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Improvement of electrical properties of ITO thin films by melt-free ultra-short laser crystallization

Journal of physics. D, Applied physics, 2021-05, Vol.54 (18), p.185103

2021

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Fabrication and characterisation of GaAs nanopillars using nanosphere lithography and metal assisted chemical etching

RSC advances, 2016-01, Vol.6 (36), p.3468-3473

2016

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Characterization of the carrot defect in 4H-SiC epitaxial layers

Journal of crystal growth, 2010-05, Vol.312 (11), p.1828-1837

2010

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Non-destructive laboratory-based X-ray diffraction mapping of warpage in Si die embedded in IC packages

Microelectronic engineering, 2014-04, Vol.117, p.48-56

2014

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Influence of substrate metal alloy type on the properties of hydroxyapatite coatings deposited using a novel ambient temperature deposition technique

Journal of biomedical materials research. Part A, 2014-03, Vol.102 (3), p.871-879

2014

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In-situ XRD study on the effects of stress relaxation and phase transformation heat treatments on mechanical and microstructural behaviour of additively manufactured Ti-6Al-4V

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2021-07, Vol.819, p.141534, Article 141534

2021

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Structural and optical properties of post-annealed atomic-layer-deposited HfO2 thin films on GaAs

Thin solid films, 2014-10, Vol.569, p.104-112

2014

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Soft x-ray spectroscopic investigation of Zn doped CuCl produced by pulsed dc magnetron sputtering

Journal of physics. Condensed matter, 2013-07, Vol.25 (28), p.285501-285501

2013

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Temperature dependent photoluminescence of nanocrystalline γ-CuCl hybrid films

Thin solid films, 2014-08, Vol.564, p.104-109

2014

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Hybrid organic–inorganic spin-on-glass CuCl films for optoelectronic applications

Journal of physics. D, Applied physics, 2009-11, Vol.42 (22), p.225307-225307 (5)

2009

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Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge

Journal of crystal growth, 2009-11, Vol.311 (22), p.4619-4627

2009

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Evaluation of conduction mechanism and electronic parameters for Au/organic―inorganic CuCl hybrid film/ITO structures

Semiconductor science and technology, 2011-09, Vol.26 (9), p.95021-9

2011

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Combined use of three-dimensional X-ray diffraction imaging and micro-Raman spectroscopy for the non-destructive evaluation of plasma arc induced damage on silicon wafers

Microelectronic engineering, 2011, Vol.88 (1), p.64-71

2011

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Electroluminescence of γ-CuBr thin films via vacuum evaporation depositon

Journal of physics. D, Applied physics, 2010-04, Vol.43 (16), p.165101

2010

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Multi-technique characterisation of MOVPE-grown GaAs on Si

Microelectronic engineering, 2011-04, Vol.88 (4), p.472-475

2011

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Evaluation and comparison of hydroxyapatite coatings deposited using both thermal and non-thermal techniques

Surface & coatings technology, 2013-07, Vol.226, p.82-91

2013

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Nondestructive X‐ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages

Journal of applied crystallography, 2017-04, Vol.50 (2), p.547-554

2017

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Impact on structural, optical and electrical properties of CuCl by incorporation of Zn for n-type doping

Journal of crystal growth, 2006-01, Vol.287 (1), p.139-144

2006

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Encapsulation of the heteroepitaxial growth of wide band gap γ-CuCl on silicon substrates

Journal of crystal growth, 2006-01, Vol.287 (1), p.112-117

2006

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Evaluation of the chemical, electronic and optoelectronic properties of γ-CuCl thin films and their fabrication on Si substrates

Journal of physics. D, Applied physics, 2007-06, Vol.40 (11), p.3461-3467

2007

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Growth and characterisation of wide-bandgap, I-VII optoelectronic materials on silicon

Journal of materials science. Materials in electronics, 2005-07, Vol.16 (7), p.415-419

2005

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Evaluation of the optical properties of epitaxial lateral overgrown gallium nitride on sapphire and the role of optically active metastable defects using cathodoluminescence and photoluminescence spectroscopy

Thin solid films, 2005-02, Vol.473 (2), p.308-314

2005

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Optical properties of CuCl films on silicon substrates

Physica Status Solidi (b), 2008-12, Vol.245 (12), p.2808-2814

2008

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Interaction of SF6 and O2 plasma with porous poly phenyl methyl silsesquioxane low-κ films

Journal of physics. D, Applied physics, 2015-04, Vol.48 (12)

2015

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B-Spline X-Ray Diffraction Imaging — Rapid non-destructive measurement of die warpage in ball grid array packages

Microelectronics and reliability, 2016-04, Vol.59, p.108-116

2016

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1 – 25 von 1.191

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Improvement of electrical properties of ITO thin films by melt-free ultra-short laser crystallization

Fabrication and characterisation of GaAs nanopillars using nanosphere lithography and metal assisted chemical etching

Characterization of the carrot defect in 4H-SiC epitaxial layers

Non-destructive laboratory-based X-ray diffraction mapping of warpage in Si die embedded in IC packages

Influence of substrate metal alloy type on the properties of hydroxyapatite coatings deposited using a novel ambient temperature deposition technique

In-situ XRD study on the effects of stress relaxation and phase transformation heat treatments on mechanical and microstructural behaviour of additively manufactured Ti-6Al-4V

Structural and optical properties of post-annealed atomic-layer-deposited HfO2 thin films on GaAs

Soft x-ray spectroscopic investigation of Zn doped CuCl produced by pulsed dc magnetron sputtering

Temperature dependent photoluminescence of nanocrystalline γ-CuCl hybrid films

Hybrid organic–inorganic spin-on-glass CuCl films for optoelectronic applications

Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge

Evaluation of conduction mechanism and electronic parameters for Au/organic―inorganic CuCl hybrid film/ITO structures

Combined use of three-dimensional X-ray diffraction imaging and micro-Raman spectroscopy for the non-destructive evaluation of plasma arc induced damage on silicon wafers

Electroluminescence of γ-CuBr thin films via vacuum evaporation depositon

Multi-technique characterisation of MOVPE-grown GaAs on Si

Evaluation and comparison of hydroxyapatite coatings deposited using both thermal and non-thermal techniques

Nondestructive X‐ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages

Impact on structural, optical and electrical properties of CuCl by incorporation of Zn for n-type doping

Encapsulation of the heteroepitaxial growth of wide band gap γ-CuCl on silicon substrates

Evaluation of the chemical, electronic and optoelectronic properties of γ-CuCl thin films and their fabrication on Si substrates

Growth and characterisation of wide-bandgap, I-VII optoelectronic materials on silicon

Evaluation of the optical properties of epitaxial lateral overgrown gallium nitride on sapphire and the role of optically active metastable defects using cathodoluminescence and photoluminescence spectroscopy

Optical properties of CuCl films on silicon substrates

Interaction of SF6 and O2 plasma with porous poly phenyl methyl silsesquioxane low-κ films

B-Spline X-Ray Diffraction Imaging — Rapid non-destructive measurement of die warpage in ball grid array packages

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