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Nanoscale effects in focused ion beam processing

Applied physics. A, Materials science & processing, 2003-05, Vol.76 (7), p.1017-1023

2003

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UV nanoimprint materials: Surface energies, residual layers, and imprint quality

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2007-05, Vol.25 (3), p.785-790

2007

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Limitations of focused ion beam nanomachining

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2001-11, Vol.19 (6), p.2533-2538

2001

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Utility of the Beck Depression Inventory in Patients with Chronic Kidney Disease Stage 4 without Kidney Replacement Therapy

Nephrology nursing journal : journal of the American Nephrology Nurses' Association, 2021-03, Vol.48 (2), p.147

2021

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Simulation of ion beam direct structuring for 3D nanoimprint template fabrication

Microelectronic engineering, 2006-04, Vol.83 (4), p.936-939

2006

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Curating Difficult Knowledge: Violent Pasts in Public Places

1, 2011

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Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2004-05, Vol.22 (3), p.1402-1406

2004

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Tetramethoxysilane as a precursor for focused ion beam and electron beam assisted insulator (SiO x ) deposition

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 1996-11, Vol.14 (6), p.3920-3923

1996

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Field emitter array fabricated using focused ion and electron beam induced reaction

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2000-03, Vol.18 (2), p.976-979

2000

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Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining

Microelectronic engineering, 2001-09, Vol.57, p.721-728

2001

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High‐resolution constant‐height imaging with apertured silicon cantilever probes

Journal of microscopy (Oxford), 2001-04, Vol.202 (1), p.22-27

2001

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Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams

Journal of microscopy (Oxford), 1999-05, Vol.194 (2‐3), p.335-339

1999

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A comparison of focused ion beam and electron beam induced deposition processes

Microelectronics and reliability, 1996-11, Vol.36 (11-12), p.1779-1782

1996

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Fabrication of field emitter array using focused ion and electron beam induced reaction

Microelectronic engineering, 1998-03, Vol.41, p.453-456

1998

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AFM and STM investigation of carbon nanotubes produced by high energy ion irradiation of graphite

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1999, Vol.147 (1), p.142-147

1999

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Investigation of Cu films by focused ion beam induced deposition using nuclear microprobe

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1999-09, Vol.158 (1-4), p.493-498, Article 493

1999

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Comparison of beam-induced deposition using ion microprobe

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1999, Vol.148 (1), p.25-31

1999

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Impurity incorporation during beam assisted processing analyzed using nuclear microprobe

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1999-09, Vol.158 (1-4), p.487-492

1999

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Economiser au détriment des femmes?: Politique d'austérité de la Confédération, des cantons et des communes: conséquences pour les femmes. Résumé d'une étude scientifique effectuée à la demande de la Conférence suisse des déléguées à l'égalité entre femmes et Hommes et du Syndicat suisse des services publics SSP

Schweizerischer Verband des Personals Öffentlicher Dienste. Sektion Lehrer

1996

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Microanalysis of masklessly fabricated microstructures using nuclear microprobe

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1998-03, Vol.136, p.373-378

1998

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Déclaration LCH - SER et COHEP sur la formation des enseignant-e-s, 17 août 2011

2011

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Hypothermia prolongs survival in a confined atmosphere

Military medicine, 1993-12, Vol.158 (12), p.798-802

1993

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PISA 2006: Pressekonferenz BFS-EDK vom 4.12.2007 [Pressemappe]

2007

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The effect of hypothermia on gas exchange in anaesthetized rats in a confined atmosphere

Journal of basic and clinical physiology and pharmacology, 1994-07, Vol.5 (3-4), p.277-294

1994

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Materials Processing by Focused lon Beams for TEM Sample Preparation and Nanostructuring / Materialbearbeitung mittels fokussierter lonenstrahlen zur TEM-Probenpräraration und Nanostrukturierung

Praktische Metallographie, 2003-04, Vol.40 (4), p.184-192

2003

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Nanoscale effects in focused ion beam processing

UV nanoimprint materials: Surface energies, residual layers, and imprint quality

Limitations of focused ion beam nanomachining

Utility of the Beck Depression Inventory in Patients with Chronic Kidney Disease Stage 4 without Kidney Replacement Therapy

Simulation of ion beam direct structuring for 3D nanoimprint template fabrication

Curating Difficult Knowledge: Violent Pasts in Public Places

Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams

Tetramethoxysilane as a precursor for focused ion beam and electron beam assisted insulator (SiO x ) deposition

Field emitter array fabricated using focused ion and electron beam induced reaction

Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining

High‐resolution constant‐height imaging with apertured silicon cantilever probes

Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams

A comparison of focused ion beam and electron beam induced deposition processes

Fabrication of field emitter array using focused ion and electron beam induced reaction

AFM and STM investigation of carbon nanotubes produced by high energy ion irradiation of graphite

Investigation of Cu films by focused ion beam induced deposition using nuclear microprobe

Comparison of beam-induced deposition using ion microprobe

Impurity incorporation during beam assisted processing analyzed using nuclear microprobe

Microanalysis of masklessly fabricated microstructures using nuclear microprobe

Déclaration LCH - SER et COHEP sur la formation des enseignant-e-s, 17 août 2011

Hypothermia prolongs survival in a confined atmosphere

PISA 2006: Pressekonferenz BFS-EDK vom 4.12.2007 [Pressemappe]

The effect of hypothermia on gas exchange in anaesthetized rats in a confined atmosphere

Materials Processing by Focused lon Beams for TEM Sample Preparation and Nanostructuring / Materialbearbeitung mittels fokussierter lonenstrahlen zur TEM-Probenpräraration und Nanostrukturierung

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