Sortiert nach
IEEE transactions on electron devices, 2005-02, Vol.52 (2), p.218-226
2005
Volltextzugriff (PDF)
2022 International Electron Devices Meeting (IEDM), 2022, p.27.1.1-27.1.4
- Chang, Chih-Hao
- Chang, V.S.
- Pan, K.H.
- Lai, K.T.
- Lu, J. H.
- Ng, J.A.
- Chen, C.Y.
- Wu, B.F.
- Lin, C.J.
- Liang, C.S.
- Tsao, C.P.
- Mor, Y.S.
- Li, C.T.
- Lin, T.C.
- Hsieh, C.H.
- Chen, P.N.
- Hsu, H.H.
- Chen, J.H.
- Chen, H.F.
- Yeh, J.Y.
- Chiang, M.C.
- Lin, C.Y.
- Liaw, J.J.
- Wang, C.H.
- Lee, S.B.
- Chen, C.C.
- Lin, H.J.
- Chen, R.
- Chen, K.W.
- Chui, C.O.
- Yeo, Y.C.
- Huang, K.B.
- Lee, T.L.
- Tsai, M.H.
- Chen, K.S.
- Lu, Y.C.
- Jang, S.M.
- Wu, S.-Y.
2022
Volltextzugriff (PDF)
2009 Symposium on VLSI Technology, 2009, p.210-211
- Wu, Shien-Yang
- Liaw, J.J.
- Lin, C.Y.
- Chiang, M.C.
- Yang, C.K.
- Cheng, J.Y.
- Tsai, M.H.
- Liu, M.Y.
- Wu, P.H.
- Chang, C.H.
- Hu, L.C.
- Lin, C.I.
- Chen, H.F.
- Chang, S.Y.
- Wang, S.H.
- Tong, P.Y.
- Hsieh, Y.L.
- Pan, K.H.
- Hsieh, C.H.
- Chen, C.H.
- Yao, C.H.
- Chen, C.C.
- Lee, T.L.
- Chang, C.W.
- Lin, H.J.
- Chen, S.C.
- Shieh, J.H.
- Jang, S.M.
- Chen, K.S.
- Ku, Y.
- See, Y.C
- Lo, W.J.
2009
Volltextzugriff (PDF)
2022 International Electron Devices Meeting (IEDM), 2022, p.27.5.1-27.5.4
- Wu, Shien-Yang
- Chang, C.H.
- Chiang, M.C.
- Lin, C.Y.
- Liaw, J.J.
- Cheng, J.Y.
- Yeh, J.Y.
- Chen, H.F.
- Chang, S.Y.
- Lai, K.T.
- Liang, M.S.
- Pan, K.H.
- Chen, J.H.
- Chang, V.S.
- Luo, T.C.
- Wang, X.
- Mor, Y.S.
- Lin, C.I.
- Wang, S.H.
- Hsieh, M.Y.
- Chen, C.Y.
- Wu, B.F.
- Lin, C.J.
- Liang, C.S.
- Tsao, C.P.
- Li, C.T.
- Chen, C.H.
- Hsieh, C.H.
- Liu, H.H.
- Chen, P.N.
- Chen, C.C.
- Chen, R.
- Yeo, Y.C.
- Chui, C.O.
- Chang, W.
- Lee, T.L.
- Huang, K.B.
- Lin, H.J.
- Chen, K.W.
- Tsai, M.H.
- Chen, K.S.
- Chen, X.M.
- Cheng, Y.K.
- Wang, C.H.
- Shue, W.
- Ku, Y.
- Jang, S. M.
- Cao, M.
- Lu, L.C.
- Chang, T.S.
2022
Volltextzugriff (PDF)
2008 IEEE International Electron Devices Meeting, 2008, p.1-4
- Diaz, C.H.
- Goto, K.
- Huang, H.T.
- Yasuda, Yu
- Tsao, C.P.
- Chu, T.T.
- Lu, W.T.
- Chang, V.
- Hou, Y.T.
- Chao, Y.S.
- Hsu, P.F.
- Chen, C.L.
- Lin, K.C.
- Ng, J.A.
- Yang, W.C.
- Chen, C.H.
- Peng, Y.H.
- Chen, C.J.
- Chen, C.C.
- Yu, M.H.
- Yeh, L.Y.
- You, K.S.
- Chen, K.S.
- Thei, K.B.
- Lee, C.H.
- Yang, S.H.
- Cheng, J.Y.
- Huang, K.T.
- Liaw, J.J.
- Ku, Y.
- Jang, S.M.
- Chuang, H.
- Liang, M.S.
2008
Volltextzugriff (PDF)
Bone (New York, N.Y.), 1997-07, Vol.21 (1), p.49-56
1997
Volltextzugriff (PDF)
2007 IEEE International Electron Devices Meeting, 2007, p.263-266
- Shien-Yang Wu
- Chou, C.W.
- Lin, C.Y.
- Chiang, M.C.
- Yang, C.K.
- Liu, M.Y.
- Hu, L.C.
- Chang, C.H.
- Wu, P.H.
- Chen, H.F.
- Chang, S.Y.
- Wang, S.H.
- Tong, P.Y.
- Hsieh, Y.L.
- Liaw, J.J.
