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A Block-based LMS using the Walsh Transform for Digital Predistortion of Power Amplifiers

IEEE transactions on communications, 2023-10, Vol.71 (10), p.1-1

2023

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Transceiver for Ultrasonic Intra-Body Area Networks With Non-Coherent BPSK Detection

IEEE transactions on circuits and systems. II, Express briefs, 2024-06, Vol.71 (6), p.2976-2980

2024

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A (0.75–1.13) mW and (2.4–5.2) ps RMS Jitter Integer-N-Based Dual-Loop PLL for Indoor and Outdoor Positioning in 28-nm FD-SOI CMOS Technology

IEEE transactions on circuits and systems. II, Express briefs, 2023-10, Vol.70 (10), p.3782-3786

2023

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A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications

IEEE transactions on circuits and systems. I, Regular papers, 2023-12, Vol.70 (12), p.4877-4887

2023

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A Walsh-based Arbitrary Waveform Generator for 5G Applications in 28nm FD-SOI CMOS Technology

IEEE access, 2023-01, Vol.11, p.1-1

2023

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Binary Phase-Shift Keying for Ultrasonic Intra-Body Area Networks

2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), 2020, p.1-3

2020

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Design of a 0.9 V 2.45 GHz Self-Testable and Reliability-Enhanced CMOS LNA

IEEE journal of solid-state circuits, 2008-05, Vol.43 (5), p.1187-1194

2008

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Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors

Journal of electronic testing, 2010-06, Vol.26 (3), p.355-365

2010

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Ultra-low power frequency synthesizer based on a dual-locking ring oscillator

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2016, p.548-550

2016

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28nm FDSOI Ultra Low Power 1.5-2.0 GHz Factorial-DLL Frequency Synthesizer

IEEE transactions on circuits and systems. II, Express briefs, 2021-02, Vol.68 (2), p.602-606

2021

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Backside laser testing of ICs for SET sensitivity evaluation

IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.2193-2201

2001

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A (0.75-1.13)mW and (2.4-5.2)ps RMS jitter Integer-N based Dual-Loop PLL for Indoor and Outdoor Positioning in 28nm FD-SOI CMOS Technology

IEEE transactions on circuits and systems. II, Express briefs, 2023-07, p.1-1

2023

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A 1 V–270 μW–2 GHz CMOS Synchronized Ring Oscillator Based Prescaler

Journal of low-power electronics, 2005-08, Vol.1 (2), p.153-160

2005

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Design of CMOS integrated circuits for radiation hardening and its application to space electronics

2019 IEEE 13th International Conference on ASIC (ASICON), 2019, p.1-4

2019

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The Hilbert Generator, a Filter-Free Upconverter for 6G Communications

2020 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT), 2020, p.43-45

2020

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RF CMOS body-effect circuits

Microelectronics, 2006-11, Vol.37 (11), p.1251-1260

2006

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Theoretical Investigation of an Equivalent Laser LET

Microelectronics and reliability, 2001-09, Vol.41 (9), p.1513-1518

2001

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A Heavy-Ion Tolerant Clock and Data Recovery Circuit for Satellite Embedded High-Speed Data Links

IEEE transactions on nuclear science, 2007-12, Vol.56 (6), p.2080-2085

2007

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A Radiation-Hardened Injection Locked Oscillator Devoted to Radio-Frequency Applications

IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.2040-2046

2006

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Radiation-Hardened Low-Level Offset Operational Amplifiers

IEEE transactions on nuclear science, 2014-06, Vol.61 (3), p.1451-1458

2014

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The factorial Delay Locked Loop: a solution to fulfill multistandard RF synthesizer requirements

2007 Ph.D Research in Microelectronics and Electronics Conference, 2007, p.185-188

2007

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Voltage Controlled Delay Line with Phase Quadrature Outputs for [0.9-4]GHz Factorial Delay Locked Loop Dedicated to Zero-IF Multi-Standard Local Oscillator

Journal of Integrated Circuits and Systems, 2010-11, Vol.5 (1), p.23-32

2010

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SPICE modeling of the transient response of irradiated MOSFETs

IEEE transactions on nuclear science, 2000-06, Vol.47 (3), p.508-513

2000

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Laser cross section measurement for the evaluation of single-event effects in integrated circuits

Microelectronics and reliability, 2000-08, Vol.40 (8-10), p.1371-1375

2000

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Single-event sensitivity of a single SRAM cell

IEEE transactions on nuclear science, 2002-06, Vol.49 (3), p.1486-1490

2002

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A Block-based LMS using the Walsh Transform for Digital Predistortion of Power Amplifiers

Transceiver for Ultrasonic Intra-Body Area Networks With Non-Coherent BPSK Detection

A (0.75–1.13) mW and (2.4–5.2) ps RMS Jitter Integer-N-Based Dual-Loop PLL for Indoor and Outdoor Positioning in 28-nm FD-SOI CMOS Technology

A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications

A Walsh-based Arbitrary Waveform Generator for 5G Applications in 28nm FD-SOI CMOS Technology

Binary Phase-Shift Keying for Ultrasonic Intra-Body Area Networks

Design of a 0.9 V 2.45 GHz Self-Testable and Reliability-Enhanced CMOS LNA

Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors

Ultra-low power frequency synthesizer based on a dual-locking ring oscillator

28nm FDSOI Ultra Low Power 1.5-2.0 GHz Factorial-DLL Frequency Synthesizer

Backside laser testing of ICs for SET sensitivity evaluation

A (0.75-1.13)mW and (2.4-5.2)ps RMS jitter Integer-N based Dual-Loop PLL for Indoor and Outdoor Positioning in 28nm FD-SOI CMOS Technology

A 1 V–270 μW–2 GHz CMOS Synchronized Ring Oscillator Based Prescaler

Design of CMOS integrated circuits for radiation hardening and its application to space electronics

The Hilbert Generator, a Filter-Free Upconverter for 6G Communications

RF CMOS body-effect circuits

Theoretical Investigation of an Equivalent Laser LET

A Heavy-Ion Tolerant Clock and Data Recovery Circuit for Satellite Embedded High-Speed Data Links

A Radiation-Hardened Injection Locked Oscillator Devoted to Radio-Frequency Applications

Radiation-Hardened Low-Level Offset Operational Amplifiers

The factorial Delay Locked Loop: a solution to fulfill multistandard RF synthesizer requirements

Voltage Controlled Delay Line with Phase Quadrature Outputs for [0.9-4]GHz Factorial Delay Locked Loop Dedicated to Zero-IF Multi-Standard Local Oscillator

SPICE modeling of the transient response of irradiated MOSFETs

Laser cross section measurement for the evaluation of single-event effects in integrated circuits

Single-event sensitivity of a single SRAM cell

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