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Core-level spectroscopy of the clean Si(001) surface : charge transfer within asymmetric dimers of the 2×1 and c(4×2) reconstructions

Physical review letters, 1992-09, Vol.69 (10), p.1588-1591

1992

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Electronic structure of clean and hydrogen-chemisorbed Ge(001) surfaces studied by photoelectron spectroscopy

Physical review. B, Condensed matter, 1994-06, Vol.49 (23), p.16523-16533

1994

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Sputtering of Ge(001): transition between dynamic scaling regimes

Surface science, 1997-04, Vol.377, p.1038-1041

1997

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Dimer structure of the Si(001)2 × 1 and c(4 × 2) reconstructions derived from core-level and valence-band photoemission results

Surface science, 1993-05, Vol.287, p.529-533

1993

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Dimer structure of the Si(001) 2 × 1 and c(4 × 2) reconstructions derived from core-level and valence-band photoemission results

Surface science letters, 1993-05, Vol.287, p.A400-A400

1993

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Ag/Cu(111): an incommensurate reconstruction studied with scanning tunneling microscopy and surface x-ray diffraction

Microscopy microanalysis microstructures (Les Ulis), 1997-06, Vol.8 (3), p.167-174

1997

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An Incommensurate Reconstruction Studied with Scanning Tunnelling Microscopy and Surface X-Ray Diffraction

Microscopy microanalysis microstructures (Les Ulis), 1997-06, Vol.8 (3), p.167-174

1997

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Core-level spectroscopy of the clean Si(001) surface : charge transfer within asymmetric dimers of the 2×1 and c(4×2) reconstructions

Electronic structure of clean and hydrogen-chemisorbed Ge(001) surfaces studied by photoelectron spectroscopy

Sputtering of Ge(001): transition between dynamic scaling regimes

Dimer structure of the Si(001)2 × 1 and c(4 × 2) reconstructions derived from core-level and valence-band photoemission results

Dimer structure of the Si(001) 2 × 1 and c(4 × 2) reconstructions derived from core-level and valence-band photoemission results

Ag/Cu(111): an incommensurate reconstruction studied with scanning tunneling microscopy and surface x-ray diffraction

An Incommensurate Reconstruction Studied with Scanning Tunnelling Microscopy and Surface X-Ray Diffraction

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