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Asymmetric gate capacitance and dynamic characteristic fluctuations in 16 nm bulk MOSFETs due to random distribution of discrete dopants

Semiconductor science and technology, 2010-04, Vol.25 (4), p.045006-045006

2010

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Dynamic Characteristic Optimization of 14 a-Si:H TFTs Gate Driver Circuit Using Evolutionary Methodology for Display Panel Manufacturing

Journal of display technology, 2011-05, Vol.7 (5), p.274-280

2011

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Dual-Material Gate Approach to Suppression of Random-Dopant-Induced Characteristic Fluctuation in 16 nm Metal--Oxide--Semiconductor Field-Effect-Transistor Devices

Japanese Journal of Applied Physics, 2011-04, Vol.50 (4), p.04DC07-04DC07-7

2011

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Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell

Microelectronics and reliability, 2010-05, Vol.50 (5), p.647-651

2010

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Dual-Material Gate Approach to Suppression of Random-Dopant-Induced Characteristic Fluctuation in 16 nm Metal–Oxide–Semiconductor Field-Effect-Transistor Devices

Japanese Journal of Applied Physics, 2011-04, Vol.50 (4S), p.4

2011

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Accurate 3-D capacitance extractions for advanced nanometer CMOS nodes

2015 International Symposium on VLSI Technology, Systems and Applications, 2015, p.1-4

2015

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Statistical Analysis of Metal Gate Workfunction Variability, Process Variation, and Random Dopant Fluctuation in Nano-CMOS Circuits

2009 International Conference on Simulation of Semiconductor Processes and Devices, 2009, p.1-4

2009

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3D device simulation of work function and interface trap fluctuations on high-κ / metal gate devices

2010 International Electron Devices Meeting, 2010, p.15.6.1-15.6.4

2010

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Accurate 3-D capacitance extractions for advanced nanometer CMOS nodes

VLSI Design, Automation and Test(VLSI-DAT), 2015, p.1-4

2015

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Hybrid Genetic Algorithm with Mixed Mutation Mechanism for Optimal Display Panel Circuit Design

2010 International Conference on Technologies and Applications of Artificial Intelligence, 2010, p.222-225

2010

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Random-dopant-induced DC characteristic fluctuations in 16-nm-Gate LAC and inLAC MOSFET devices

2010 IEEE International Conference on Semiconductor Electronics (ICSE2010), 2010, p.237-240

2010

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Effect of intrinsic-parameter fluctuations on 16-nm-gate CMOS and current mirror circuit

10th IEEE International Conference on Nanotechnology, 2010, p.798-801

2010

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Gate driver circuit design optimization for TFT-LCD panel manufacturing

2nd Asia Symposium on Quality Electronic Design (ASQED), 2010, p.13-16

2010

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Suppression of random-dopant-induced characteristic fluctuation in 16 nm MOSFET devices using dual-material gate

2010 International Symposium on Next Generation Electronics, 2010, p.28-31

2010

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Electrical characteristic fluctuation and suppression in emerging CMOS device and circuit

2010 Silicon Nanoelectronics Workshop, 2010, p.1-2

2010

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Amorphous silicon thin-film transistor gate driver circuit design optimization using a simulation-based evolutionary technique

2010 IEEE International Conference on Semiconductor Electronics (ICSE2010), 2010, p.123-126

2010

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Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell: 2009 International Electron Devices and Materials Symposium (IEDMS)

Microelectronics and reliability, 2010, Vol.50 (5), p.647-651

2010

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A multiple-class buffer allocation scheme for ATM networks with VBR traffic

Proceedings Twelfth International Conference on Information Networking (ICOIN-12), 1998, p.144-149

1998

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New process variation modeling method of 3-D capacitances for advanced nanometer CMOS

2016 e-Manufacturing and Design Collaboration Symposium (eMDC), 2016, p.1-2

2016

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Damage detection sensitivity characterization of acousto-ultrasound-based structural health monitoring techniques

