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Machine Learning-Based Detection Method for Wafer Test Induced Defects

IEEE transactions on semiconductor manufacturing, 2021-05, Vol.34 (2), p.161-167

2021

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Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning

IEEE transactions on semiconductor manufacturing, 2022-05, Vol.35 (2), p.291-299

2022

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Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization

IEEE transactions on semiconductor manufacturing, 2022-05, Vol.35 (2), p.272-281

2022

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Testing Transition Delay Faults in Modified Booth Multipliers

IEEE transactions on computer-aided design of integrated circuits and systems, 2008-09, Vol.27 (9), p.1693-1697

2008

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Identify unrepairability to speed-up spare allocation for repairing memories

IEEE transactions on reliability, 2005-06, Vol.54 (2), p.358-365

2005

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Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis

2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, p.1710-1711

2020

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Identifying invalid states for sequential circuit test generation

IEEE transactions on computer-aided design of integrated circuits and systems, 1997-09, Vol.16 (9), p.1025-1033

1997

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Improved representatives for unrepairability judging and economic repair solutions of memories

2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06), 2006, p.6 pp.-15

2006

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Multi-function controller for low-power multiple scan test of transition delay faults

2014 International Symposium on Next-Generation Electronics (ISNE), 2014, p.1-3

2014

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Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling

2021 IEEE International Test Conference (ITC), 2021, p.208-212

2021

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Wafer-level test path pattern recognition and test characteristics for test-induced defect diagnosis

Proceedings of the 23rd Conference on Design, Automation and Test in Europe, 2020, p.1710-1711

2020

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An effective methodology for mixed scan and reset design based on test generation and structure of sequential circuits

Proceedings Eighth Asian Test Symposium (ATS'99), 1999, p.173-178

1999

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IMPROVED REPRESENTATIVES FOR JUDGING UNREPAIRABILITY AND DECIDING ECONOMIC REPAIR SOLUTIONS OF MEMORIES

Journal of circuits, systems, and computers, 2009-02, Vol.18 (1), p.81-95

LIANG, HSING-CHUNG

2009

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Testing transition delay faults in modified Booth multipliers by using C-testable and SIC patterns

TENCON 2007 - 2007 IEEE Region 10 Conference, 2007, p.1-4

2007

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Identifying untestable faults in sequential circuits

IEEE design & test of computers, 1995, Vol.12 (3), p.14-23

1995

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GPU-based ATPG System by Scaling Memory Usage and Reducing Data Transfer

2021 IEEE European Test Symposium (ETS), 2021, p.1-2

2021

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Activity of plasma matrix metalloproteinase-9 as a marker to reflect the tissue level of mammary glands tumor in dogs

Wētchasān sattawaphāet, 2011-03, Vol.41 (1), p.111

2011

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Flip-Flop Selection for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits

Journal of Information Science and Engineering, 2000-09, Vol.16 (5), p.687-702

2000

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Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering

2021 IEEE European Test Symposium (ETS), 2021, p.1-2

2021

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Bus-oriented DFT design for embedded cores

The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings, 2004, Vol.1, p.561-563 vol.1

2004

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Mitochondrial Lon-induced mtDNA leakage contributes to PD-L1–mediated immunoescape via STING-IFN signaling and extracellular vesicles

Journal for immunotherapy of cancer, 2020-12, Vol.8 (2), p.e001372

2020

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Mitochondrial oxidative stress by Lon-PYCR1 maintains an immunosuppressive tumor microenvironment that promotes cancer progression and metastasis

Cancer letters, 2020-04, Vol.474, p.138-150

2020

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Partial reset and scan for flip-flops based on states requirement for test generation

Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231), 1998, p.341-346

1998

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Flip-flop selection for mixed scan and reset design based on test generation and structure of sequential circuits

Journal of information science and engineering, 2000-09, Vol.16 (5), p.678-702

2000

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Association between periodontitis and pulmonary function based on the Third National Health and Nutrition Examination Survey (NHANES III)

Journal of clinical periodontology, 2020-07, Vol.47 (7), p.788-795

2020

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Machine Learning-Based Detection Method for Wafer Test Induced Defects

Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning

Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization

Testing Transition Delay Faults in Modified Booth Multipliers

Identify unrepairability to speed-up spare allocation for repairing memories

Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis

Identifying invalid states for sequential circuit test generation

Improved representatives for unrepairability judging and economic repair solutions of memories

Multi-function controller for low-power multiple scan test of transition delay faults

Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling

Wafer-level test path pattern recognition and test characteristics for test-induced defect diagnosis

An effective methodology for mixed scan and reset design based on test generation and structure of sequential circuits

IMPROVED REPRESENTATIVES FOR JUDGING UNREPAIRABILITY AND DECIDING ECONOMIC REPAIR SOLUTIONS OF MEMORIES

Testing transition delay faults in modified Booth multipliers by using C-testable and SIC patterns

Identifying untestable faults in sequential circuits

GPU-based ATPG System by Scaling Memory Usage and Reducing Data Transfer

Activity of plasma matrix metalloproteinase-9 as a marker to reflect the tissue level of mammary glands tumor in dogs

Flip-Flop Selection for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits

Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering

Bus-oriented DFT design for embedded cores

Mitochondrial Lon-induced mtDNA leakage contributes to PD-L1–mediated immunoescape via STING-IFN signaling and extracellular vesicles

Mitochondrial oxidative stress by Lon-PYCR1 maintains an immunosuppressive tumor microenvironment that promotes cancer progression and metastasis

Partial reset and scan for flip-flops based on states requirement for test generation

Flip-flop selection for mixed scan and reset design based on test generation and structure of sequential circuits

Association between periodontitis and pulmonary function based on the Third National Health and Nutrition Examination Survey (NHANES III)

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