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Retention and surface blistering of helium irradiated tungsten as a first wall material

Journal of nuclear materials, 2005-12, Vol.347 (3), p.289-297

2005

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Helium retention and surface blistering characteristics of tungsten with regard to first wall conditions in an inertial fusion energy reactor

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2005-12, Vol.241 (1-4), p.491-495

2005

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Analyses of thin films and surfaces by cold neutron depth profiling

Applied surface science, 2004-11, Vol.238 (1-4), p.108-112

2004

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Neutron depth profiling: overview and description of NIST facilities

Journal of research of the National Institute of Standards and Technology, 1993, Vol.98 (1), p.109-126

1993

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Neutron Transmission of Single-Crystal Sapphire

Journal of applied crystallography, 1998-12, Vol.31 (6), p.835-840

1998

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Near-surface profiling of semiconductor materials using neutron depth profiling

Semiconductor science and technology, 1995-11, Vol.10 (11), p.1423-1431

1995

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Development of certified reference materials of ion-implanted dopants in silicon for calibration of secondary ion mass spectrometers

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2007-07, Vol.25 (4), p.1365-1375

2007

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Measurement of the neutron lifetime by counting trapped protons

Physical review letters, 1990-07, Vol.65 (3), p.289-292

1990

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Effect of stoichiometry on the phases present in boron nitride thin films

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1994-07, Vol.12 (4), p.1569-1575

1994

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Conduction processes in boron- and nitrogen-doped diamond-like carbon films prepared by mass-separated ion beam deposition

Diamond and related materials, 1995-05, Vol.4 (5), p.666-672

1995

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New thermal neutron prompt γ-ray activation analysis instrument at the National Institute of Standards and Technology Center for Neutron Research

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004-11, Vol.226 (3), p.426-440

2004

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NAA methods for determination of nanogram amounts of arsenic in biological samples

Journal of radioanalytical and nuclear chemistry, 2006-08, Vol.269 (2), p.291-296

2006

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Analysis of boron in CVD diamond surfaces using neutron depth profiling

Applied surface science, 1993-03, Vol.65 (1-4), p.587-592

1993

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Two aspects of thin film analysis: boron profile and scattering length density profile

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2003-06, Vol.505 (1-2), p.531-535

2003

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A high efficiency device for the detection of radioactive xenon isotopes

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1997-01, Vol.385 (2), p.285-289

Lamaze, G.P.

1997

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Imaging of neutron incoherent scattering from hydrogen in metals

Journal of applied physics, 2002-03, Vol.91 (6), p.3669-3674

2002

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Measurement of the O 17 ( p , α ) N 14 Cross Section at Stellar Energies

Physical review letters, 1995-04, Vol.74 (14), p.2642-2645

1995

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Use of neutron beams for chemical analysis at NIST

Journal of radioanalytical and nuclear chemistry, 1996-03, Vol.203 (2), p.413-427

1996

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The new cold neutron depth profiling instrument at nist

Journal of radioanalytical and nuclear chemistry, 1992-07, Vol.160 (2), p.315-325

1992

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Characterization of a cold neutron beam from a curved guide

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1998-08, Vol.413 (2), p.341-351

1998

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Calibration of a stopping power model for silicon based on analysis of neutron depth profiling and secondary ion mass spectrometry measurements

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2002-06, Vol.192 (4), p.349-359

2002

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In situ measurement of lithium movement in thin film electrochromic coatings using cold neutron depth profiling

Surface and interface analysis, 1999-07, Vol.27 (7), p.644-647

1999

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Analysis of lithium transport in electrochromic multilayer films by neutron depth profiling

Surface and interface analysis, 2000-09, Vol.29 (9), p.638-642

2000

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Neutron Depth Profiling with the New NIST Cold Neutron Source

Surface and interface analysis, 1997-03, Vol.25 (3), p.217-220

1997

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Iron and Cadmium Capture Gamma-Ray Photofission Measurements

Nuclear science and engineering, 1990-01, Vol.104 (1), p.46-52

1990

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Retention and surface blistering of helium irradiated tungsten as a first wall material

Helium retention and surface blistering characteristics of tungsten with regard to first wall conditions in an inertial fusion energy reactor

Analyses of thin films and surfaces by cold neutron depth profiling

Neutron depth profiling: overview and description of NIST facilities

Neutron Transmission of Single-Crystal Sapphire

Near-surface profiling of semiconductor materials using neutron depth profiling

Development of certified reference materials of ion-implanted dopants in silicon for calibration of secondary ion mass spectrometers

Measurement of the neutron lifetime by counting trapped protons

Effect of stoichiometry on the phases present in boron nitride thin films

Conduction processes in boron- and nitrogen-doped diamond-like carbon films prepared by mass-separated ion beam deposition

New thermal neutron prompt γ-ray activation analysis instrument at the National Institute of Standards and Technology Center for Neutron Research

NAA methods for determination of nanogram amounts of arsenic in biological samples

Analysis of boron in CVD diamond surfaces using neutron depth profiling

Two aspects of thin film analysis: boron profile and scattering length density profile

A high efficiency device for the detection of radioactive xenon isotopes

Imaging of neutron incoherent scattering from hydrogen in metals

Measurement of the O 17 ( p , α ) N 14 Cross Section at Stellar Energies

Use of neutron beams for chemical analysis at NIST

The new cold neutron depth profiling instrument at nist

Characterization of a cold neutron beam from a curved guide

Calibration of a stopping power model for silicon based on analysis of neutron depth profiling and secondary ion mass spectrometry measurements

In situ measurement of lithium movement in thin film electrochromic coatings using cold neutron depth profiling

Analysis of lithium transport in electrochromic multilayer films by neutron depth profiling

Neutron Depth Profiling with the New NIST Cold Neutron Source

Iron and Cadmium Capture Gamma-Ray Photofission Measurements

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