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Accuracy of modified CAD/CAM generated wafer for orthognathic surgery

PloS one, 2019-05, Vol.14 (5), p.e0216945-e0216945

2019

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Modeling of Negative Capacitance in Ferroelectric Thin Films

Advanced materials (Weinheim), 2019-08, Vol.31 (32), p.e1805266-n/a

2019

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Impact of operation voltage and NH3 annealing on the fatigue characteristics of ferroelectric AlScN thin films grown by sputtering

Nanoscale, 2023-10, Vol.15 (40), p.16390-16402

2023

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Double S‐Shaped Polarization – Voltage Curve and Negative Capacitance from Al2O3‐Hf0.5Zr0.5O2‐Al2O3 Triple‐Layer Structure

Advanced functional materials, 2023-02, Vol.33 (9), p.n/a

2023

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Voltage Drop in a Ferroelectric Single Layer Capacitor by Retarded Domain Nucleation

Nano letters, 2017-12, Vol.17 (12), p.7796-7802

2017

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Ab initio calculation of bulk and defect properties of ductile rare-earth intermetallic compounds

Acta materialia, 2004-09, Vol.52 (16), p.4849-4857

2004

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Dispersion in Ferroelectric Switching Performance of Polycrystalline Hf0.5Zr0.5O2 Thin Films

ACS applied materials & interfaces, 2018-10, Vol.10 (41), p.35374-35384

2018

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Exploring the Physical Origin of the Negative Capacitance Effect in a Metal–Ferroelectric–Metal–Dielectric Structure

Advanced functional materials, 2023-12, Vol.33 (51), p.n/a

2023

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A Comparative Study on the Ferroelectric Performances in Atomic Layer Deposited Hf0.5Zr0.5O2 Thin Films Using Tetrakis(ethylmethylamino) and Tetrakis(dimethylamino) Precursors

Nanoscale research letters, 2020-04, Vol.15 (1), p.72-72, Article 72

2020

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Numerical Simulations on Heat Transfer Enhancement of Nanofluids in Microchannel Using Vortex Generator

Engineering proceedings, 2023-06, Vol.38 (1), p.68

2023

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Evolution of the Ferroelectric Properties of AlScN Film by Electrical Cycling with an Inhomogeneous Field Distribution

Advanced electronic materials, 2023-05, Vol.9 (5), p.n/a

2023

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Nucleation‐Limited Ferroelectric Orthorhombic Phase Formation in Hf0.5Zr0.5O2 Thin Films

Advanced electronic materials, 2019-02, Vol.5 (2), p.n/a

2019

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Atomic layer deposition of HfNx films and improving the film performance by annealing under NH3 atmosphere

Journal of materials chemistry. C, Materials for optical and electronic devices, 2023-06, Vol.11 (24), p.8018-8026

2023

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Field‐Induced Ferroelectric Hf1‐xZrxO2 Thin Films for High‐k Dynamic Random Access Memory

Advanced electronic materials, 2020-11, Vol.6 (11), p.n/a

2020

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Transient Negative Capacitance Effect in Atomic‐Layer‐Deposited Al2O3/Hf0.3Zr0.7O2 Bilayer Thin Film

Advanced functional materials, 2019-04, Vol.29 (17), p.n/a

2019

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Understanding phase evolution of ferroelectric Hf0.5Zr0.5O2 thin films with Al2O3 and Y2O3 inserted layers

Journal of materials chemistry. C, Materials for optical and electronic devices, 2024-04, Vol.12 (14), p.5035-5046

2024

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Anisotropy of the pairing gap of FeAs-based superconductors induced by spin fluctuations

Physical review. B, Condensed matter and materials physics, 2009-02, Vol.79 (5), Article 054511

2009

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Diode Property and Positive Temperature Coefficient of Resistance of Pt/Al2O3/Nb:SrTiO3

Advanced electronic materials, 2018-12, Vol.4 (12), p.n/a

2018

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Comparison study on the accuracy of metamodeling technique for non-convex functions

Journal of Mechanical Science and Technology, 2009, 23(4), , pp.1175-1181

2009

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Low-grade osteosarcoma arising from cemento-ossifying fibroma: a case report

