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Progress in ultrahigh energy resolution EELS

Ultramicroscopy, 2019-08, Vol.203, p.60-67

2019

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Aberration‐corrected STEM for atomic‐resolution imaging and analysis

Journal of microscopy (Oxford), 2015-09, Vol.259 (3), p.165-172

2015

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Multi-Sun EELS: Ultra-High Energy Resolution combined with High Spatial Resolution and High Beam Current

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2640-2642

2022

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Advances in Ultra-High Energy Resolution STEM-EELS

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.446-447

2018

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Localized signals in vibrational STEM-EELS

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.1538-1539

2017

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Ultra-High Energy Resolution EELS

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.1552-1553

2017

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Opportunities and Challenges in Ultra-High Energy Resolution EELS

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.952-953

2016

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Advances in STEM and EELS: New Operation Modes, Detectors and Software

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.512-513

2019

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Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.558-559

2014

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Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.928-929

2014

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Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.72-73

2014

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Using Nion Swift for Data Collection, Analysis and Display

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1108-1109

2014

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Vibrational phonon spectroscopy of boron nitride polymorphs: a comparison between theory and experiment

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.1469-1470

2015

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STEM-EDXS System for Atomic-Sensitivity Elemental Mapping

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.339-340

2015

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Hydrogen Analysis by Ultra-High Energy Resolution EELS

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.661-662

2015

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Exploring Phonon Signals by High Energy / High Spatial Resolution EELS

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.66-67

2014

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Improving the Spatial Resolution of Low-keV STEM with a Monochromator

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.312-313

2013

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Monochromated STEM with high energy and spatial resolutions

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.330-331

2012

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High Energy Resolution Monochromated EELS-STEM System

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.1124-1125

2013

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SDD-EDS: Element Analysis of Nanostructures in TEM

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.1058-1059

2012

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Exploring new frontiers with the Nion aberration-corrected STEM

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.1278-1279

2012

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Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.976-977

2012

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Correlation between morphology, chemical environment, and ferromagnetism in the intrinsic-vacancy dilute magnetic semiconductor Cr-doped Ga2Se3/Si(001)

Physical review. B, Condensed matter and materials physics, 2011-01, Vol.83 (4)

2011

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Progress in ultrahigh energy resolution EELS

Aberration‐corrected STEM for atomic‐resolution imaging and analysis

Multi-Sun EELS: Ultra-High Energy Resolution combined with High Spatial Resolution and High Beam Current

Advances in Ultra-High Energy Resolution STEM-EELS

Localized signals in vibrational STEM-EELS

Ultra-High Energy Resolution EELS

Opportunities and Challenges in Ultra-High Energy Resolution EELS

Advances in STEM and EELS: New Operation Modes, Detectors and Software

Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements

Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors

Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS

Using Nion Swift for Data Collection, Analysis and Display

Vibrational phonon spectroscopy of boron nitride polymorphs: a comparison between theory and experiment

STEM-EDXS System for Atomic-Sensitivity Elemental Mapping

Hydrogen Analysis by Ultra-High Energy Resolution EELS

Exploring Phonon Signals by High Energy / High Spatial Resolution EELS

Improving the Spatial Resolution of Low-keV STEM with a Monochromator

Monochromated STEM with high energy and spatial resolutions

High Energy Resolution Monochromated EELS-STEM System

SDD-EDS: Element Analysis of Nanostructures in TEM

Exploring new frontiers with the Nion aberration-corrected STEM

Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy

Correlation between morphology, chemical environment, and ferromagnetism in the intrinsic-vacancy dilute magnetic semiconductor Cr-doped Ga2Se3/Si(001)

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