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Self-oscillating evanescent microwave probes for nondestructive evaluations of materials

IEEE transactions on instrumentation and measurement, 2002-10, Vol.51 (5), p.1126-1132

2002

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Relationship of the second order nonlinear optical coefficient to energy gap in inorganic non-centrosymmetric crystals

Infrared physics & technology, 1997-06, Vol.38 (4), p.233-244

1997

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Rough sets applied to materials data

Acta materialia, 1996-11, Vol.44 (11), p.4475-4484

1996

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A net with complex weights

IEEE transactions on neural networks, 2001-03, Vol.12 (2), p.236-249

2001

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Bulk deformation of Ti-6.8Mo-4.5Fe-1.5Al (Timetal LCB) alloy

Journal of materials engineering and performance, 1996-06, Vol.5 (3), p.335-352

1996

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Computer-aided design/engineering of bearing systems using the Dempster-Shafer theory

AI EDAM, 1995-01, Vol.9 (1), p.1-11

1995

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Transient thermography using evanescent microwave microscope

Review of scientific instruments, 1999-08, Vol.70 (8), p.3387-3390

1999

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Integration of design and manufacturing: solving setup generation and feature sequencing using an unsupervised-learning approach

Computer aided design, 1994, Vol.26 (1), p.59-75

1994

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The ensemble approach to neural-network learning and generalization

IEEE transactions on neural networks, 1999-01, Vol.10 (1), p.19-30

1999

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A Probability Neural Network (PNN) Estimator for Improved Reliability of "Noisy" Sensor Data

Journal of reinforced plastics and composites, 1991-07, Vol.10 (4), p.379-390

1991

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Evanescent microwave probes using coplanar waveguide and stripline for super-resolution imaging of materials

1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282), 1999, Vol.4, p.1859-1862 vol.4

1999

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0.4 μm spatial resolution with 1 GHz (λ=30 cm ) evanescent microwave probe

Review of scientific instruments, 1999-03, Vol.70 (3), p.1725-1729

1999

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Cellular automata model for the evolution of inert gas monolayers on a calcium (111) surface

Modelling and simulation in materials science and engineering, 1999-05, Vol.7 (3), p.355-367

1999

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Automated modular fixture planning: Geometric analysis

Robotics and computer-integrated manufacturing, 1998-02, Vol.14 (1), p.1-15

1998

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Applications of evanescent microwave probes in gas and chemical sensors

Sensors and actuators. B, Chemical, 2000-08, Vol.67 (1), p.112-121

2000

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Novel physical sensors using evanescent microwave probes

Review of scientific instruments, 1999-08, Vol.70 (8), p.3381-3386

1999

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Rough sets applied to the discovery of materials knowledge

Journal of alloys and compounds, 1998-09, Vol.279 (1), p.14-21

1998

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Local grain orientation and strain in polycrystalline YBa2Cu3O7−δ superconductor thin films measured by Raman spectroscopy

Journal of applied physics, 2001-06, Vol.89 (12), p.8030-8034

2001

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Decoupled flux control for molecular beam epitaxy

IEEE transactions on semiconductor manufacturing, 1993-11, Vol.6 (4), p.348-356

1993

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Automated modular fixture planning: Accuracy, clamping, and accessibility analyses

Robotics and computer-integrated manufacturing, 1998-02, Vol.14 (1), p.17-26

1998

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Evanescent Microwave Probes on High-Resistivity Silicon and its Application in Characterization of Semiconductors

Review of scientific instruments, 1999-07, Vol.70 (7), p.3083-3086

1999

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Nondestructive imaging of grain boundaries in polycrystalline materials using evanescent microwave probes

Engineering applications of artificial intelligence, 2000-10, Vol.13 (5), p.549-564

2000

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Local grain orientation and strain in polycrystalline YBa{sub 2}Cu{sub 3}O

Journal of applied physics, 2001-06, Vol.89 (12)

2001

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Effect of grain orientation and local strain on the quality of polycrystalline YBa sub 2 Cu sub 3 O sub 7 superconductive films

Philosophical magazine letters, 2002-04, Vol.82 (4), p.241-245

2002

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Non-destructive, in situ measurements of diamond-like-carbon film hardness using Raman and Rayleigh scattering

Journal of Raman spectroscopy, 1999-10, Vol.30 (10), p.947-950

1999

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Self-oscillating evanescent microwave probes for nondestructive evaluations of materials

Relationship of the second order nonlinear optical coefficient to energy gap in inorganic non-centrosymmetric crystals

Rough sets applied to materials data

A net with complex weights

Bulk deformation of Ti-6.8Mo-4.5Fe-1.5Al (Timetal LCB) alloy

Computer-aided design/engineering of bearing systems using the Dempster-Shafer theory

Transient thermography using evanescent microwave microscope

Integration of design and manufacturing: solving setup generation and feature sequencing using an unsupervised-learning approach

The ensemble approach to neural-network learning and generalization

A Probability Neural Network (PNN) Estimator for Improved Reliability of "Noisy" Sensor Data

Evanescent microwave probes using coplanar waveguide and stripline for super-resolution imaging of materials

0.4 μm spatial resolution with 1 GHz (λ=30 cm ) evanescent microwave probe

Cellular automata model for the evolution of inert gas monolayers on a calcium (111) surface

Automated modular fixture planning: Geometric analysis

Applications of evanescent microwave probes in gas and chemical sensors

Novel physical sensors using evanescent microwave probes

Rough sets applied to the discovery of materials knowledge

Local grain orientation and strain in polycrystalline YBa2Cu3O7−δ superconductor thin films measured by Raman spectroscopy

Decoupled flux control for molecular beam epitaxy

Automated modular fixture planning: Accuracy, clamping, and accessibility analyses

Evanescent Microwave Probes on High-Resistivity Silicon and its Application in Characterization of Semiconductors

Nondestructive imaging of grain boundaries in polycrystalline materials using evanescent microwave probes

Local grain orientation and strain in polycrystalline YBa{sub 2}Cu{sub 3}O

Effect of grain orientation and local strain on the quality of polycrystalline YBa sub 2 Cu sub 3 O sub 7 superconductive films

Non-destructive, in situ measurements of diamond-like-carbon film hardness using Raman and Rayleigh scattering

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