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Automatic Classification Using Decision Tree and Support Vector Machine

Knowledge-Based Intelligent Information and Engineering Systems, 2005, p.1325-1330

2005

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Physical Aware Approaches for Speeding up Scan Shift Operation in SoC

ETRI journal, 2016-01

2016

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Quantitative Analysis of Arsenic Doping Concentration in Silicon Using Scanning Transmission Electron Microscopy/Energy Dispersive X-ray Spectrometry

Science of advanced materials, 2018-02, Vol.10 (2), p.293-296

2018

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Quality Measurement of Push Services for Smart Devices

Wireless personal communications, 2016-05, Vol.88 (2), p.319-336

2016

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New Low-Voltage Low-Latency Mixed-Voltage I/O Buffer

IEICE transactions on electronics, 2010, Vol.E93-C (5), p.709-711

2010

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A 6 Gbps/pin Low‐Power Half‐Duplex Active Cross‐Coupled LVDS Transceiver with Switched Termination

ETRI Journal, 2008, 30(4), , pp.612-614

2008

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Physical‐Aware Approaches for Speeding Up Scan Shift Operations in SoCs

ETRI journal, 2016-06, Vol.38 (3), p.479-486

2016

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Physical-Aware Approaches for Speeding Up Scan Shift Operations in SoCs

ETRI journal, 2016-06, Vol.38 (3), p.479-486

2016

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Optimization of a Simulation for 300mm FAB Semiconductor Manufacturing

Computational Science and Its Applications - ICCSA 2006, 2006, p.260-268

2006

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Adsorption of Ba on Si(001)2 ×1 Surface

Japanese Journal of Applied Physics, 1999-11, Vol.38 (11R), p.6479

1999

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PrimeEye: A Real-Time Face Detection and Recognition System Robust to Illumination Changes

Audio- and Video-Based Biometric Person Authentication, 2001, Vol.2091, p.360-365

2001

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A Production Planning Methodology for Semiconductor Manufacturing Based on Simulation and Marketing Pattern

Intelligent Information and Database Systems, 2011, p.363-371

2011

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Implementation of Cloud Computing Environment for Discrete Event System Simulation using Service Oriented Architecture

2010 IEEE/IFIP International Conference on Embedded and Ubiquitous Computing, 2010, p.359-362

2010

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Automatic Detection of Failure Patterns Using Data Mining

Knowledge-Based Intelligent Information and Engineering Systems, 2005, p.1312-1316

2005

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Collaborative Trust-Based Shortest Secure Path Discovery in Mobile Ad Hoc Networks

Computational Science – ICCS 2006, 2006, p.1089-1096

2006

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CMOS cross-coupled charge pump with improved latch-up immunity

IEICE Electronics Express, 2009-01, Vol.6 (11), p.736-742

2009

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A 6 Gbps/pin Low-Power Half-Duplex Active Cross-Coupled LVDS Transceiver with Switched Termination

ETRI journal, 2008-02, Vol.30 (4), p.612-614

2008

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RRAM Spare Allocation in Semiconductor Manufacturing for Yield Improvement

Knowledge-Based Intelligent Information and Engineering Systems, 2004, p.95-102

2004

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Queue Modeling of Semiconductor Test Equipment Using Effective Background Process

Computer Applications for Modeling, Simulation, and Automobile, 2012, Vol.341, p.15-19

2012

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Full Fabrication Simulation of 300mm Wafer Focused on AMHS (Automated Material Handling Systems)

Systems Modeling and Simulation: Theory and Applications, 2005, p.514-520

2005

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Two-way material transportation method based on 300mm wafer FAB line simulation

Proceedings of the 2010 Spring Simulation Multiconference, 2010, p.1-4

2010

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On the Repair of Memory Cells with Spare Rows and Columns for Yield Improvement

Systems Modeling and Simulation: Theory and Applications, 2005, p.713-720

2005

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I/O divided column redundancy scheme for high-speedDRAM with multiple I/Os

Electronics letters, 2000-11, Vol.36 (24), p.1996-1997

2000

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I/O divided column redundancy scheme for high-speed DRAM with multiple I/Os

Electronics letters, 2000-11, Vol.36 (24), p.1-1

2000

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I/O divided column redundancy scheme for high-speed DRAM with multiple I/Os

Electronics letters, 2000-11, Vol.36 (24), p.1996-1997

2000

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Automatic Classification Using Decision Tree and Support Vector Machine

Physical Aware Approaches for Speeding up Scan Shift Operation in SoC

Quantitative Analysis of Arsenic Doping Concentration in Silicon Using Scanning Transmission Electron Microscopy/Energy Dispersive X-ray Spectrometry

Quality Measurement of Push Services for Smart Devices

New Low-Voltage Low-Latency Mixed-Voltage I/O Buffer

A 6 Gbps/pin Low‐Power Half‐Duplex Active Cross‐Coupled LVDS Transceiver with Switched Termination

Physical‐Aware Approaches for Speeding Up Scan Shift Operations in SoCs

Physical-Aware Approaches for Speeding Up Scan Shift Operations in SoCs

Optimization of a Simulation for 300mm FAB Semiconductor Manufacturing

Adsorption of Ba on Si(001)2 ×1 Surface

PrimeEye: A Real-Time Face Detection and Recognition System Robust to Illumination Changes

A Production Planning Methodology for Semiconductor Manufacturing Based on Simulation and Marketing Pattern

Implementation of Cloud Computing Environment for Discrete Event System Simulation using Service Oriented Architecture

Automatic Detection of Failure Patterns Using Data Mining

Collaborative Trust-Based Shortest Secure Path Discovery in Mobile Ad Hoc Networks

CMOS cross-coupled charge pump with improved latch-up immunity

A 6 Gbps/pin Low-Power Half-Duplex Active Cross-Coupled LVDS Transceiver with Switched Termination

RRAM Spare Allocation in Semiconductor Manufacturing for Yield Improvement

Queue Modeling of Semiconductor Test Equipment Using Effective Background Process

Full Fabrication Simulation of 300mm Wafer Focused on AMHS (Automated Material Handling Systems)

Two-way material transportation method based on 300mm wafer FAB line simulation

On the Repair of Memory Cells with Spare Rows and Columns for Yield Improvement

I/O divided column redundancy scheme for high-speedDRAM with multiple I/Os

I/O divided column redundancy scheme for high-speed DRAM with multiple I/Os

I/O divided column redundancy scheme for high-speed DRAM with multiple I/Os

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