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Chemical sputtering by H2 + and H3 + ions during silicon deposition

Journal of applied physics, 2016-08, Vol.120 (5)

2016

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X-ray coherent scattering form factors of tissues, water and plastics using energy dispersion

Physics in medicine & biology, 2011-07, Vol.56 (14), p.4377-4397

2011

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Constrained Source Space MR Spectroscopy: Multiple Voxels, No Gradient Readout

American journal of neuroradiology : AJNR, 2015-08, Vol.36 (8), p.1436-1443

2015

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Note: Laser-cut molybdenum grids for a retarding field energy analyzer

Review of scientific instruments, 2017-06, Vol.88 (6)

2017

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SU‐E‐I‐187: Coherent Scatter Ring Integration Imaging

Medical Physics, 2011-06, Vol.38 (6), p.3439-3439

2011

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Poster — Thur Eve — 37: Incorporation of K‐Edge Materials into Dual‐Energy X‐Ray Imaging Theory

Medical Physics, 2010-07, Vol.37 (7), p.3893-3894

2010

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EP-1796: Template-based commissioning model for in vivo EPID transit dosimetry

Radiotherapy and oncology, 2018-04, Vol.127, p.S964-S965

2018

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Chemical sputtering by H{sub 2}{sup +} and H{sub 3}{sup +} ions during silicon deposition

Journal of applied physics, 2016-08, Vol.120 (5)

2016

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(Invited) Conductive Bridging RAM (CBRAM): Then, Now, and Tomorrow

ECS transactions, 2016, Vol.75 (5), p.41-54

2016

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(Invited) Xenes: A New Emerging Two-Dimensional Materials Platform for Nanoelectronics

ECS transactions, 2016, Vol.75 (5), p.163-173

Molle, Alessandro

2016

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(Invited) Ferroelectric Hafnium Oxide Based Materials and Devices: Assessment of Current Status and Future Prospects

ECS transactions, 2014-08, Vol.64 (8), p.159-168

2014

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(Invited) Mobile Ions, Transport and Redox Processes in Memristive Devices

ECS transactions, 2016, Vol.75 (5), p.27-39

2016

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Silicene Nanoribbon Tunnel Field Effect Transistor

ECS transactions, 2016, Vol.75 (5), p.175-181

2016

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Current Coupling Effect in MIS Tunnel Diode with Coupled Open-Gated MIS Structure

ECS transactions, 2016, Vol.75 (5), p.77-86

2016

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Across‐vendor standardization of semi‐LASER for single‐voxel MRS at 3T

NMR in biomedicine, 2021-05, Vol.34 (5), p.e4218-n/a

2021

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Conductive AFM Topography of Intrinsic Conductivity Variations in Silica Based Dielectrics for Memory Applications

ECS transactions, 2016, Vol.75 (5), p.3-9

2016

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(Invited) Internal Photoemission of Electrons from 2-Dimensional Semiconductors

ECS transactions, 2017, Vol.80 (1), p.191-201

2017

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Selected Success Stories from Twenty Years of High-k Gate Dielectric Research

ECS transactions, 2016, Vol.75 (5), p.245-261

Kar, Samares

2016

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Oxygen Polyvacancies as Conductive Filament in Zirconia: First Principle Simulation

ECS transactions, 2017, Vol.80 (1), p.357-362

2017

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Selective-Area Growth of Vertical InGaAs Nanowires on Ge for Transistor Applications

ECS transactions, 2016-10, Vol.75 (5), p.265-270

2016

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Charge Transport Mechanism of Stress Induced Leakage Current in Thermal Silicon Oxide

ECS transactions, 2016, Vol.75 (5), p.57-62

2016

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Structure of Pr Oxide Films on Si Deposited by Reactive Sputtering

ECS transactions, 2016, Vol.75 (5), p.301-309

2016

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(Invited) First Principles and Themodynamical Studies on Matel Organic Vaper Phase Epitaxy of GaN

ECS transactions, 2017, Vol.80 (1), p.295-301

2017

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Electrically Scaled Hafnium Oxide Based Ge Devices

ECS transactions, 2016, Vol.75 (5), p.135-140

2016

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(Invited) Generation-Recombination Noise in Advanced CMOS Devices

ECS transactions, 2016-08, Vol.75 (5), p.111-120

2016

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Chemical sputtering by H2 + and H3 + ions during silicon deposition

X-ray coherent scattering form factors of tissues, water and plastics using energy dispersion

Constrained Source Space MR Spectroscopy: Multiple Voxels, No Gradient Readout

Note: Laser-cut molybdenum grids for a retarding field energy analyzer

SU‐E‐I‐187: Coherent Scatter Ring Integration Imaging

Poster — Thur Eve — 37: Incorporation of K‐Edge Materials into Dual‐Energy X‐Ray Imaging Theory

EP-1796: Template-based commissioning model for in vivo EPID transit dosimetry

Chemical sputtering by H{sub 2}{sup +} and H{sub 3}{sup +} ions during silicon deposition

(Invited) Conductive Bridging RAM (CBRAM): Then, Now, and Tomorrow

(Invited) Xenes: A New Emerging Two-Dimensional Materials Platform for Nanoelectronics

(Invited) Ferroelectric Hafnium Oxide Based Materials and Devices: Assessment of Current Status and Future Prospects

(Invited) Mobile Ions, Transport and Redox Processes in Memristive Devices

Silicene Nanoribbon Tunnel Field Effect Transistor

Current Coupling Effect in MIS Tunnel Diode with Coupled Open-Gated MIS Structure

Across‐vendor standardization of semi‐LASER for single‐voxel MRS at 3T

Conductive AFM Topography of Intrinsic Conductivity Variations in Silica Based Dielectrics for Memory Applications

(Invited) Internal Photoemission of Electrons from 2-Dimensional Semiconductors

Selected Success Stories from Twenty Years of High-k Gate Dielectric Research

Oxygen Polyvacancies as Conductive Filament in Zirconia: First Principle Simulation

Selective-Area Growth of Vertical InGaAs Nanowires on Ge for Transistor Applications

Charge Transport Mechanism of Stress Induced Leakage Current in Thermal Silicon Oxide

Structure of Pr Oxide Films on Si Deposited by Reactive Sputtering

(Invited) First Principles and Themodynamical Studies on Matel Organic Vaper Phase Epitaxy of GaN

Electrically Scaled Hafnium Oxide Based Ge Devices

(Invited) Generation-Recombination Noise in Advanced CMOS Devices

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