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SWI/SNF family mutations in advanced NSCLC: genetic characteristics and immune checkpoint inhibitors’ therapeutic implication

ESMO open, 2024-06, Vol.9 (6), p.103472, Article 103472

2024

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The effects of thermal annealing on ZnO thin films grown by pulsed laser deposition

Journal of applied physics, 2000-07, Vol.88 (1), p.498-502

2000

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Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis

AIP advances, 2015-12, Vol.5 (12), p.127101-127101-9

2015

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Experimental evidence of the “dead layer” at Pt∕BaTiO3 interface

Applied physics letters, 2005-11, Vol.87 (22)

2005

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Dry laser cleaning of particles from solid substrates: Experiments and theory

Journal of applied physics, 2001-09, Vol.90 (5), p.2135-2142

2001

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Enhancement of exchange bias in Ir–Mn/Co0.9Fe0.1 bilayers by inserting an ultra-thin Co0.6Fe0.4 layer

Journal of physics. D, Applied physics, 2006-02, Vol.39 (4), p.730-733

2006

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Laser-induced nano-oxidation on hydrogen-passivated Ge (100) surfaces under a scanning tunneling microscope tip

Applied physics letters, 1999-10, Vol.75 (16), p.2359-2361

1999

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Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements

Thin solid films, 2006-02, Vol.496 (2), p.571-575

2006

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Effect of strain on the transport and magnetoresistance properties of La0.8Ca0.2MnO3 epitaxial thin films

Journal of physics. D, Applied physics, 2007-05, Vol.40 (9), p.2723-2727

2007

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Effectiveness of frequency mapping on 28 nm device broken scan chain failures

Review of scientific instruments, 2012-02, Vol.83 (2), p.023702-023702-8

2012

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Incomplete transfer-induced interfacial roughening of Langmuir-Blodgett films

Europhysics letters, 2003-11, Vol.64 (3), p.385-391

2003

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Electrochromic writing and erasing on tungsten oxide films in air by scanning tunneling microscopy

Journal of applied physics, 2002-01, Vol.91 (1), p.440-443

2002

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Microstructural changes of stearic acid films by immersion in salt solution

Thin solid films, 2003-11, Vol.444 (1), p.174-178

2003

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Influence of surfactant Ag on the structure of annealing Ni70Co30/Cu multilayers by X-ray reflection anomalous fine structure and X-ray absorption spectroscopy

Physica. B, Condensed matter, 2006-06, Vol.382 (1-2), p.193-200

2006

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Automated TEM Sample Preparation from Smaller Device Structure Regions of Semiconductor ICs using Inline Dual-Beam CLM+ and TEMLink 150

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.900-901

2013

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Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2

Thin solid films, 2003-08, Vol.437 (1-2), p.272-275

2003

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Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfaces

Applied physics. A, Materials science & processing, 2000-04, Vol.70 (4), p.403-406

2000

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Effective Utilization of STEM Imaging Capability in FIB for Physical Failure Analysis on 20nm & 14nm Transistor Nodes in Semiconductor Wafer Foundries

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.902-903

2013

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An Effective Approach to Extract Cross-Sectional Information from Top-Down SEM for 20nm & 14nm Transistor Nodes in Semiconductor Wafer-Foundries

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.1122-1123

2013

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Microstructural studies of YB2Cu3O7-δ/Nd2CuO4/YB2Cu3O7-δ Josephson junctions with a Nd2CuO4 buffer layer grown on YSZ substrate

Physica. C, Superconductivity, 2004-12, Vol.416 (3-4), p.69-74

2004

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Excellent buffer layer for growing high-quality Y–Ba–Cu–O thin films

Journal of materials research, 2001-10, Vol.16 (10), p.2864-2868

2001

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In situ TEM study of electron-beam radiation induced boron diffusion and effects on phase and microstructure evolution in nanostructured CoFeB/SiO2 thin film

Journal of applied physics, 2017-01, Vol.121 (1)

2017

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Surface roughness exponent and non-designed cap layer in PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 bilayers

Journal of physics. D, Applied physics, 2000-10, Vol.33 (19), p.2363-2368

2000

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X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers

Journal of magnetism and magnetic materials, 2001-05, Vol.226, p.1728-1729

2001

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Studies of the interfacial structure of LaAlO3 thin films on silicon by x-ray reflectivity and angle-resolved x-ray photoelectron spectroscopy

Journal of applied physics, 2005-06, Vol.97 (12)

2005

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SWI/SNF family mutations in advanced NSCLC: genetic characteristics and immune checkpoint inhibitors’ therapeutic implication

The effects of thermal annealing on ZnO thin films grown by pulsed laser deposition

Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis

Experimental evidence of the “dead layer” at Pt∕BaTiO3 interface

Dry laser cleaning of particles from solid substrates: Experiments and theory

Enhancement of exchange bias in Ir–Mn/Co0.9Fe0.1 bilayers by inserting an ultra-thin Co0.6Fe0.4 layer

Laser-induced nano-oxidation on hydrogen-passivated Ge (100) surfaces under a scanning tunneling microscope tip

Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements

Effect of strain on the transport and magnetoresistance properties of La0.8Ca0.2MnO3 epitaxial thin films

Effectiveness of frequency mapping on 28 nm device broken scan chain failures

Incomplete transfer-induced interfacial roughening of Langmuir-Blodgett films

Electrochromic writing and erasing on tungsten oxide films in air by scanning tunneling microscopy

Microstructural changes of stearic acid films by immersion in salt solution

Influence of surfactant Ag on the structure of annealing Ni70Co30/Cu multilayers by X-ray reflection anomalous fine structure and X-ray absorption spectroscopy

Automated TEM Sample Preparation from Smaller Device Structure Regions of Semiconductor ICs using Inline Dual-Beam CLM+ and TEMLink 150

Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2

Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfaces

Effective Utilization of STEM Imaging Capability in FIB for Physical Failure Analysis on 20nm & 14nm Transistor Nodes in Semiconductor Wafer Foundries

An Effective Approach to Extract Cross-Sectional Information from Top-Down SEM for 20nm & 14nm Transistor Nodes in Semiconductor Wafer-Foundries

Microstructural studies of YB2Cu3O7-δ/Nd2CuO4/YB2Cu3O7-δ Josephson junctions with a Nd2CuO4 buffer layer grown on YSZ substrate

Excellent buffer layer for growing high-quality Y–Ba–Cu–O thin films

In situ TEM study of electron-beam radiation induced boron diffusion and effects on phase and microstructure evolution in nanostructured CoFeB/SiO2 thin film

Surface roughness exponent and non-designed cap layer in PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 bilayers

X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers

Studies of the interfacial structure of LaAlO3 thin films on silicon by x-ray reflectivity and angle-resolved x-ray photoelectron spectroscopy

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