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Texture, residual stress and structural analysis of thin films using a combined X-ray analysis

Thin solid films, 2004-02, Vol.450 (1), p.34-41

2004

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Combining XRD and XRF analysis in one Rietveld-like fitting

Powder diffraction, 2017-09, Vol.32 (S1), p.S225-S230

2017

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Texture analysis with the new HIPPO TOF diffractometer

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2003-12, Vol.515 (3), p.575-588

2003

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X-ray diffraction characterization of heavily deformed metallic specimens

Acta materialia, 1998-12, Vol.46 (1), p.101-110

1998

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Rietveld texture analysis from TOF neutron diffraction data

Powder diffraction, 2010-09, Vol.25 (3), p.283-296

2010

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Combined XRD-XRF cluster analysis for automatic chemical and crystallographic surface mappings

Powder diffraction, 2019-09, Vol.34 (S1), p.S36-S41

2019

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In situ observation of texture evolution during α → β and β → α phase transformations in titanium alloys investigated by neutron diffraction

Acta materialia, 2007-10, Vol.55 (17), p.5718-5727

2007

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Rietveld texture analysis from diffraction images

Supplement issues of Zeitschrift für Kristallographie, 2007-11, Vol.2007 (suppl_26), p.125-130

2007

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Characterization of nanograined powder samples using the Rietveld method applied to electron diffraction ring patterns

Powder diffraction, 2017-09, Vol.32 (S1), p.S63-S68

2017

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Fast microstructure and phase analyses of nanopowders using combined analysis of transmission electron microscopy scattering patterns

Acta crystallographica. Section A, Foundations and advances, 2014-09, Vol.70 (5), p.448-456

2014

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Characterization of the mistura alloy used for Venetian sesino coins: 16th century

X-ray spectrometry, 2019-01, Vol.48 (1), p.8-20

2019

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Textured Al-doped ZnO ceramics with isotropic grains

Journal of the European Ceramic Society, 2014-12, Vol.34 (16), p.4247-4256

2014

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Combined texture and structure analysis of deformed limestone from time-of-flight neutron diffraction spectra

Journal of applied physics, 1997-01, Vol.81 (2), p.594-600

1997

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Structural analysis of strained LaVO3 thin films

Journal of physics. Condensed matter, 2015-05, Vol.27 (17), p.175001-175001

2015

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Growth and texture of spark plasma sintered Al2O3 ceramics: A combined analysis of X-rays and electron back scatter diffraction

Journal of applied physics, 2013-04, Vol.113 (15)

2013

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X-ray textural and microstructural characterisations by using the Combined Analysis Approach for the optical optimisation of micro- and nano-structured thin films

Thin solid films, 2009-10, Vol.517 (23), p.6264-6270

2009

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Combining grazing incidence X-ray diffraction and X-ray reflectivity for the evaluation of the structural evolution of HfO2 thin films with annealing

Thin solid films, 2004-02, Vol.450 (1), p.134-137

2004

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Voyaging around nacre with the X-ray shuttle: From bio-mineralisation to prosthetics via mollusc phylogeny

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2010-11, Vol.528 (1), p.37-51

2010

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Full‐profile search–match by the Rietveld method

Journal of applied crystallography, 2019-06, Vol.52 (3), p.587-598

2019

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Structural analysis of strained LaVO 3 thin films

Journal of physics. Condensed matter, 2015-05, Vol.27 (17), p.175001

2015

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Quantitative texture analysis with the HIPPO neutron TOF diffractometer

Journal of applied crystallography, 2005-06, Vol.38 (3), p.462-475

2005

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Quantitative Analysis of Silicate Glass in Ceramic Materials by the Rietveld Method

Materials science forum, 1998-04, Vol.278-281, p.87-92

1998

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32-Channel Detection Unit for Combined XRF-XRD in Mining Transportable Applications

2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2019, p.1-3

2019

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Simultaneous structure and size-strain refinement by the Rietveld method

Journal of applied crystallography, 1990-08, Vol.23 (4), p.246-252

1990

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Texture measurements using the new neutron diffractometer HIPPO and their analysis using the Rietveld method

Powder diffraction, 2004-03, Vol.19 (1), p.65-68

2004

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Texture, residual stress and structural analysis of thin films using a combined X-ray analysis

Combining XRD and XRF analysis in one Rietveld-like fitting

Texture analysis with the new HIPPO TOF diffractometer

X-ray diffraction characterization of heavily deformed metallic specimens

Rietveld texture analysis from TOF neutron diffraction data

Combined XRD-XRF cluster analysis for automatic chemical and crystallographic surface mappings

In situ observation of texture evolution during α → β and β → α phase transformations in titanium alloys investigated by neutron diffraction

Rietveld texture analysis from diffraction images

Characterization of nanograined powder samples using the Rietveld method applied to electron diffraction ring patterns

Fast microstructure and phase analyses of nanopowders using combined analysis of transmission electron microscopy scattering patterns

Characterization of the mistura alloy used for Venetian sesino coins: 16th century

Textured Al-doped ZnO ceramics with isotropic grains

Combined texture and structure analysis of deformed limestone from time-of-flight neutron diffraction spectra

Structural analysis of strained LaVO3 thin films

Growth and texture of spark plasma sintered Al2O3 ceramics: A combined analysis of X-rays and electron back scatter diffraction

X-ray textural and microstructural characterisations by using the Combined Analysis Approach for the optical optimisation of micro- and nano-structured thin films

Combining grazing incidence X-ray diffraction and X-ray reflectivity for the evaluation of the structural evolution of HfO2 thin films with annealing

Voyaging around nacre with the X-ray shuttle: From bio-mineralisation to prosthetics via mollusc phylogeny

Full‐profile search–match by the Rietveld method

Structural analysis of strained LaVO 3 thin films

Quantitative texture analysis with the HIPPO neutron TOF diffractometer

Quantitative Analysis of Silicate Glass in Ceramic Materials by the Rietveld Method

32-Channel Detection Unit for Combined XRF-XRD in Mining Transportable Applications

Simultaneous structure and size-strain refinement by the Rietveld method

Texture measurements using the new neutron diffractometer HIPPO and their analysis using the Rietveld method

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