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Clinician Perspectives on Implementing Video Visits in Home-Based Palliative Care

Palliative medicine reports, 2020-10, Vol.1 (1), p.221-226

2020

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Symptom Burden Is Lower in Asian and Pacific Islander and Black Men Admitted to Home-Based Palliative Care in an Integrated Health Care System

Journal of palliative medicine, 2022-10, Vol.25 (10), p.1551-1556

2022

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Performance of Patient-Reported Outcome Measures in a Large Pragmatic Trial of Home-Based Palliative Care (HomePal): Methodological and Practical Considerations for Embedded Patient-Centered Design

Journal of palliative medicine, 2022-04, Vol.25 (4), p.620

2022

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Protocol for a Noninferiority Comparative Effectiveness Trial of Home-Based Palliative Care (HomePal)

Journal of palliative medicine, 2019-09, Vol.22 (S1), p.S-20-S-33

2019

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Comment on ‘‘Evaluation of the minority carrier diffusion length and edge surface-recombination velocity in GaAs p / n solar cells’’ [J. Appl. Phys. 72 , 2919 (1992)]

Journal of applied physics, 1993-09, Vol.74 (5), p.3620-3621

Luke, Keung L.

1993

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Determination of diffusion length in samples of diffusion-length size or smaller and with arbitrary top and back surface recombination velocities

Journal of applied physics, 2001-10, Vol.90 (7), p.3413-3418

Luke, Keung L.

2001

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Evaluation of diffusion length from a planar-collector-geometry electron-beam-induced current profile

Journal of applied physics, 1996-11, Vol.80 (10), p.5775-5785

Luke, Keung L.

1996

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A Chemical/Microwave Technique for the Measurement of Bulk Minority Carrier Lifetime in Silicon Wafers

Journal of the Electrochemical Society, 1988-04, Vol.135 (4), p.957-961

1988

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An inexpensive, versatile experiment for teaching computer-aided experimentation

American journal of physics, 1989-08, Vol.57 (8), p.741-746

1989

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Quantitative interpretation of electron-beam-induced current grain boundary contrast profiles with application to silicon

Journal of applied physics, 1998-11, Vol.84 (10), p.5473-5481

1998

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A unified description of two voltage-varying methods for evaluating surface recombination velocity from electron-beam-induced current: Application to normal- and planar-collector configurations

Journal of applied physics, 1996-03, Vol.79 (6), p.3058-3070

Luke, Keung L.

1996

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Choice of a range-energy relationship for the analysis of electron-beam-induced-current line scans

Journal of applied physics, 1994-07, Vol.76 (2), p.1081-1091

Luke, Keung L.

1994

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Analysis of the interaction of a laser pulse with a silicon wafer - Determination of bulk lifetime and surface recombination velocity

Journal of applied physics, 1987-03, Vol.61 (6), p.2282-2293

1987

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The effect of beamwidth on the analysis of electron-beam-induced current line scans

Journal of applied physics, 1995-04, Vol.77 (7), p.3257-3266

Luke, Keung L.

1995

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The evaluation of surface recombination velocity from normal-collector geometry electron-beam-induced current line scans

Journal of applied physics, 1994-02, Vol.75 (3), p.1623-1631

Luke, Keung L.

1994

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Comments on ‘‘Measurements of minority-carrier diffusion length in n -CuInSe2 by electron-beam-induced current method’’ [J. Appl. Phys. 6 6 , 5412 (1989)]

Journal of applied physics, 1990-10, Vol.68 (7), p.3759-3759

Luke, Keung L.