Structural health monitoring, 2016-03, Vol.15 (2), p.143-161

2016

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Fabrication of Vertically Stacked Nanosheet Junctionless Field-Effect Transistors and Applications for the CMOS and CFET Inverters

IEEE transactions on electron devices, 2020-09, Vol.67 (9), p.3504-3509

2020

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The preprophase band-associated kinesin-14 OsKCH2 is a processive minus-end-directed microtubule motor

Nature communications, 2018-03, Vol.9 (1), p.1067-11, Article 1067

2018

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Efficacy and Safety of Apixaban, Dabigatran, Rivaroxaban, and Warfarin in Asians With Nonvalvular Atrial Fibrillation

Journal of the American Heart Association, 2018-04, Vol.7 (8), p.n/a

2018

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Design and Integration of a Wireless Stretchable Multimodal Sensor Network in a Composite Wing

Sensors (Basel, Switzerland), 2020-04, Vol.20 (9), p.2528

2020

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Epidemiology of outpatient and inpatient eye injury in Taiwan: 2000, 2005, 2010, and 2015

PloS one, 2020-07, Vol.15 (7), p.e0235208-e0235208

2020

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Asymmetric gate capacitance and dynamic characteristic fluctuations in 16 nm bulk MOSFETs due to random distribution of discrete dopants

Dynamic Characteristic Optimization of 14 a-Si:H TFTs Gate Driver Circuit Using Evolutionary Methodology for Display Panel Manufacturing

Dual-Material Gate Approach to Suppression of Random-Dopant-Induced Characteristic Fluctuation in 16 nm Metal--Oxide--Semiconductor Field-Effect-Transistor Devices

Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell

Dual-Material Gate Approach to Suppression of Random-Dopant-Induced Characteristic Fluctuation in 16 nm Metal–Oxide–Semiconductor Field-Effect-Transistor Devices

Accurate 3-D capacitance extractions for advanced nanometer CMOS nodes

Statistical Analysis of Metal Gate Workfunction Variability, Process Variation, and Random Dopant Fluctuation in Nano-CMOS Circuits

3D device simulation of work function and interface trap fluctuations on high-κ / metal gate devices

Accurate 3-D capacitance extractions for advanced nanometer CMOS nodes

Hybrid Genetic Algorithm with Mixed Mutation Mechanism for Optimal Display Panel Circuit Design

Random-dopant-induced DC characteristic fluctuations in 16-nm-Gate LAC and inLAC MOSFET devices

Effect of intrinsic-parameter fluctuations on 16-nm-gate CMOS and current mirror circuit

Gate driver circuit design optimization for TFT-LCD panel manufacturing

Suppression of random-dopant-induced characteristic fluctuation in 16 nm MOSFET devices using dual-material gate

Electrical characteristic fluctuation and suppression in emerging CMOS device and circuit

Amorphous silicon thin-film transistor gate driver circuit design optimization using a simulation-based evolutionary technique

Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell: 2009 International Electron Devices and Materials Symposium (IEDMS)

A multiple-class buffer allocation scheme for ATM networks with VBR traffic

New process variation modeling method of 3-D capacitances for advanced nanometer CMOS

Damage detection sensitivity characterization of acousto-ultrasound-based structural health monitoring techniques

Fabrication of Vertically Stacked Nanosheet Junctionless Field-Effect Transistors and Applications for the CMOS and CFET Inverters

The preprophase band-associated kinesin-14 OsKCH2 is a processive minus-end-directed microtubule motor

Efficacy and Safety of Apixaban, Dabigatran, Rivaroxaban, and Warfarin in Asians With Nonvalvular Atrial Fibrillation

Design and Integration of a Wireless Stretchable Multimodal Sensor Network in a Composite Wing

Epidemiology of outpatient and inpatient eye injury in Taiwan: 2000, 2005, 2010, and 2015

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