UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

In the Beginning – A Quick Look at the Origins of Quantitative Electron Microprobe Analysis and the Need for Monte Carlo Modeling

Microscopy and microanalysis, 2023-07, Vol.29 (Supplement_1), p.478-479

Lifshin, Eric

2023

Volltextzugriff (PDF)

X-ray Characterization of Materials

Lifshin, Eric

1. Aufl., 2008

Volltextzugriff (PDF)

Development of a New Quantitative X-Ray Microanalysis Method for Electron Microscopy

Microscopy and microanalysis, 2010-12, Vol.16 (6), p.821-830

2010

Volltextzugriff (PDF)

Secondary Electrons in EUV Lithography

Journal of Photopolymer Science and Technology, 2013/06/25, Vol.26(5), pp.625-634

2013

Volltextzugriff (PDF)

An Evaluation of Image Quality Metrics for Scanning Electron Microscopy

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.572-573

2016

Volltextzugriff (PDF)

Improving Scanning Electron Microscope Resolution for Near Planar Samples Through the Use of Image Restoration

Microscopy and microanalysis, 2014-02, Vol.20 (1), p.78-89

2014

Volltextzugriff (PDF)

Measurement of the Electron Beam Point Spread Function (PSF) in a Scanning Electron Microscope (SEM)

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.699-700

2015

Volltextzugriff (PDF)

Scanning Electron Microscope Point Spread Function Determination Through the Use of Particle Dispersions

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.124-125

2017

Volltextzugriff (PDF)

Concise Encyclopedia of Materials Characterization

1, 1992

Volltextzugriff (PDF)

X-ray characterization of materials

Lifshin, Eric

1, 1999

Volltextzugriff (PDF)

Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope—Part II: Effect on Image Restoration Quality

Microscopy and microanalysis, 2019-10, Vol.25 (5), p.1183-1194

2019

Volltextzugriff (PDF)

Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope—Part I: Effect on the Point Spread Function

Microscopy and microanalysis, 2019-10, Vol.25 (5), p.1167-1182

2019

Volltextzugriff (PDF)

The Determination and Application of the Point Spread Function in the Scanning Electron Microscope

Microscopy and microanalysis, 2018-08, Vol.24 (4), p.396-405

2018

Volltextzugriff (PDF)

Sidewall Texture and Microstructure of iPVD Copper Seed in Narrow Damascene Trenches

Journal of the Electrochemical Society, 2013-01, Vol.160 (12), p.D3139-D3144

2013

Volltextzugriff (PDF)

Some Thoughts on Point Spread Functions, Resolution and Image Quality

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.600-601

2018

Volltextzugriff (PDF)

Visualizing Astigmatism in the SEM Electron Probe

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.604-605

2018

Volltextzugriff (PDF)

Viability of Point Spread Function Deconvolution for SEM

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.126-127

2017

Volltextzugriff (PDF)

WinX-Ray: A New Monte Carlo Program for the Simulation of X-Ray and Charging Materials

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.1498-1499

2002

Volltextzugriff (PDF)

Win X-ray: A New Monte Carlo Program that Computes X-ray Spectra Obtained with a Scanning Electron Microscope

Microscopy and microanalysis, 2006-02, Vol.12 (1), p.49-64

2006

Volltextzugriff (PDF)

Correlating surface segregation and microstructural evolution of electrochemically deposited copper

Applied physics letters, 2012-09, Vol.101 (10)

2012

Volltextzugriff (PDF)

Win X-ray, The Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.32-33

2003

Volltextzugriff (PDF)

Improved SEM Image Resolution Through the Use of Image Restoration Techniques

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.12-13

2014

Volltextzugriff (PDF)

Improved Low Voltage SEM Image Resolution Through the Use of Image Restoration Techniques

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.33-34

2015

Volltextzugriff (PDF)

The Use of Regularized Least Squares Minimization for the Deconvolution of SEM Images

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.386-387

2014

Volltextzugriff (PDF)

Improved Low Voltage SEM Image Resolution Through The Use of Restoration Techniques

2015

Volltextzugriff (PDF)

1 – 25 von 66

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(48)
Mit Volltextzugriff
(56)

Publikationsform

2 weitere anzeigen...

Weniger anzeigen...

Sprache

Englisch
(66)

Erscheinungsjahr

n.n

Thema

Science & Technology
(16)
Materials Science
(11)
Microscopy
(11)
Scanning Electron Microscopy
(10)
Technology
(10)
Materials Science, Multidisciplinary
(8)
Physical Sciences
(8)
Analytical And Instrumentation Science Symposia
(7)
Quantitative Analysis
(7)
X-Rays
(6)
Chemistry
(5)
Electron Microscopes
(5)
Point Spread Functions
(5)
Computer Simulation
(4)
Image Restoration
(4)
Instrumentation
(4)
Accuracy
(3)
Astigmatism
(3)
Carbon
(3)
Chemistry, Analytical
(3)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

In the Beginning – A Quick Look at the Origins of Quantitative Electron Microprobe Analysis and the Need for Monte Carlo Modeling

X-ray Characterization of Materials

Development of a New Quantitative X-Ray Microanalysis Method for Electron Microscopy

Secondary Electrons in EUV Lithography

An Evaluation of Image Quality Metrics for Scanning Electron Microscopy

Improving Scanning Electron Microscope Resolution for Near Planar Samples Through the Use of Image Restoration

Measurement of the Electron Beam Point Spread Function (PSF) in a Scanning Electron Microscope (SEM)

Scanning Electron Microscope Point Spread Function Determination Through the Use of Particle Dispersions

Concise Encyclopedia of Materials Characterization

X-ray characterization of materials

Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope—Part II: Effect on Image Restoration Quality

Exploring the Parameter Space of Point Spread Function Determination for the Scanning Electron Microscope—Part I: Effect on the Point Spread Function

The Determination and Application of the Point Spread Function in the Scanning Electron Microscope

Sidewall Texture and Microstructure of iPVD Copper Seed in Narrow Damascene Trenches

Some Thoughts on Point Spread Functions, Resolution and Image Quality

Visualizing Astigmatism in the SEM Electron Probe

Viability of Point Spread Function Deconvolution for SEM

WinX-Ray: A New Monte Carlo Program for the Simulation of X-Ray and Charging Materials

Win X-ray: A New Monte Carlo Program that Computes X-ray Spectra Obtained with a Scanning Electron Microscope

Correlating surface segregation and microstructural evolution of electrochemically deposited copper

Win X-ray, The Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope

Improved SEM Image Resolution Through the Use of Image Restoration Techniques

Improved Low Voltage SEM Image Resolution Through the Use of Image Restoration Techniques

The Use of Regularized Least Squares Minimization for the Deconvolution of SEM Images

Improved Low Voltage SEM Image Resolution Through The Use of Restoration Techniques

Suchergebnisse filtern