UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 972

Sortiert nach

Effect of film growth rate and thickness on properties of Ge/GaAs(100) thin films

Thin solid films, 2014-01, Vol.550, p.715-722

2014

Volltextzugriff (PDF)

Identification of hydrogeological windows based on large-scale mapping of the geological and hydrogeological conditions in Moscow

Water resources, 2016-12, Vol.43 (7), p.1012-1022

2016

Volltextzugriff (PDF)

Use of Anaferon (Pediatric Formulation) for Prophylaxis of Acute Respiratory Viral Infections in Preschool Children

Bulletin of experimental biology and medicine, 2009-08, Vol.148 (2), p.266-269

2009

Volltextzugriff (PDF)

Electroreflectance study of macroporous silicon surfaces

Applied surface science, 2001-03, Vol.172 (3), p.214-219

2001

Volltextzugriff (PDF)

Electroreflectance of porous layers obtained by stain etching of laser modified silicon

Journal of physics. D, Applied physics, 2000-11, Vol.33 (22), p.2875-2879, Article 2875

2000

Volltextzugriff (PDF)

Growth of III–V semiconductor layers on Si patterned substrates

Thin solid films, 1998-12, Vol.336 (1), p.63-68

1998

Volltextzugriff (PDF)

Fabrication, properties and application of Ge-on-GaAs thin nanoheterogeneous films

Tekhnologii͡a︡ i konstruirovanie v ėlektronnoĭ apparature, 2014-08 (4), p.39-44

2014

Volltextzugriff (PDF)

Auger spectroscopic investigation of a-C:H films on silicon microrelief substrates

Carbon (New York), 1998, Vol.36 (5), p.513-515

1998

Volltextzugriff (PDF)

Probe microanalysis investigation and electroreflectance spectroscopy of Hg1-xCdxTe PLD films on silicon patterned substrates

Thin solid films, 2000-12, Vol.380 (1-2), p.256-258

2000

Volltextzugriff (PDF)

Effect of the Si wafer pretreatment on the patterned substrate morphology and growth of Hg1-xCdxTe PLD films

Materials science & engineering. B, Solid-state materials for advanced technology, 2000, Vol.71 (1-3), p.288-291

2000

Volltextzugriff (PDF)

Physical properties of C 60 fullerene nanostructures

Materialwissenschaft und Werkstofftechnik, 2013-03, Vol.44 (2-3), p.144-149

2013

Volltextzugriff (PDF)

Physical properties of C60 fullerene nanostructures

Materialwissenschaft und Werkstofftechnik, 2013-02, Vol.44 (2-3), p.144-149

2013

Volltextzugriff (PDF)

Physical properties of C60 fullerene nanostructures; Physikalische Eigenschaften von C60-fulleren-Nanostrukturen

Materialwissenschaft und Werkstofftechnik, 2013-02, Vol.44 (2-3), p.144

2013

Volltextzugriff (PDF)

The influence of hydrogen plasma on the electroreflectance spectrum and the spectrum of electron states of porous silicon

Semiconductors (Woodbury, N.Y.), 2003-01, Vol.37 (1), p.103-107

2003

Volltextzugriff (PDF)

Characterization of Different Carbon Nanomaterials Promising for Biomedical and Sensor Applications by the Wetting Method

Powder metallurgy and metal ceramics, 2003-01, Vol.42 (1-2), p.1-8

Ostrovskaya, Lidiya Yu

2003

Volltextzugriff (PDF)

Spectroscopy of electroreflection, the electron band structure, and the mechanism of visible photoluminescence of anisotropically etched silicon

Journal of experimental and theoretical physics, 1999-11, Vol.89 (5), p.948-954

1999

Volltextzugriff (PDF)

UV absorption of RbAg4I5-RE (Sm, Yb) thin-film systems

Physics of the solid state, 1999-02, Vol.41 (2), p.192-196

1999

Volltextzugriff (PDF)

The influence of carbon on the properties of Si/SiGe heterostructures

Semiconductors (Woodbury, N.Y.), 2003-04, Vol.37 (4), p.443-447

2003

Volltextzugriff (PDF)

Microwave-stimulated relaxation of internal strains in GaAs-based device heterostructures

Technical physics letters, 2002-02, Vol.28 (2), p.154-156

2002

Volltextzugriff (PDF)

