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Magnetic and optical properties of GaMnN magnetic semiconductor

Applied physics letters, 2001-02, Vol.78 (9), p.1276-1278

2001

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Characterization of crystal lattice defects in calcium molybdate single crystals (CaMoO4) by means of X-ray diffraction topography

X-ray spectrometry, 2015-09, Vol.44 (5), p.351-355

2015

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"Ghost" segregation pattern and ferroelectric domains in mixed calcium-strontium-barium niobates

X-ray spectrometry, 2015-09, Vol.44 (5), p.356-362

2015

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X-ray topography of GdCa4O(BO3)3 single crystals grown by the Czochralski method

Physica status solidi. A, Applications and materials science, 2006-02, Vol.203 (2), p.220-226

2006

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X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

Journal of crystal growth, 2008-07, Vol.310 (14), p.3398-3402

2008

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X-ray topography of SrLaGaO4 single crystals

Journal of crystal growth, 2006-04, Vol.290 (1), p.149-155

2006

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X-Ray Diffraction Contrast of a 60° Dislocation Investigated by Means of Section Topography

August 16, 2021, Vol.48, Number 2, p.565-570

2021

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Extended defects in GdCa4O(BO3)3 crystals

Journal of crystal growth, 2004-02, Vol.262 (1-4), p.388-394

2004

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Synchrotron white beam topography studies of SrLaGaO4 crystals

Journal of alloys and compounds, 2005-09, Vol.401 (1-2), p.75-79

2005

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Investigation of the defects distribution along the growth direction in GdCOB crystals by synchrotron and conventional X-ray topography

Journal of alloys and compounds, 2005-09, Vol.401 (1), p.69-74

2005

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Bragg-case section topography of growth defects in Si : Ge crystals

Journal of physics. D, Applied physics, 2003-05, Vol.36 (10A), p.A133-A138

2003

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Conventional and synchrotron radiation back reflection topography of GdCa4O(BO3)3 crystals

Journal of alloys and compounds, 2004-11, Vol.382 (1-2), p.153-159

2004

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Dislocations Generated in Si Annealed under Normal or High Pressure

Physica status solidi. A, Applied research, 1999-01, Vol.171 (1), p.105-110

Lefeld-Sosnowska, M.

1999

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Extended defects in GaN single crystals

Journal of physics. D, Applied physics, 2001-05, Vol.34 (10A), p.A148-A150

2001

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Topography and lattice parameter of Si:Ge bulk crystals

Journal of physics. D, Applied physics, 2001-05, Vol.34 (10A), p.A144-A147

2001

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Studies of growth bands in Si:Ge crystals

Materials science & engineering. B, Solid-state materials for advanced technology, 2002-04, Vol.91, p.462-465

2002

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Extended defect structure induced by pulsed laser annealing in Ge implanted Si crystal

Journal of alloys and compounds, 2001, Vol.328 (1), p.242-247

2001

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Study of Extended Defect Structure Induced by Pulsed Laser Annealing in Implanted Silicon Crystals

Physica status solidi. A, Applied research, 1999-01, Vol.171 (1), p.389-394

1999

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X-ray Diffraction Topography - Investigation of Single Crystals Grown by the Czochralski Method

Acta physica Polonica, A, 2013-08, Vol.124 (2), p.360-371

2013

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Interference Fringes in the Plane Wave Topographic Images of Growth Bands in Si:Ge

Acta physica Polonica, A, 2002-05, Vol.101 (5), p.729-734

2002

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Study of Si-Implanted and Thermally Annealed Layers of Silicon by Using X-ray Grazing Incidence Methods

Acta physica Polonica, A, 2002-05, Vol.101 (5), p.795-801

2002

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Experimental and computer simulation study of the variation with depth of the X-ray section topograph images of a dislocation

Journal of applied crystallography, 1985-04, Vol.18 (2), p.93-105

1985

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Synchrotron diffraction topography of SrxBa1−xNb2O6 (SBN), CaxBa1−xNb2O6 (CBN) and mixed (Ca0.28Ba0.72)y(Sr0.61Ba0.39)1−yNb2O6 (CSBN) crystals