1990

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Contribution to the theory of aerosol formation in an inert gas atmosphere. Pre-nucleation kinetics

Journal of colloid and interface science, 1966-01, Vol.22 (3), p.214-220

Luke, Keung P

1966

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Comments on the Work Function of Metal Droplets

AIAA journal, 1966-02, Vol.4 (2), p.382-383

LUKE, KEUNG P

1966

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Analysis of the electron-beam-induced current of a polycrystalline p-n junction when the diffusion lengths of the material on either side of a grain boundary differ

Journal of applied physics, 1984-06, Vol.55 (12), p.4275-4279

1984

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Surface Physics and Miller Indices

American journal of physics, 1973-05, Vol.41 (5), p.735-736

Luke, Keung

1973

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Quantification of the effects of generation volume, surface recombination velocity, and diffusion length on the electron-beam-induced current and its derivative Determination of diffusion lengths in the low micron and submicron ranges

Journal of applied physics, 1985-03, Vol.57 (6), p.1978-1984

1985

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Laboratory investigation of free and driven oscillations using a R L C circuit

American journal of physics, 1975-07, Vol.43 (7), p.610-614

Luke, Keung L.

1975

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An exact, closed-form expression of the integral chord-length distribution for the calculation of single-event upsets induced by cosmic rays

Journal of applied physics, 1988-11, Vol.64 (10), p.5132-5137

1988

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Analysis of the interaction of an electron beam with back surface field solar cells

Journal of applied physics, 1983-07, Vol.54 (7), p.3938-3942

1983

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Characterization of the heavily doped emitter and junction regions of silicon solar cells using an electron beam

Journal of applied physics, 1986-10, Vol.60 (7), p.2589-2595

1986

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Clinician Perspectives on Implementing Video Visits in Home-Based Palliative Care

Symptom Burden Is Lower in Asian and Pacific Islander and Black Men Admitted to Home-Based Palliative Care in an Integrated Health Care System

Performance of Patient-Reported Outcome Measures in a Large Pragmatic Trial of Home-Based Palliative Care (HomePal): Methodological and Practical Considerations for Embedded Patient-Centered Design

Protocol for a Noninferiority Comparative Effectiveness Trial of Home-Based Palliative Care (HomePal)

Comment on ‘‘Evaluation of the minority carrier diffusion length and edge surface-recombination velocity in GaAs p / n solar cells’’ [J. Appl. Phys. 72 , 2919 (1992)]

Determination of diffusion length in samples of diffusion-length size or smaller and with arbitrary top and back surface recombination velocities

Evaluation of diffusion length from a planar-collector-geometry electron-beam-induced current profile

A Chemical/Microwave Technique for the Measurement of Bulk Minority Carrier Lifetime in Silicon Wafers

An inexpensive, versatile experiment for teaching computer-aided experimentation

Quantitative interpretation of electron-beam-induced current grain boundary contrast profiles with application to silicon

A unified description of two voltage-varying methods for evaluating surface recombination velocity from electron-beam-induced current: Application to normal- and planar-collector configurations

Choice of a range-energy relationship for the analysis of electron-beam-induced-current line scans

Analysis of the interaction of a laser pulse with a silicon wafer - Determination of bulk lifetime and surface recombination velocity

The effect of beamwidth on the analysis of electron-beam-induced current line scans

The evaluation of surface recombination velocity from normal-collector geometry electron-beam-induced current line scans

Comments on ‘‘Measurements of minority-carrier diffusion length in n -CuInSe2 by electron-beam-induced current method’’ [J. Appl. Phys. 6 6 , 5412 (1989)]

Contribution to the theory of aerosol formation in an inert gas atmosphere. Pre-nucleation kinetics

Comments on the Work Function of Metal Droplets

Analysis of the electron-beam-induced current of a polycrystalline p-n junction when the diffusion lengths of the material on either side of a grain boundary differ

Surface Physics and Miller Indices

Quantification of the effects of generation volume, surface recombination velocity, and diffusion length on the electron-beam-induced current and its derivative Determination of diffusion lengths in the low micron and submicron ranges

Laboratory investigation of free and driven oscillations using a R L C circuit

An exact, closed-form expression of the integral chord-length distribution for the calculation of single-event upsets induced by cosmic rays

Analysis of the interaction of an electron beam with back surface field solar cells

Characterization of the heavily doped emitter and junction regions of silicon solar cells using an electron beam

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