Effect of microwave irradiation on the resistance of Au-TiB{sub x}-Ge-Au-n-n{sup +}-n{sup ++}-GaAs(InP) ohmic contacts

Semiconductors (Woodbury, N.Y.), 2012-04, Vol.46 (4)

2012

Volltextzugriff (PDF)

Effect of microwave irradiation on the resistance of Au-TiB x -Ge-Au-n-n +-n ++-GaAs(InP) ohmic contacts

Semiconductors (Woodbury, N.Y.), 2012-04, Vol.46 (4), p.541-544

2012

Volltextzugriff (PDF)

Analysis of the fundamental absorption edge in amorphous hydrogenated carbon films

Technical physics letters, 1999-12, Vol.25 (12), p.1006-1007

1999

Volltextzugriff (PDF)

Effect of microwave irradiation on the resistance of Au-TiBx-Ge-Au-n-n+-n++-GaAs(InP) ohmic contacts

Semiconductors (Woodbury, N.Y.), 2012, Vol.46 (4), p.541-544

2012

Volltextzugriff (PDF)

Mechanism of misfit dislocation network formation in the heteroepitaxial system GeGaAs (001)

Physica status solidi. A, Applied research, 1985-12, Vol.92 (2), p.379-390

1985

Volltextzugriff (PDF)

Physical properties of C sub(60) fullerene nanostructures

Materialwissenschaft und Werkstofftechnik, 2013-03, Vol.44 (2-3), p.144-149

2013

Volltextzugriff (PDF)

1 – 25 von 972

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(827)
Mit Volltextzugriff
(538)

Publikationsform

1 weiteren anzeigen...

Weniger anzeigen...

Sprache

3 weitere anzeigen...

Weniger anzeigen...

Erscheinungsjahr

n.n

Thema

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 90 Tagen
(2)

Menü

Weitere Dienste

Einstellungen

Effect of film growth rate and thickness on properties of Ge/GaAs(100) thin films

Identification of hydrogeological windows based on large-scale mapping of the geological and hydrogeological conditions in Moscow

Use of Anaferon (Pediatric Formulation) for Prophylaxis of Acute Respiratory Viral Infections in Preschool Children

Electroreflectance study of macroporous silicon surfaces

Electroreflectance of porous layers obtained by stain etching of laser modified silicon

Growth of III–V semiconductor layers on Si patterned substrates

Fabrication, properties and application of Ge-on-GaAs thin nanoheterogeneous films

Auger spectroscopic investigation of a-C:H films on silicon microrelief substrates

Probe microanalysis investigation and electroreflectance spectroscopy of Hg1-xCdxTe PLD films on silicon patterned substrates

Effect of the Si wafer pretreatment on the patterned substrate morphology and growth of Hg1-xCdxTe PLD films

Physical properties of C 60 fullerene nanostructures

Physical properties of C60 fullerene nanostructures

Physical properties of C60 fullerene nanostructures; Physikalische Eigenschaften von C60-fulleren-Nanostrukturen

The influence of hydrogen plasma on the electroreflectance spectrum and the spectrum of electron states of porous silicon

Characterization of Different Carbon Nanomaterials Promising for Biomedical and Sensor Applications by the Wetting Method

Spectroscopy of electroreflection, the electron band structure, and the mechanism of visible photoluminescence of anisotropically etched silicon

UV absorption of RbAg4I5-RE (Sm, Yb) thin-film systems

The influence of carbon on the properties of Si/SiGe heterostructures

Microwave-stimulated relaxation of internal strains in GaAs-based device heterostructures

Effect of microwave irradiation on the resistance of Au-TiB{sub x}-Ge-Au-n-n{sup +}-n{sup ++}-GaAs(InP) ohmic contacts

Effect of microwave irradiation on the resistance of Au-TiB x -Ge-Au-n-n +-n ++-GaAs(InP) ohmic contacts

Analysis of the fundamental absorption edge in amorphous hydrogenated carbon films

Effect of microwave irradiation on the resistance of Au-TiBx-Ge-Au-n-n+-n++-GaAs(InP) ohmic contacts

Mechanism of misfit dislocation network formation in the heteroepitaxial system GeGaAs (001)

Physical properties of C sub(60) fullerene nanostructures

Suchergebnisse filtern