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Surgical Management of Basal Cell Carcinoma of the Face

Indian journal of plastic surgery, 2023-12, Vol.1 (1), p.65-72

2023

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Use of multiincidence angle RADARSAT-1 SAR data to incorporate the effect of surface roughness in soil moisture estimation

IEEE transactions on geoscience and remote sensing, 2003-07, Vol.41 (7), p.1638-1640

2003

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Multi-component high- K gate dielectrics for the silicon industry

Microelectronic engineering, 2001-11, Vol.59 (1), p.351-359

2001

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Etching of high- k dielectric Zr1−xAlxOy films in chlorine-containing plasmas

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2001-07, Vol.19 (4), p.1361-1366

2001

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Composition-dependent crystallization of alternative gate dielectrics

Applied physics letters, 2003-08, Vol.83 (7), p.1459-1461

2003

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Imaging of Huntington's disease

Medical journal. Armed Forces India, 2014-10, Vol.70 (4), p.386-388

2014

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Osteopoikilosis – Spotted bone disease

Medical journal. Armed Forces India, 2013-04, Vol.69 (2), p.196-198

2013

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Rapid thermal oxidation of silicon in N2O between 800 and 1200 °C: Incorporated nitrogen and interfacial roughness

Applied physics letters, 1994-08, Vol.65 (7), p.848-850

1994

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Crystallization kinetics in amorphous ( Zr 0.62 Al 0.38 ) O 1.8 thin films

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2001-11, Vol.19 (6), p.2779-2784

2001

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Gate capacitance attenuation in MOS devices with thin gate dielectrics

IEEE electron device letters, 1996-11, Vol.17 (11), p.521-524

1996

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Satellite stereo data for dem surfaces and derivatives

Journal of the Indian Society of Remote Sensing, 2004, Vol.32 (1), p.81-90

2004

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Study of thermally oxidized yttrium films on silicon

Applied physics letters, 1987-09, Vol.51 (12), p.919-921

1987

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Robust, 1.8 V 250 mu W direct-contact 500 dpi fingerprint sensor

Digest of technical papers - IEEE International Solid-State Circuits Conference, 1998

1998

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Yttrium oxide/silicon dioxide: a new dielectric structure for VLSI/ULSI circuits

IEEE electron device letters, 1988-04, Vol.9 (4), p.180-182

1988

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Inversion layer mobility of MOSFET's fabricated with NMOS Submicrometer technology

IEEE electron device letters, 1984-11, Vol.5 (11), p.470-473

Manchanda, L.

1984

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γ-Radiation effects on MOSFET's fabricated with NMOS Submicrometer technology

IEEE electron device letters, 1984-10, Vol.5 (10), p.412-414

Manchanda, L.

1984

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Comparisons of slow release tramadol 200 mg with placebo in patients undergoing total abdominal hysterectomy

European journal of anaesthesiology, 2000, Vol.17 Suppl 19 (Supplement 19), p.106-106

2000

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Soil survey and mapping using remote sensing

Tropical ecology, 2002-01, Vol.43 (1), p.61-74

2002

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Growth temperature dependence of the Si(001)/SiO2 interface width

Applied physics letters, 1994-02, Vol.64 (6), p.748-750

1994

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Accuracy assessment in cotton acreage estimation using Indian remote sensing satellite data

ISPRS journal of photogrammetry and remote sensing, 1994-12, Vol.49 (6), p.21-26

1994

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Thickness dependence of boron penetration through O/sub 2/- and N/sub 2/O-grown gate oxides and its impact on threshold voltage variation

IEEE transactions on electron devices, 1996-06, Vol.43 (6), p.982-990

1996

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Kinetic smoothening: Growth thickness dependence of the interface width of the Si(001)/SiO2 interface

Journal of applied physics, 1995-05, Vol.77 (9), p.4746-4749

1995

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Anomalous C-V characteristics of implanted poly MOS structure in n+/p+ dual-gate CMOS technology

IEEE electron device letters, 1989-05, Vol.10 (5), p.192-194

1989

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Radiological quiz

Medical journal. Armed Forces India, 2005, Vol.61 (2), p.173,203-173,203

2005

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Temperature and channel-length dependence of impact ionization in P-channel MOSFETs

Digest of technical papers - Symposium on VLSI Technology, 1994, p.125-126

1994

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Surgical Management of Basal Cell Carcinoma of the Face

Use of multiincidence angle RADARSAT-1 SAR data to incorporate the effect of surface roughness in soil moisture estimation

Multi-component high- K gate dielectrics for the silicon industry

Etching of high- k dielectric Zr1−xAlxOy films in chlorine-containing plasmas

Composition-dependent crystallization of alternative gate dielectrics

Imaging of Huntington's disease

Osteopoikilosis – Spotted bone disease

Rapid thermal oxidation of silicon in N2O between 800 and 1200 °C: Incorporated nitrogen and interfacial roughness

Crystallization kinetics in amorphous ( Zr 0.62 Al 0.38 ) O 1.8 thin films

Gate capacitance attenuation in MOS devices with thin gate dielectrics

Satellite stereo data for dem surfaces and derivatives

Study of thermally oxidized yttrium films on silicon

Robust, 1.8 V 250 mu W direct-contact 500 dpi fingerprint sensor

Yttrium oxide/silicon dioxide: a new dielectric structure for VLSI/ULSI circuits

Inversion layer mobility of MOSFET's fabricated with NMOS Submicrometer technology

γ-Radiation effects on MOSFET's fabricated with NMOS Submicrometer technology

Comparisons of slow release tramadol 200 mg with placebo in patients undergoing total abdominal hysterectomy

Soil survey and mapping using remote sensing

Growth temperature dependence of the Si(001)/SiO2 interface width

Accuracy assessment in cotton acreage estimation using Indian remote sensing satellite data

Thickness dependence of boron penetration through O/sub 2/- and N/sub 2/O-grown gate oxides and its impact on threshold voltage variation

Kinetic smoothening: Growth thickness dependence of the interface width of the Si(001)/SiO2 interface

Anomalous C-V characteristics of implanted poly MOS structure in n+/p+ dual-gate CMOS technology

Radiological quiz

Temperature and channel-length dependence of impact ionization in P-channel MOSFETs

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