Radiation physics and chemistry (Oxford, England : 1993), 2013-12, Vol.93, p.87-91

2013

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Synchrotron diffraction topography of Sr sub(x)Ba sub(1-x)Nb sub(2)O sub(6) (SBN), Ca sub(x)Ba sub(1-x)Nb sub(2)O sub(6) (CBN) and mixed (Ca sub(0.28)Ba sub(0.72)) sub(y)(Sr sub(0.61)B a sub(0.39)) sub(1-y)Nb sub(2)O sub(6) (CSBN) crystals

Radiation physics and chemistry (Oxford, England : 1993), 2013-12, Vol.93, p.87-91

2013

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Synchrotron diffraction topography of Sr(x)Ba(1-x)Nb(2)O(6) (SBN), Ca(x)Ba(1-x)Nb(2)O(6) (CBN) and mixed (Ca(0.28)Ba(0.72))(y)(Sr(0.61)Ba(0.39))(1-y)Nb(2)O(6) (CSBN) crystals

Radiation physics and chemistry (Oxford, England : 1993), 2013-12, Vol.93, p.87-91

2013

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Magnetic and optical properties of GaMnN magnetic semiconductor

Characterization of crystal lattice defects in calcium molybdate single crystals (CaMoO4) by means of X-ray diffraction topography

"Ghost" segregation pattern and ferroelectric domains in mixed calcium-strontium-barium niobates

X-ray topography of GdCa4O(BO3)3 single crystals grown by the Czochralski method

X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

X-ray topography of SrLaGaO4 single crystals

X-Ray Diffraction Contrast of a 60° Dislocation Investigated by Means of Section Topography

Extended defects in GdCa4O(BO3)3 crystals

Synchrotron white beam topography studies of SrLaGaO4 crystals

Investigation of the defects distribution along the growth direction in GdCOB crystals by synchrotron and conventional X-ray topography

Bragg-case section topography of growth defects in Si : Ge crystals

Conventional and synchrotron radiation back reflection topography of GdCa4O(BO3)3 crystals

Dislocations Generated in Si Annealed under Normal or High Pressure

Extended defects in GaN single crystals

Topography and lattice parameter of Si:Ge bulk crystals

Studies of growth bands in Si:Ge crystals

Extended defect structure induced by pulsed laser annealing in Ge implanted Si crystal

Study of Extended Defect Structure Induced by Pulsed Laser Annealing in Implanted Silicon Crystals

X-ray Diffraction Topography - Investigation of Single Crystals Grown by the Czochralski Method

Interference Fringes in the Plane Wave Topographic Images of Growth Bands in Si:Ge

Study of Si-Implanted and Thermally Annealed Layers of Silicon by Using X-ray Grazing Incidence Methods

Experimental and computer simulation study of the variation with depth of the X-ray section topograph images of a dislocation

Synchrotron diffraction topography of SrxBa1−xNb2O6 (SBN), CaxBa1−xNb2O6 (CBN) and mixed (Ca0.28Ba0.72)y(Sr0.61Ba0.39)1−yNb2O6 (CSBN) crystals

Synchrotron diffraction topography of Sr sub(x)Ba sub(1-x)Nb sub(2)O sub(6) (SBN), Ca sub(x)Ba sub(1-x)Nb sub(2)O sub(6) (CBN) and mixed (Ca sub(0.28)Ba sub(0.72)) sub(y)(Sr sub(0.61)B a sub(0.39)) sub(1-y)Nb sub(2)O sub(6) (CSBN) crystals

Synchrotron diffraction topography of Sr(x)Ba(1-x)Nb(2)O(6) (SBN), Ca(x)Ba(1-x)Nb(2)O(6) (CBN) and mixed (Ca(0.28)Ba(0.72))(y)(Sr(0.61)Ba(0.39))(1-y)Nb(2)O(6) (CSBN) crystals

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