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Probing Metal Defects in CCD Image Sensors

MRS proceedings, 1995, Vol.378, p.713-724, Article 713

1995

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A model for charge transfer in buried-channel charge-coupled devices at low temperature

IEEE transactions on electron devices, 1991-05, Vol.38 (5), p.1162-1174

1991

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The effect of rapid thermal annealing on the precipitation of oxygen in silicon

Journal of applied physics, 1989-05, Vol.65 (9), p.3644-3654

1989

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Monte Carlo simulation of impurity diffusion in thin-film diffusion barriers

Journal of applied physics, 1986-03, Vol.59 (6), p.1986-1991

LAVINE, J. P

1986

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Defect site competition for metal atoms in intrinsically gettered silicon: numerical model

Journal of applied physics, 1987-09, Vol.62 (5), p.1682-1687

LAVINE, J. P

1987

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Monte Carlo treatment of impurity diffusion in polycrystalline films

Journal of applied physics, 1984-08, Vol.56 (4), p.924-926

1984

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The effect of potential obstacles on charge transfer in image sensors

IEEE transactions on electron devices, 1997-10, Vol.44 (10), p.1593-1598

1997

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Anomalous diffusion of implanted chlorine in silicon

MRS proceedings, 1995, Vol.354, p.275-280

1995

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The measurement of boron at silicon wafer surfaces by neutron depth profiling

Journal of applied physics, 1990-04, Vol.67 (8), p.3652-3654

1990

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Phosphorus diffusion in polycrystalline silicon

Journal of applied physics, 1984-02, Vol.55 (4), p.1218-1220

1984

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Calculated moments for the implantation of boron into silicides

Journal of applied physics, 1986-07, Vol.60 (1), p.14-16

1986

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Lateral motion of the inversion layer of MOS structures in regions of variable doping density and oxide thickness

Solid-state electronics, 1986-08, Vol.29 (8), p.815-823

1986

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AMS studies of the diffusion of chlorine in silicon wafers

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1995-05, Vol.99 (1), p.549-552

1995

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Diffusion in Two Dimensions in The Presence of Sinks

MRS proceedings, 1998, Vol.543, Article 231

Lavine, J. P.

1998

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Klein-Gordon particles in deep square wells

Lettere al Nuovo Cimento, 1979-12, Vol.26 (17), p.586-592

1979

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Applications of AMS to electronic and silver halide imaging research

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1990-12, Vol.52 (3), p.502-506

1990

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An analytical, aperture, and two-layer carrier diffusion MTF and quantum efficiency model for solid-state image sensors

IEEE transactions on electron devices, 1994-10, Vol.41 (10), p.1753-1760

1994

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Steady-state photocarrier collection in silicon imaging devices

IEEE transactions on electron devices, 1983-09, Vol.30 (9), p.1123-1134

1983

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On the application of continued fractions to bound-state problems

Journal of physics. A, Mathematical, nuclear and general, 1973-10, Vol.6 (10), p.L137-L139

1973

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Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices

IEEE transactions on electron devices, 1985-10, Vol.32 (10), p.2087-2091

1985

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Effects of Deliberate Metal Contamination on CCD Imagers

MRS proceedings, 1992, Vol.262, Article 769

1992

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Reduction of lateral diffusion of photoelectrons in silicon photodiode imager arrays by internal gettering

IEEE transactions on electron devices, 1983-10, Vol.30 (10), p.1392-1394

1983

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Latch-up and image crosstalk suppression by internal gettering

IEEE transactions on electron devices, 1984-02, Vol.31 (2), p.225-231, Article 225

1984

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Silicon Wafer Defect Self-Characterization with CCD Image Sensors

MRS proceedings, 2005, Vol.864, Article E6.3

2005

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Radiative pion-proton scattering in the static Chew-Low model

Physics letters. B, 1976-01, Vol.60 (3), p.269-272

1976

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Probing Metal Defects in CCD Image Sensors

A model for charge transfer in buried-channel charge-coupled devices at low temperature

The effect of rapid thermal annealing on the precipitation of oxygen in silicon

Monte Carlo simulation of impurity diffusion in thin-film diffusion barriers

Defect site competition for metal atoms in intrinsically gettered silicon: numerical model

Monte Carlo treatment of impurity diffusion in polycrystalline films

The effect of potential obstacles on charge transfer in image sensors

Anomalous diffusion of implanted chlorine in silicon

The measurement of boron at silicon wafer surfaces by neutron depth profiling

Phosphorus diffusion in polycrystalline silicon

Calculated moments for the implantation of boron into silicides

Lateral motion of the inversion layer of MOS structures in regions of variable doping density and oxide thickness

AMS studies of the diffusion of chlorine in silicon wafers

Diffusion in Two Dimensions in The Presence of Sinks

Klein-Gordon particles in deep square wells

Applications of AMS to electronic and silver halide imaging research

An analytical, aperture, and two-layer carrier diffusion MTF and quantum efficiency model for solid-state image sensors

Steady-state photocarrier collection in silicon imaging devices

On the application of continued fractions to bound-state problems

Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices

Effects of Deliberate Metal Contamination on CCD Imagers

Reduction of lateral diffusion of photoelectrons in silicon photodiode imager arrays by internal gettering

Latch-up and image crosstalk suppression by internal gettering

Silicon Wafer Defect Self-Characterization with CCD Image Sensors

Radiative pion-proton scattering in the static Chew-Low model

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