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A microfocus X-ray fluorescence beamline at Indus-2 synchrotron radiation facility

Journal of synchrotron radiation, 2013-03, Vol.20 (2), p.386-389

2013

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Optical properties of zirconium carbide in 60–200 Å wavelength region using x-ray reflectivity technique

Applied optics (2004), 2015-01, Vol.54 (2), p.253

2015

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Micromanufacturing: A review—Part I

Proceedings of the Institution of Mechanical Engineers. Part B, Journal of engineering manufacture, 2014-09, Vol.228 (9), p.973-994

2014

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Cleaning of carbon layer from the gold films using a pulsed Nd:YAG laser

Applied surface science, 2013-10, Vol.283, p.612-616

2013

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Effect of coherent to incoherent structural transition on magnetic anisotropy in Co/Pt multilayers

Journal of applied physics, 2012-07, Vol.112 (2)

2012

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Quantitative determination of higher harmonic content in the soft x-ray spectra of toroidal grating monochromator using a reflection multilayer

Applied optics (2004), 2012-06, Vol.51 (16), p.3552

2012

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Oxidation studies of niobium thin films at room temperature by X-ray reflectivity

Applied surface science, 2010-10, Vol.257 (1), p.222-226

2010

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A study on the effect of tantalum-impurity content on the superconducting properties of niobium materials used for making superconducting radio frequency cavities

Superconductor science & technology, 2012-11, Vol.25 (11), p.115020-1-11

2012

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Thermal stability studies of ion beam sputter deposited C/B4C X-ray multilayer mirror

Thin solid films, 2013-01, Vol.527, p.244-249

2013

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Structural asymmetry of Si/Fe and Fe/Si interface in Fe/Si multilayers

Journal of physics. D, Applied physics, 2008-06, Vol.41 (11), p.115307-115307 (6)

2008

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Ion beam sputter deposited W/Si multilayers: Influence of re-sputtering on the interface structure and structure modification at ultra short periods

Applied surface science, 2011-10, Vol.257 (24), p.10704-10709

2011

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Origin of step-like behavior in the Co/Si system

Journal of physics. Condensed matter, 2011-06, Vol.23 (24), p.246004-8

2011

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Synchrotron μ-XRF study on compositional uniformity of uranium-thorium oxide pellets prepared by different processes

X-ray spectrometry, 2014-05, Vol.43 (3), p.152-156

2014

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Determination of K–L vacancy transfer probabilities of some 3d elements using synchrotron radiation

Canadian journal of physics, 2015-07, Vol.93 (7), p.760-764

2015

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Analysis of soft x-ray/VUV transmission characteristics of Si and Al filters

AIP conference proceedings, 2013-02, Vol.1512 (1)

2013

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Applications of the 'CATGIXRF' computer program to the grazing incidence X-ray fluorescence and X-ray reflectivity characterization of thin films and surfaces

X-ray spectrometry, 2010-03, Vol.39 (2), p.127-134

2010

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Synchrotron-induced EDXRF determination of uranium and thorium in mixed uranium-thorium oxide pellets

X-ray spectrometry, 2013-01, Vol.42 (1), p.4-7

2013

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Structural and superconducting properties of ion beam sputtered Nb thin films and Nb/Cu bilayers

Physica. C, Superconductivity, 2012, Vol.472 (1), p.21-28

2012

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Characterization of trace embedded impurities in thin multilayer structures using synchrotron X-ray standing waves

Surface and interface analysis, 2010-02, Vol.42 (2), p.110-116

2010

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Interface smoothing of soft x-ray Mo/Y multilayer mirror by thermal treatment

Journal of physics. D, Applied physics, 2007-11, Vol.40 (21), p.6684-6689

2007

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Study of structural and optical properties of zirconium carbide (ZrC) thin-films deposited by ion beam sputtering for soft x-ray optical applications

Surface & coatings technology, 2015-06, Vol.272, p.409-414

2015

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Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity

Journal of applied crystallography, 2015-06, Vol.48 (3), p.786-796

2015

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Optical and structural characterization of rapid thermal annealed non-stoichiometric silicon nitride film

Journal of physics. Condensed matter, 2008-08, Vol.20 (33), p.335232-335232 (5)

2008

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Fabrication and performance of a high resolution ultra-short period W/B4C multilayer structure

Journal of physics. D, Applied physics, 2016-02, Vol.49 (13)

2016

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Smoothening of tungsten–carbon interfaces and change in interface asymmetry on heat treatment

Thin solid films, 2006-05, Vol.503 (1-2), p.115-120

2006

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A microfocus X-ray fluorescence beamline at Indus-2 synchrotron radiation facility

Optical properties of zirconium carbide in 60–200 Å wavelength region using x-ray reflectivity technique

Micromanufacturing: A review—Part I

Cleaning of carbon layer from the gold films using a pulsed Nd:YAG laser

Effect of coherent to incoherent structural transition on magnetic anisotropy in Co/Pt multilayers

Quantitative determination of higher harmonic content in the soft x-ray spectra of toroidal grating monochromator using a reflection multilayer

Oxidation studies of niobium thin films at room temperature by X-ray reflectivity

A study on the effect of tantalum-impurity content on the superconducting properties of niobium materials used for making superconducting radio frequency cavities

Thermal stability studies of ion beam sputter deposited C/B4C X-ray multilayer mirror

Structural asymmetry of Si/Fe and Fe/Si interface in Fe/Si multilayers

Ion beam sputter deposited W/Si multilayers: Influence of re-sputtering on the interface structure and structure modification at ultra short periods

Origin of step-like behavior in the Co/Si system

Synchrotron μ-XRF study on compositional uniformity of uranium-thorium oxide pellets prepared by different processes

Determination of K–L vacancy transfer probabilities of some 3d elements using synchrotron radiation

Analysis of soft x-ray/VUV transmission characteristics of Si and Al filters

Applications of the 'CATGIXRF' computer program to the grazing incidence X-ray fluorescence and X-ray reflectivity characterization of thin films and surfaces

Synchrotron-induced EDXRF determination of uranium and thorium in mixed uranium-thorium oxide pellets

Structural and superconducting properties of ion beam sputtered Nb thin films and Nb/Cu bilayers

Characterization of trace embedded impurities in thin multilayer structures using synchrotron X-ray standing waves

Interface smoothing of soft x-ray Mo/Y multilayer mirror by thermal treatment

Study of structural and optical properties of zirconium carbide (ZrC) thin-films deposited by ion beam sputtering for soft x-ray optical applications

Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity

Optical and structural characterization of rapid thermal annealed non-stoichiometric silicon nitride film

Fabrication and performance of a high resolution ultra-short period W/B4C multilayer structure

Smoothening of tungsten–carbon interfaces and change in interface asymmetry on heat treatment

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