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SiGe-Channel Confinement Effects for Short-Channel PFETs With Nonbandedge Gate Workfunctions

IEEE electron device letters, 2007-08, Vol.28 (8), p.719-721

2007

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A critical re-examination of body-bias on the soft error rate and single-event latch-up in automotive SRAMs

2017 IEEE International Reliability Physics Symposium (IRPS), 2017, p.2E-2.1-2E-2.5

2017

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Stress-Induced Redistribution of Point Defects in Silicon Device Structures

Solid state phenomena, 2002-01, Vol.82-84, p.225-230

2002

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First-ever high-performance, low-power 32-bit microcontrollers with embedded nanocrystal flash and enhanced EEPROM memories

2012 IEEE International Conference on IC Design & Technology, 2012, p.1-3

2012

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The Effect of Intrinsic Point Defects upon Dislocation Motion in Silicon

Solid state phenomena, 2002-01, Vol.82-84, p.219-224

2002

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Highly Optimized Nanocrystal-Based Split Gate Flash for High Performance and Low Power Microcontroller Applications

2011 3rd IEEE International Memory Workshop (IMW), 2011, p.1-4

2011

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Multi-Layer Model for Stressor Film Deposition

2006 International Conference on Simulation of Semiconductor Processes and Devices, 2006, p.123-126

2006

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Modeling and Simulation of Poly-Space Effects in Uniaxially-Strained Etch Stop Layer Stressors

2007 IEEE International SOI Conference, 2007, p.25-26

2007

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1-D and 2-D Geometry Effects in Uniaxially-Strained Dual Etch Stop Layer Stressor Integrations

2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers, 2006, p.62-63

2006

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Stress Sensitivity of PMOSFET Under High Mechanical Stress

2006 International Conference on Simulation of Semiconductor Processes and Devices, 2006, p.119-122

2006

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An Embedded Silicon-Carbon S/D Stressor CMOS Integration on SOI with Enhanced Carbon Incorporation by Laser Spike Annealing

2007 IEEE International SOI Conference, 2007, p.17-18

2007

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Optimization of Dual-ESL Stressor Geometry Effects for High Performance 65nm SOI Transistors

2006 IEEE international SOI Conferencee Proceedings, 2006, p.19-20

2006

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A predictive semi-analytical threshold voltage model for deep-submicron MOSFET's

Proceedings 1998 Hong Kong Electron Devices Meeting (Cat. No.98TH8368), 1998, p.114-117

1998

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The Impact of Point Defects on Stress-Induced Dislocation Generation in Silicon

MRS proceedings, 2000, Vol.610, Article B6.13

2000

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High Performance Nanocrystal Based Embedded Flash Microcontrollers with Exceptional Endurance and Nanocrystal Scaling Capability

2012 4th IEEE International Memory Workshop, 2012, p.1-4

2012

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16Mb Split Gate Flash Memory with Improved Process Window

2009 IEEE International Memory Workshop, 2009, p.1-2

2009

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Single Metal Gate on High-k Gate Stacks for 45nm Low Power CMOS

2006 International Electron Devices Meeting, 2006, p.1-4

2006

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Conical refraction: fundamentals and applications

Laser & photonics reviews, 2016-09, Vol.10 (5), p.750-771

2016

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Influence of plasma induced damage during active etch on silicon defect generation

2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479), 2000, p.61-64

2000

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Wave-vector and polarization dependence of conical refraction

Optics express, 2013-02, Vol.21 (4), p.4503-4511

2013

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Blue-detuned optical ring trap for Bose-Einstein condensates based on conical refraction

Optics express, 2015-01, Vol.23 (2), p.1638-1650

2015

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Polarization tailored novel vector beams based on conical refraction

Optics express, 2015-03, Vol.23 (5), p.5704-5715

2015

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Free-space optical polarization demultiplexing and multiplexing by means of conical refraction

Optics letters, 2012-10, Vol.37 (20), p.4197

2012

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Super-Gaussian conical refraction beam

Optics letters, 2014-08, Vol.39 (15), p.4349

2014

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Generating a three-dimensional dark focus from a single conically refracted light beam

Optics letters, 2013-11, Vol.38 (22), p.4648

2013

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SiGe-Channel Confinement Effects for Short-Channel PFETs With Nonbandedge Gate Workfunctions

A critical re-examination of body-bias on the soft error rate and single-event latch-up in automotive SRAMs

Stress-Induced Redistribution of Point Defects in Silicon Device Structures

First-ever high-performance, low-power 32-bit microcontrollers with embedded nanocrystal flash and enhanced EEPROM memories

The Effect of Intrinsic Point Defects upon Dislocation Motion in Silicon

Highly Optimized Nanocrystal-Based Split Gate Flash for High Performance and Low Power Microcontroller Applications

Multi-Layer Model for Stressor Film Deposition

Modeling and Simulation of Poly-Space Effects in Uniaxially-Strained Etch Stop Layer Stressors

1-D and 2-D Geometry Effects in Uniaxially-Strained Dual Etch Stop Layer Stressor Integrations

Stress Sensitivity of PMOSFET Under High Mechanical Stress

An Embedded Silicon-Carbon S/D Stressor CMOS Integration on SOI with Enhanced Carbon Incorporation by Laser Spike Annealing

Optimization of Dual-ESL Stressor Geometry Effects for High Performance 65nm SOI Transistors

A predictive semi-analytical threshold voltage model for deep-submicron MOSFET's

The Impact of Point Defects on Stress-Induced Dislocation Generation in Silicon

High Performance Nanocrystal Based Embedded Flash Microcontrollers with Exceptional Endurance and Nanocrystal Scaling Capability

16Mb Split Gate Flash Memory with Improved Process Window

Single Metal Gate on High-k Gate Stacks for 45nm Low Power CMOS

Conical refraction: fundamentals and applications

Influence of plasma induced damage during active etch on silicon defect generation

Wave-vector and polarization dependence of conical refraction

Blue-detuned optical ring trap for Bose-Einstein condensates based on conical refraction

Polarization tailored novel vector beams based on conical refraction

Free-space optical polarization demultiplexing and multiplexing by means of conical refraction

Super-Gaussian conical refraction beam

Generating a three-dimensional dark focus from a single conically refracted light beam

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