 (27), p.275103

2024

Volltextzugriff (PDF)

A comparative study on Monte Carlo simulations of electron emission from liquid water

Medical physics (Lancaster), 2020-02, Vol.47 (2), p.759-771

2020

Volltextzugriff (PDF)

A Monte Carlo simulation study on the image resolution in scanning electron microscopy

Surface and interface analysis, 2010-06, Vol.42 (6-7), p.1096-1099

2010

Volltextzugriff (PDF)

A Monte Carlo study of the spin polarization of secondary electrons

Surface and interface analysis, 2012-06, Vol.44 (6), p.703-708

2012

Volltextzugriff (PDF)

Influence of surface roughness on elastically backscattered electrons

Surface and interface analysis, 2012-06, Vol.44 (6), p.647-652

2012

Volltextzugriff (PDF)

A Monte Carlo modeling on charging effect for structures with arbitrary geometries

Journal of physics. D, Applied physics, 2018-04, Vol.51 (16), p.165301

2018

Volltextzugriff (PDF)

Critical-dimension scanning electron microscope characterization of smoothly varying wave structures with a Monte Carlo simulation

Journal of physics. D, Applied physics, 2021-11, Vol.54 (44), p.445301

2021

Volltextzugriff (PDF)

Monte Carlo Study of the Influence of Electron Beam Focusing to SEM Image Sharpness Measurement

e-Journal of Surface Science and Nanotechnology, 2014/05/31, Vol.12, pp.247-251

2014

Volltextzugriff (PDF)

1 – 25 von 8.892

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(7.335)
Mit Volltextzugriff
(7.523)

Publikationsform

3 weitere anzeigen...

Weniger anzeigen...

Sprache

5 weitere anzeigen...

Weniger anzeigen...

Erscheinungsjahr

n.n

Thema

Science & Technology
(6.210)
Life Sciences & Biomedicine
(2.804)
Physical Sciences
(2.307)
Technology
(1.885)
Humans
(1.783)
Physics
(1.230)
Female
(993)
Male
(993)
Animals
(973)
Biological And Medical Sciences
(865)
Exact Sciences And Technology
(846)
Engineering
(777)
Materials Science
(721)
Chemistry
(661)
Medical Sciences
(591)
Adult
(566)
Materials Science, Multidisciplinary
(513)
Middle Aged
(510)
Physics, Applied
(430)
Engineering, Electrical & Electronic
(425)

15 weitere anzeigen...

Weniger anzeigen...

Kollektion

IngentaConnect_期刊（NSTL购买）
(3.439)
EZB Electronic Journals Library
(3.108)
MEDLINE
(2.682)
Elsevier ScienceDirect Journals Complete
(1.751)
Publisher or Other Site
(1.498)
Journals@Ovid Complete
(1.452)
IngentaConnect Journals
(1.207)
Elsevier Journal Backfiles on ScienceDirect (DFG Nationallizenzen)
(1.197)
Wiley HSS Collection
(884)
Springer Nature
(655)
Wiley Online Library Full Collection 2018
(618)
IEEE Electronic Library (IEL)
(518)
American Physical Society Journals
(472)
American Physical Society [PROLA]
(407)
SpringerLINK Contemporary (Konsortium Baden-Württemberg)
(396)
Taylor & Francis Journals
(323)
Nature Journals Online
(283)
Ebook Central Perpetual and DDA
(282)
eBooks on EBSCOhost
(279)
Oxford journals
(269)

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

Menü

Weitere Dienste

Einstellungen

Monte Carlo simulation study of electron yields from compound semiconductor materials

Time-dependent characteristics of secondary electron emission

Surface sensitivity of secondary electrons emitted from amorphous solids: Calculation of mean escape depth by a Monte Carlo method

Theoretical calculations of the mean escape depth of secondary electron emission from compound semiconductor materials

Acceleration of plasma toroidal rotation driven by non-axisymmetric magnetic perturbation fields in the EAST tokamak

Validity of the semi-classical approach for calculation of the surface excitation parameter

Quantum-trajectory Monte Carlo method for study of electron-crystal interaction in STEM

Monte Carlo modeling of surface excitation in reflection electron energy loss spectroscopy spectrum for rough surfaces

A Monte Carlo study of reflection electron energy loss spectroscopy spectrum of a carbon contaminated surface

Quantification of surface roughness effect on elastically backscattered electrons

Systematic calculation of the surface excitation parameters for 22 materials

Monte Carlo simulation of full energy spectrum of electrons emitted from silicon in Auger electron spectroscopy

Monte Carlo simulation of secondary electron images for real sample structures in scanning electron microscopy

Application of a machine learning method to model-based library approach for critical dimension measurements using CD-SEM

Simulation study of the atomic resolution secondary electron imaging

Electron backscattering coefficients for Cr, Co, and Pd solids: A Monte Carlo simulation study

Uncertainty evaluation of Monte Carlo simulated line scan profiles of a critical dimension scanning electron microscope (CD-SEM)

Linewidth characterization of a self-traceable grating by SEM

A comparative study on Monte Carlo simulations of electron emission from liquid water

A Monte Carlo simulation study on the image resolution in scanning electron microscopy

A Monte Carlo study of the spin polarization of secondary electrons

Influence of surface roughness on elastically backscattered electrons

A Monte Carlo modeling on charging effect for structures with arbitrary geometries

Critical-dimension scanning electron microscope characterization of smoothly varying wave structures with a Monte Carlo simulation

Monte Carlo Study of the Influence of Electron Beam Focusing to SEM Image Sharpness Measurement

Suchergebnisse filtern