대한구강악안면외과학회지, 2015, 41(1), , pp.48-51

2015

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Polarizing and depolarizing charge injection through a thin dielectric layer in a ferroelectric-dielectric bilayer

Nanoscale, 2021-02, Vol.13 (4), p.2556-2572

2021

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Impact of operation voltage and NH annealing on the fatigue characteristics of ferroelectric AlScN thin films grown by sputtering

Nanoscale, 2023-10, Vol.15 (4), p.1639-1642

2023

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Impact of operation voltage and NH 3 annealing on the fatigue characteristics of ferroelectric AlScN thin films grown by sputtering

Nanoscale, 2023-10, Vol.15 (40), p.16390-16402

2023

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Study of ferroelectric characteristics of Hf0.5Zr0.5O2 thin films grown on sputtered or atomic-layer-deposited TiN bottom electrodes

Applied physics letters, 2020-07, Vol.117 (2)

2020

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Low-grade osteosarcoma arising from cemento-ossifying fibroma: a case report

Journal of the Korean Association of Oral and Maxillofacial Surgeons, 2015-02, Vol.41 (1), p.48-51

2015

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Accuracy of modified CAD/CAM generated wafer for orthognathic surgery

Modeling of Negative Capacitance in Ferroelectric Thin Films

Impact of operation voltage and NH3 annealing on the fatigue characteristics of ferroelectric AlScN thin films grown by sputtering

Double S‐Shaped Polarization – Voltage Curve and Negative Capacitance from Al2O3‐Hf0.5Zr0.5O2‐Al2O3 Triple‐Layer Structure

Voltage Drop in a Ferroelectric Single Layer Capacitor by Retarded Domain Nucleation

Ab initio calculation of bulk and defect properties of ductile rare-earth intermetallic compounds

Dispersion in Ferroelectric Switching Performance of Polycrystalline Hf0.5Zr0.5O2 Thin Films

Exploring the Physical Origin of the Negative Capacitance Effect in a Metal–Ferroelectric–Metal–Dielectric Structure

A Comparative Study on the Ferroelectric Performances in Atomic Layer Deposited Hf0.5Zr0.5O2 Thin Films Using Tetrakis(ethylmethylamino) and Tetrakis(dimethylamino) Precursors

Numerical Simulations on Heat Transfer Enhancement of Nanofluids in Microchannel Using Vortex Generator

Evolution of the Ferroelectric Properties of AlScN Film by Electrical Cycling with an Inhomogeneous Field Distribution

Nucleation‐Limited Ferroelectric Orthorhombic Phase Formation in Hf0.5Zr0.5O2 Thin Films

Atomic layer deposition of HfNx films and improving the film performance by annealing under NH3 atmosphere

Field‐Induced Ferroelectric Hf1‐xZrxO2 Thin Films for High‐k Dynamic Random Access Memory

Transient Negative Capacitance Effect in Atomic‐Layer‐Deposited Al2O3/Hf0.3Zr0.7O2 Bilayer Thin Film

Understanding phase evolution of ferroelectric Hf0.5Zr0.5O2 thin films with Al2O3 and Y2O3 inserted layers

Anisotropy of the pairing gap of FeAs-based superconductors induced by spin fluctuations

Diode Property and Positive Temperature Coefficient of Resistance of Pt/Al2O3/Nb:SrTiO3

Comparison study on the accuracy of metamodeling technique for non-convex functions

Low-grade osteosarcoma arising from cemento-ossifying fibroma: a case report

Polarizing and depolarizing charge injection through a thin dielectric layer in a ferroelectric-dielectric bilayer

Impact of operation voltage and NH annealing on the fatigue characteristics of ferroelectric AlScN thin films grown by sputtering

Impact of operation voltage and NH 3 annealing on the fatigue characteristics of ferroelectric AlScN thin films grown by sputtering

Study of ferroelectric characteristics of Hf0.5Zr0.5O2 thin films grown on sputtered or atomic-layer-deposited TiN bottom electrodes

Low-grade osteosarcoma arising from cemento-ossifying fibroma: a case report

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