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Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect

Microelectronics and reliability, 2017-09, Vol.76-77, p.255-260

2017

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Failure analysis on 14 nm FinFET devices with ESD CDM failure

Microelectronics and reliability, 2018-09, Vol.88-90, p.321-333

2018

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Static fault localization of subtle metallization defects using near infrared photon emission microscopy

Microelectronics and reliability, 2017-06, Vol.73, p.76-91

2017

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Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique

Microelectronics and reliability, 2018-09, Vol.88-90, p.309-314

2018

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Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern

Microelectronics and reliability, 2017-09, Vol.76-77, p.141-144

2017

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Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis

Microelectronics and reliability, 2017-09, Vol.76-77, p.261-266

2017

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Electrical analysis on implantation-related defect by nanoprobing methodology

Microelectronics and reliability, 2016-09, Vol.64, p.317-320

2016

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Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system

Microelectronics and reliability, 2016-09, Vol.64, p.362-366

2016

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Cross-sectional nanoprobing fault isolation technique on submicron devices

Microelectronics and reliability, 2016-09, Vol.64, p.321-325

2016

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Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue

Microelectronics and reliability, 2016-09, Vol.64, p.357-361

2016

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Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique

Microelectronics and reliability, 2015-08, Vol.55 (9-10), p.1611-1616

2015

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Sharp Needles: Fabrication of Tungsten Nanotips by AC Electrochemical Etching and Laser Enhanced Etching for Nanoprobing on Interconnects of Advanced Technology Nodes

MRS proceedings, 2013, Vol.1553 (1), Article mrss13-1553-t03-16

2013

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Structures of Co 90Fe 10/Cu multilayers determined by X-ray anomalous scattering measurements

Thin solid films, 2006, Vol.496 (2), p.571-575

2006

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Studies of the interfacial structure of LaAlO{sub 3} thin films on silicon by x-ray reflectivity and angle-resolved x-ray photoelectron spectroscopy

Journal of applied physics, 2005-06, Vol.97 (12)

2005

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Effect of Eu 2CuO 4/Yttrium-stabilized Z rO 2 buffer layers on YB 2Cu 3O 7− x thin films grown on Si substrates

Thin solid films, 2005, Vol.489 (1), p.200-204

2005

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Influence of surfactant Ag on the structure of annealing Ni 70Co 30/Cu multilayers by X-ray reflection anomalous fine structure and X-ray absorption spectroscopy

Physica. B, Condensed matter, 2006, Vol.382 (1), p.193-200

2006

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Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements

Thin solid films, 2006-02, Vol.496 (2), p.571-575

2006

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In-depth circuits edit analysis to reveal the implantation-related defect

Microelectronics, 2017-04, Vol.62, p.38-42

2017

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Microstructural studies of YB 2Cu 3O 7− δ /Nd 2CuO 4/YB 2Cu 3O 7− δ Josephson junctions with a Nd 2CuO 4 buffer layer grown on YSZ substrate

Physica. C, Superconductivity, 2004, Vol.416 (3), p.69-74

2004

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Effect of Eu2CuO4/yttrium-stabilized ZrO2 buffer layers on YB2Cu3O7-x thin films grown on Si substrates

Thin solid films, 2005-10, Vol.489 (1-2), p.200-204

2005

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Influence of surfactant Ag on the structure of annealing Ni70Co30/Cu multilayers by X-ray reflection anomalous fine structure and X-ray absorption spectroscopy

Physica. B, Condensed matter, 2006-06, Vol.382 (1-2), p.193-200

2006

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Time evolution of the microstructures of LaAlO3 thin films grown on Si substrates

Applied physics. A, Materials science & processing, 2006-08, Vol.84 (3), p.341-344

2006

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Nano-modification on hydrogen-passivated Si surfaces by a laser-assisted scanning tunneling microscope operating in air

Applied surface science, 2000-02, Vol.154, p.360-364

2000

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Microstructural characterization of YBa 2Cu 3O 7− x thin films grown on Y–ZrO 2

Thin solid films, 2003, Vol.437 (1), p.272-275

2003

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Microstructural studies of YB2Cu3O7-δ/Nd2CuO4/YB2Cu3O7-δ Josephson junctions with a Nd2CuO4 buffer layer grown on YSZ substrate

Physica. C, Superconductivity, 2004-12, Vol.416 (3-4), p.69-74

2004

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Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect

Failure analysis on 14 nm FinFET devices with ESD CDM failure

Static fault localization of subtle metallization defects using near infrared photon emission microscopy

Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique

Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern

Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis

Electrical analysis on implantation-related defect by nanoprobing methodology

Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system

Cross-sectional nanoprobing fault isolation technique on submicron devices

Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue

Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique

Sharp Needles: Fabrication of Tungsten Nanotips by AC Electrochemical Etching and Laser Enhanced Etching for Nanoprobing on Interconnects of Advanced Technology Nodes

Structures of Co 90Fe 10/Cu multilayers determined by X-ray anomalous scattering measurements

Studies of the interfacial structure of LaAlO{sub 3} thin films on silicon by x-ray reflectivity and angle-resolved x-ray photoelectron spectroscopy

Effect of Eu 2CuO 4/Yttrium-stabilized Z rO 2 buffer layers on YB 2Cu 3O 7− x thin films grown on Si substrates

Influence of surfactant Ag on the structure of annealing Ni 70Co 30/Cu multilayers by X-ray reflection anomalous fine structure and X-ray absorption spectroscopy

Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements

In-depth circuits edit analysis to reveal the implantation-related defect

Microstructural studies of YB 2Cu 3O 7− δ /Nd 2CuO 4/YB 2Cu 3O 7− δ Josephson junctions with a Nd 2CuO 4 buffer layer grown on YSZ substrate

Effect of Eu2CuO4/yttrium-stabilized ZrO2 buffer layers on YB2Cu3O7-x thin films grown on Si substrates

Influence of surfactant Ag on the structure of annealing Ni70Co30/Cu multilayers by X-ray reflection anomalous fine structure and X-ray absorption spectroscopy

Time evolution of the microstructures of LaAlO3 thin films grown on Si substrates

Nano-modification on hydrogen-passivated Si surfaces by a laser-assisted scanning tunneling microscope operating in air

Microstructural characterization of YBa 2Cu 3O 7− x thin films grown on Y–ZrO 2

Microstructural studies of YB2Cu3O7-δ/Nd2CuO4/YB2Cu3O7-δ Josephson junctions with a Nd2CuO4 buffer layer grown on YSZ substrate

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