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A GexSe1-x switch-only-memory technology through polarized atomic distribution

Scientific reports, 2024-09, Vol.14 (1), p.22115-9, Article 22115

2024

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Archipelago-wide island restoration in the Galápagos Islands: reducing costs of invasive mammal eradication programs and reinvasion risk

PloS one, 2011-05, Vol.6 (5), p.e18835-e18835

2011

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Atomic layer deposited ultrathin metal nitride barrier layers for ruthenium interconnect applications

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2017-05, Vol.35 (3)

2017

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(Invited) Contacts in Advanced CMOS: History and Emerging Challenges

ECS transactions, 2017-04, Vol.77 (5), p.59-79

2017

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Ultra Low Contact Resistivities for CMOS Beyond 10-nm Node

IEEE electron device letters, 2013-06, Vol.34 (6), p.723-725

2013

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Morphological stability and specific resistivity of sub-10 nm silicide films of Ni1−xPtx on Si substrate

Applied physics letters, 2010-02, Vol.96 (7), p.071915

2010

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Stress determination in nickel monosilicide films using x-ray diffraction

Journal of applied physics, 2009-10, Vol.106 (7), p.073521-073521-12

2009

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Multi-technique x-ray and optical characterization of crystalline phase, texture, and electronic structure of atomic layer deposited Hf1−xZrxO2 gate dielectrics deposited by a cyclical deposition and annealing scheme

Journal of applied physics, 2013-06, Vol.113 (23)

2013

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Fifteen years of lessons from the Seascape approach: A framework for improving ocean management at scale

Conservation science and practice, 2021-06, Vol.3 (6), p.n/a

2021

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Recovery of the Galápagos rail ( Laterallus spilonotus) following the removal of invasive mammals

Biological conservation, 2007-09, Vol.138 (3), p.520-524

2007

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Exploitation of a self-limiting process for reproducible formation of ultrathin Ni1−xPtx silicide films

Applied physics letters, 2010-12, Vol.97 (25), p.252108

2010

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Formation of Nickel Silicide from Direct-Liquid-Injection Chemical-Vapor-Deposited Nickel Nitride Films

Journal of the Electrochemical Society, 2010, Vol.157 (6), p.H679

2010

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In-situ nanoscale characterization of composition and structure during formation of ultrathin nickel silicide

Applied surface science, 2021-01, Vol.536, p.147781, Article 147781

2021

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Thin film deposition research and its impact on microelectronics scaling

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2020-07, Vol.38 (4)

2020

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Accurate Method of Measuring Specific Contact Resistivity of Interface between Silicide and Silicon and Its Application

Japanese Journal of Applied Physics, 2012-10, Vol.51 (10), p.101302-101302-9

2012

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Nucleation and lateral growth kinetics of the NiSi phase at the epitaxial θ-Ni2Si/Si interface

Acta materialia, 2020-10, Vol.198, p.100-110

2020

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Accurate Method of Measuring Specific Contact Resistivity of Interface between Silicide and Silicon and Its Application

Japanese Journal of Applied Physics, 2012-10, Vol.51 (10R), p.101302

2012

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Optical conductivity of Ni1 − xPtx alloys (0<x<0.25) from 0.76 to 6.6 eV

AIP advances, 2014-01, Vol.4 (1), p.017102-017102-12

2014

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Diffusion in intermetallic compounds: the ordered Cu 3 Au rule, its history

International journal of materials research, 2022-02, Vol.95 (10), p.852-859

2022

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Direct Transition from Ultrathin Orthorhombic Dinickel Silicides to Epitaxial Nickel Disilicide Revealed by In Situ Synthesis and Analysis

Small (Weinheim an der Bergstrasse, Germany), 2022-04, Vol.18 (14), p.e2106093-n/a

2022

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In-situ characterization of ultrathin nickel silicides using 3D mediumenergy ion scattering

Scientific reports, 2020

2020

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In-situ characterization of ultrathin nickel silicides using 3D medium-energy ion scattering

Scientific reports, 2020-06, Vol.10 (1), p.10249-10249, Article 10249

2020

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Quantifying the probability of detection of wild ungulates with the Judas technique

Conservation biology, 2022-08, Vol.36 (4), p.e13898-n/a

2022

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Spin-dependent electron scattering in cobalt interconnects

Journal of physics. D, Applied physics, 2019-12, Vol.52 (49), p.495302

2019

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Electrical and structural properties of binary Ga–Sb phase change memory alloys

Journal of applied physics, 2022-07, Vol.132 (3)

2022

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A GexSe1-x switch-only-memory technology through polarized atomic distribution

Archipelago-wide island restoration in the Galápagos Islands: reducing costs of invasive mammal eradication programs and reinvasion risk

Atomic layer deposited ultrathin metal nitride barrier layers for ruthenium interconnect applications

(Invited) Contacts in Advanced CMOS: History and Emerging Challenges

Ultra Low Contact Resistivities for CMOS Beyond 10-nm Node

Morphological stability and specific resistivity of sub-10 nm silicide films of Ni1−xPtx on Si substrate

Stress determination in nickel monosilicide films using x-ray diffraction

Multi-technique x-ray and optical characterization of crystalline phase, texture, and electronic structure of atomic layer deposited Hf1−xZrxO2 gate dielectrics deposited by a cyclical deposition and annealing scheme

Fifteen years of lessons from the Seascape approach: A framework for improving ocean management at scale

Recovery of the Galápagos rail ( Laterallus spilonotus) following the removal of invasive mammals

Exploitation of a self-limiting process for reproducible formation of ultrathin Ni1−xPtx silicide films

Formation of Nickel Silicide from Direct-Liquid-Injection Chemical-Vapor-Deposited Nickel Nitride Films

In-situ nanoscale characterization of composition and structure during formation of ultrathin nickel silicide

Thin film deposition research and its impact on microelectronics scaling

Accurate Method of Measuring Specific Contact Resistivity of Interface between Silicide and Silicon and Its Application

Nucleation and lateral growth kinetics of the NiSi phase at the epitaxial θ-Ni2Si/Si interface

Accurate Method of Measuring Specific Contact Resistivity of Interface between Silicide and Silicon and Its Application

Optical conductivity of Ni1 − xPtx alloys (0<x<0.25) from 0.76 to 6.6 eV

Diffusion in intermetallic compounds: the ordered Cu 3 Au rule, its history

Direct Transition from Ultrathin Orthorhombic Dinickel Silicides to Epitaxial Nickel Disilicide Revealed by In Situ Synthesis and Analysis

In-situ characterization of ultrathin nickel silicides using 3D mediumenergy ion scattering

In-situ characterization of ultrathin nickel silicides using 3D medium-energy ion scattering

Quantifying the probability of detection of wild ungulates with the Judas technique

Spin-dependent electron scattering in cobalt interconnects

Electrical and structural properties of binary Ga–Sb phase change memory alloys

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