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IEEE communications letters, 2009-09, Vol.13 (9), p.697-699
2009
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Electronics letters, 2015-01, Vol.51 (1), p.50-52
2015
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Electronics letters, 2014-10, Vol.50 (22), p.1602-1604
2014
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IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.2091-2102
2009
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Electronics letters, 2013-12, Vol.49 (25), p.1617-1618
2013
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IEEE transactions on reliability, 2009-03, Vol.58 (1), p.193-201
2009
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IEEE transactions on nuclear science, 2008-06, Vol.55 (3), p.1700-1707
2008
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IEEE transactions on nuclear science, 2007-08, Vol.54 (4), p.957-964
2007
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Microelectronics and reliability, 2020-10, Vol.113, Article 113724
2020
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Microelectronics and reliability, 2020-10, Vol.113, p.113724, Article 113724
2020
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Microelectronics and reliability, 2017-05, Vol.72, p.85-89
2017
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Integration (Amsterdam), 2009-02, Vol.42 (2), p.128-136
2009
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Microelectronics and reliability, 2019-11, Vol.102, p.113494, Article 113494
2019
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Microelectronics and reliability, 2016-08, Vol.63, p.314-318
2016
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Electronics letters, 2012-09, Vol.48 (20), p.1258-1260
2012
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Electronics letters, 2012-11, Vol.48 (23), p.1470-1472
2012
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Electronics letters, 2011-11, Vol.47 (23), p.1272-1273
2011
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Computer communications, 2014-09, Vol.50, p.110-118
2014
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Microelectronics and reliability, 2014-01, Vol.54 (1), p.338-340
2014
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Microelectronics and reliability, 2014-01, Vol.54 (1), p.335-337
2014
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Broadband Communications, Networks, and Systems, p.163-173
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Transactions on emerging telecommunications technologies, 2012-04, Vol.23 (3), p.227-233
2012
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Electronics letters, 2010-12, Vol.46 (25), p.1677-1679
2010
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Optical switching and networking, 2011-07, Vol.8 (3), p.131-138
2011
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Microelectronics and reliability, 2011-03, Vol.51 (3), p.703-710
2011
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