- Pan, K.H.
- Hsieh, C.H.
- Chen, C.H.
- Cheng, J.Y.
- Yao, C.H.
- Wan, W.K.
- Lee, T.L.
- Huang, K.T.
- Lin, K.C.
- Yeh, L.Y.
- Ku, K.C.
- Chen, S.C.
- Lin, H.J.
- Jang, S.M.
- Lu, Y.C.
- Shieh, J.H.
- Tsai, M.H.
- Song, J.Y.
- Chen, K.S.
- Chang, V.
- Cheng, S.M.
- Yang, S.H.
- Diaz, C.H.
- See, Y.C.
- Liang, M.S.
2007
Volltextzugriff (PDF)
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516), 2004, p.211-215
2004
Volltextzugriff (PDF)
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318), 1999, p.671-674
1999
Volltextzugriff (PDF)
2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303), 2002, p.68-69
2002
Volltextzugriff (PDF)
Acta materialia, 2019-02, Vol.165 (C), p.228-240
2019
Volltextzugriff (PDF)
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325), 1999, p.11-12
- Diaz, C.H.
- Young, K.L.
- Hsu, J.H.
- Lin, J.C.H.
- Hou, C.S.
- Lin, C.T.
- Liaw, J.J.
- Wu, C.C.
- Su, C.W.
- Wang, C.H.
- Ting, J.K.
- Yang, S.S.
- Lee, K.Y.
- Wu, S.Y.
- Tsai, C.C.
- Tao, H.J.
- Jang, S.M.
- Shue, S.L.
- Hsieh, H.C.
- Wang, Y.Y.
- Chen, C.C.
- Yang, S.C.
- Fu, S.
- Chang, S.Z.
- Lo, T.C.
- Wu, J.Y.
- Shy, J.S.
- Liu, C.W.
- Chen, S.H.
- Lin, B.L.
- Liew, B.K.
- Yen, T.
- Yu, C.H.
- Chao, Y.C.
- Liang, M.S.
- Wang, C.
- Sun, J.Y.C.
1999
Volltextzugriff (PDF)
International journal of plasticity, 2018-06, Vol.105 (C), p.225-238
2018
Volltextzugriff (PDF)
Oncogene, 2016-07, Vol.35 (28), p.3669-3680
2016
Volltextzugriff (PDF)
Journal of nuclear materials, 2021-12, Vol.557, p.153292, Article 153292
2021
Volltextzugriff (PDF)
Nurse education today, 2024-01, Vol.132, p.106004-106004, Article 106004
2024
Volltextzugriff (PDF)
Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2007-02, Vol.445, p.219-222
2007
Volltextzugriff (PDF)
Journal of hepatology, 2016, Vol.64 (2), p.S604-S604
2016
Volltextzugriff (PDF)
Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2007-08, Vol.463 (1), p.185-196
2007
Volltextzugriff (PDF)
Journal of hepatology, 2016, Vol.64 (2), p.S604-S604
2016
Volltextzugriff (PDF)
Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2008-01, Vol.472 (1-2), p.125-129
2008
Volltextzugriff (PDF)
Scripta materialia, 2009-08, Vol.61 (3), p.293-295
2009
Volltextzugriff (PDF)
Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2008, Vol.472 (1), p.125-129
2008
Volltextzugriff (PDF)
Review of scientific instruments, 2006-03, Vol.77 (3)
2006
Volltextzugriff (PDF)
Electronics letters, 2005, Vol.41 (22), p.1210-1211
2005
Volltextzugriff (PDF)
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Erscheinungsjahr
n.n
n.n
Thema
- Science & Technology
- Technology
- Materials Science
- Random Access Memory
- Materials Science, Multidisciplinary
- Cmos Technology
- Engineering
- Engineering, Electrical & Electronic
- Metallurgy & Metallurgical Engineering
- Physics
- Exact Sciences And Technology
- Life Sciences & Biomedicine
- Metallic Glasses
- Nanoscience & Nanotechnology
- Science & Technology - Other Topics
- Semiconductor Device Manufacture
- Testing
- Animals
- Application Specific Integrated Circuits
- Cmos Process
Kollektion
- Ingenta
- IEEE Xplore
- Access via ScienceDirect (Elsevier)
- Elsevier Journal Backfiles on ScienceDirect (DFG Nationallizenzen)
- EZB Electronic Journals Library
- MEDLINE
- IngentaConnect Journals
- WK Lippincott Williams & Wilkins–Connect here FIRST to enable access
- Brill Online Journals
- 2022 Brill Journal Collection
- 2023 Brill Journal Collection
- JSTOR
- Nexis
- Wiley Online Library
- Nature International Weekly Journal of Science
- American Institute of Physics (AIP) Journals
Zeitschrift / Serie
- Materials Science & Engineering. A, Structural Materials : Properties, Microstructure And Processing
- Bijdragen Tot De Taal-, Land- En Volkenkunde / Journal Of The Humanities And Social Sciences Of Southeast Asia
- Journal Of Hepatology
- Materials Science And Engineering: A
- Acta Materialia
- Bone
- Electronics Letters
- Ieee Transactions On Electron Devices
- International Journal Of Plasticity
- Journal Of Nuclear Materials