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Comparative Study on the Crystallite Size and Bandgap of Perovskite by Diverse Methods

Advances in Condensed Matter Physics, 2022-05, Vol.2022, p.1-7

2022

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A First-Principles Study of Gas Molecule Adsorption on Carbon-, Nitrogen-, and Oxygen-Doped Two-Dimensional Borophene

Advances in Condensed Matter Physics, 2021-12, Vol.2021, p.1-10

2021

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Study of the Effect of Quenching on Microstructural and Magnetic Properties of Cu-Doped Mg-Ferrite

Advances in Condensed Matter Physics, 2022-02, Vol.2022, p.1-10

2022

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Evolution of Microstructure during Rapid Solidification of SiC under High Pressure

Advances in Condensed Matter Physics, 2022-02, Vol.2022, p.1-14

2022

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AlGaN/GaN Heterostructure Schottky Barrier Diodes with Graded Barrier Layer

Advances in Condensed Matter Physics, 2022-04, Vol.2022, p.1-7

2022

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Superconducting proximity effect in NiBi3-Ni-NiBi3 trilayer system with sharp superconductor-ferromagnet boundaries

Journal of applied physics, 2016-02, Vol.119 (6)

2016

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Progressive magnetic softening of ferromagnetic layers in multilayer ferromagnet-nonmagnet systems and the role of granularity

Journal of applied physics, 2017-06, Vol.121 (21)

2017

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Resonant x-ray reflectivity study of partial decomposed boron nitride thin films using Indus-1 synchrotron

AIP Conference Proceedings, 2014, Vol.1591 (1), p.929

2014

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X-ray multilayer optics for Indus synchrotrons application

AIP Conference Proceedings, 2015, Vol.1665 (1)

2015

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Standing wave hard X-ray photoemission study of the structure of the interfaces in Ta/Co2FeAl/MgO multilayer

Applied surface science, 2022-07, Vol.590, p.153063, Article 153063

2022

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Chemical selective microstructural analysis of thin film using resonant x-ray reflectivity

Journal of applied physics, 2013-07, Vol.114 (2)

2013

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Effect of thickness and temperature on interfacial interaction between Cr and Ni nanolayers: An exchange bias study

Journal of magnetism and magnetic materials, 2024-02, Vol.591, p.171776, Article 171776

2024

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Structural, vibrational, magnetic, and X-ray absorption study on (Li, Zn)-doped NiO nanoparticles

Journal of materials science. Materials in electronics, 2024-08, Vol.35 (23), p.1571, Article 1571

2024

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Structural characterization of Au/Cr bilayer thin films using combined X‐ray reflectivity and grazing incidence X‐ray fluorescence measurements

Surface and interface analysis, 2022-10, Vol.54 (10), p.1032-1040

2022

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Element-specific structural analysis of Si/B 4 C using resonant X-ray reflectivity. Corrigendum

Journal of applied crystallography, 2016-04, Vol.49 (2), p.715-716

2016

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Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity. Corrigendum

Journal of applied crystallography, 2016-04, Vol.49 (2), p.715-716

2016

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Sub-nanograin metal based high efficiency multilayer reflective optics for high energies

RSC advances, 2021-08, Vol.11 (45), p.2897-2815

2021

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Element-specific structural analysis of Si/B 4 C using resonant X-ray reflectivity

Journal of applied crystallography, 2015-06, Vol.48 (3), p.786-796

2015

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Approach to combine structural with chemical composition profiles using resonant X-ray scattering

Journal of applied crystallography, 2013-12, Vol.46 (6), p.1569-1575

2013

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Fabrication and Evaluation of Large Area Mo/Si Soft X-Ray Multilayer Mirrors at Indus SR Facilities

Advances in optical technologies, 2012, Vol.2012 (2012), p.1-8

2012

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Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials

Scientific reports, 2018-10, Vol.8 (1), p.15724-9, Article 15724

2018

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Correction: Corrigendum: Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution

Scientific reports, 2016-07, Vol.6 (1), Article 27322

2016

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Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity

Journal of applied crystallography, 2015-06, Vol.48 (3), p.786-796

2015

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Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution

Scientific reports, 2015-03, Vol.5 (1), p.8618-8618, Article 8618

2015

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Multilayer mirror-based soft x-ray polarimeter for astronomical observations

Journal of astronomical telescopes, instruments, and systems, 2018-01, Vol.4 (1), p.1

Panini, Singam S.

2018

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Comparative Study on the Crystallite Size and Bandgap of Perovskite by Diverse Methods

A First-Principles Study of Gas Molecule Adsorption on Carbon-, Nitrogen-, and Oxygen-Doped Two-Dimensional Borophene

Study of the Effect of Quenching on Microstructural and Magnetic Properties of Cu-Doped Mg-Ferrite

Evolution of Microstructure during Rapid Solidification of SiC under High Pressure

AlGaN/GaN Heterostructure Schottky Barrier Diodes with Graded Barrier Layer

Superconducting proximity effect in NiBi3-Ni-NiBi3 trilayer system with sharp superconductor-ferromagnet boundaries

Progressive magnetic softening of ferromagnetic layers in multilayer ferromagnet-nonmagnet systems and the role of granularity

Resonant x-ray reflectivity study of partial decomposed boron nitride thin films using Indus-1 synchrotron

X-ray multilayer optics for Indus synchrotrons application

Standing wave hard X-ray photoemission study of the structure of the interfaces in Ta/Co2FeAl/MgO multilayer

Chemical selective microstructural analysis of thin film using resonant x-ray reflectivity

Effect of thickness and temperature on interfacial interaction between Cr and Ni nanolayers: An exchange bias study

Structural, vibrational, magnetic, and X-ray absorption study on (Li, Zn)-doped NiO nanoparticles

Structural characterization of Au/Cr bilayer thin films using combined X‐ray reflectivity and grazing incidence X‐ray fluorescence measurements

Element-specific structural analysis of Si/B 4 C using resonant X-ray reflectivity. Corrigendum

Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity. Corrigendum

Sub-nanograin metal based high efficiency multilayer reflective optics for high energies

Element-specific structural analysis of Si/B 4 C using resonant X-ray reflectivity

Approach to combine structural with chemical composition profiles using resonant X-ray scattering

Fabrication and Evaluation of Large Area Mo/Si Soft X-Ray Multilayer Mirrors at Indus SR Facilities

Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials

Correction: Corrigendum: Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution

Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity

Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution

Multilayer mirror-based soft x-ray polarimeter for astronomical observations

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